Works about SEMICONDUCTOR junctions


Results: 773
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    ANALYSIS OF NOISE CHARACTERISTICS OF TUNNEL DIODES.

    Published in:
    Fluctuation & Noise Letters, 2013, v. 12, n. 3, p. -1, doi. 10.1142/S0219477513500144
    By:
    • PALENSKIS, VILIUS;
    • MATUKAS, JONAS;
    • VYŠNIAUSKAS, JUOZAS;
    • PRALGAUSKAITĖ, SANDRA;
    • SHTRIKMAN, HADAS;
    • SELIUTA, DALIUS;
    • KAŠALYNAS, IRMANTAS;
    • VALUŠIS, GINTARAS
    Publication type:
    Article
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    FLOATING-BASE BJT TYPE ESD DEVICE FOR RFID CHIP.

    Published in:
    Integrated Ferroelectrics, 2009, v. 105, n. 1, p. 45, doi. 10.1080/10584580903062457
    By:
    • JINYONG CHUNG;
    • HEE-BOK KANG;
    • SUK-KYOUNG HONG;
    • GYUHAN YOON;
    • MAN YOUNG SUNG;
    • BOK-GIL CHOI
    Publication type:
    Article
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