Works matching DE "SEMICONDUCTOR etching"
1
- Technical Physics Letters, 2016, v. 42, n. 5, p. 482, doi. 10.1134/S1063785016050151
- Usikov, A.;
- Helava, H.;
- Nikiforov, A.;
- Puzyk, M.;
- Papchenko, B.;
- Kovaleva, Yu.;
- Makarov, Yu.
- Article
2
- Technical Physics Letters, 2010, v. 36, n. 11, p. 991, doi. 10.1134/S1063785010110064
- Gerasimenko, N.;
- Chamov, A.;
- Medetov, N.;
- Khanin, V.
- Article
3
- Technical Physics Letters, 2007, v. 33, n. 8, p. 682, doi. 10.1134/S1063785007080172
- Nechitailov, A. A.;
- Astrova, E. V.
- Article
4
- Technical Physics Letters, 2004, v. 30, n. 11, p. 950, doi. 10.1134/1.1829352
- Sorokin, L. M.;
- Mosina, G. N.;
- Tregubova, A. S.;
- Lebedev, A. A.;
- Savkina, N. S.;
- Shuman, V. B.
- Article
5
- Technical Physics Letters, 2003, v. 29, n. 3, p. 226, doi. 10.1134/1.1565641
- Emel’yanov, V. I.;
- Eremin, K. I.;
- Starkov, V. V.;
- Gavrilin, E. Yu.
- Article
6
- Technical Physics Letters, 2000, v. 26, n. 1, p. 12, doi. 10.1134/1.1262723
- Zimin, S. P.;
- Preobrazhenskiı, M. N.;
- Zimin, D. S.
- Article
7
- Technical Physics Letters, 1999, v. 25, n. 1, p. 65, doi. 10.1134/1.1262358
- Sidorov, V. G.;
- Drizhuk, A. G.;
- Shagalov, M. D.;
- Sidorov, D. V.;
- Usikov, A. S.
- Article
8
- Technical Physics Letters, 1998, v. 24, n. 11, p. 863, doi. 10.1134/1.1262294
- Bukharaev, A. A.;
- Bukharaeva, A. A.;
- Nurgazizov, N. I.;
- Ovchinnikov, D. V.
- Article
9
- Applied Physics B: Lasers & Optics, 2012, v. 107, n. 2, p. 393, doi. 10.1007/s00340-012-5017-6
- Dylewicz, R.;
- Khokhar, A.;
- Wasielewski, R.;
- Mazur, P.;
- Rahman, F.
- Article
10
- Applied Physics B: Lasers & Optics, 2011, v. 105, n. 3, p. 545, doi. 10.1007/s00340-011-4625-x
- Zuev, D.;
- Novodvorsky, O.;
- Khaydukov, E.;
- Khramova, O.;
- Lotin, A.;
- Parshina, L.;
- Rocheva, V.;
- Panchenko, V.;
- Dvorkin, V.;
- Poroykov, A.;
- Untila, G.;
- Chebotareva, A.;
- Kost, T.;
- Timofeyev, M.
- Article
11
- Applied Physics B: Lasers & Optics, 2011, v. 105, n. 3, p. 599, doi. 10.1007/s00340-011-4676-z
- Kelm, E.;
- Korovin, S.;
- Pustovoy, V.;
- Surkov, A.;
- Vladimirov, A.
- Article
12
- Applied Physics B: Lasers & Optics, 2009, v. 94, n. 3, p. 393, doi. 10.1007/s00340-008-3319-5
- Lumb, M.;
- Farrell, D.;
- Clarke, E.;
- Damzen, M.;
- Murray, R.
- Article
13
- International Journal of Nanoscience, 2003, v. 2, n. 4/5, p. 283, doi. 10.1142/S0219581X03001309
- Choi, S.S.;
- Jung, M.Y.;
- Kim, J.W.;
- Boo, J.H.;
- Yang, J.S.
- Article
14
- Particle & Particle Systems Characterization, 2014, v. 31, n. 2, p. 252, doi. 10.1002/ppsc.201300244
- Qin, Zhengtao;
- Joo, Jinmyoung;
- Gu, Luo;
- Sailor, Michael J.
- Article
15
- International Journal of Production Research, 2012, v. 50, n. 23, p. 6639, doi. 10.1080/00207543.2011.611538
- Ko, JongMyoung;
- Kim, ChangOuk
- Article
16
- Optical Engineering, 2016, v. 55, n. 2, p. 1, doi. 10.1117/1.OE.55.2.026119
- Sun, Jason;
- Kwong-Kit Choi
- Article
17
- Journal of Adhesion Science & Technology, 2010, v. 24, n. 7, p. 1283, doi. 10.1163/016942409X12561252292026
- Schulz, U.;
- Munzert, P.;
- Kaiser, N.
- Article
18
- Journal of Laser Micro / Nanoengineering, 2010, v. 5, n. 2, p. 179, doi. 10.2961/jlmn.2010.02.0015
- Tokumi, Kensuke;
- Matsuo, Shigeki;
- Kiyama, Satoshi;
- Tomita, Takuro;
- Hashimoto, Shuichi
- Article
19
- Micromachines, 2018, v. 9, n. 2, p. 74, doi. 10.3390/mi9020074
- Yu, Jia-Cheng;
- Zhou, Zai-Fa;
- Su, Jia-Le;
- Xia, Chang-Feng;
- Zhang, Xin-Wei;
- Wu, Zong-Ze;
- Huang, Qing-An
- Article
20
- Sensors (14248220), 2009, v. 9, n. 4, p. 2470, doi. 10.3390/s90402470
- Rong Lu;
- Yanhong Wu;
- Haitao Cheng;
- Heng Yang;
- Xinxin Li;
- Yuelin Wang
- Article
21
- Journal of Electronic Materials, 2019, v. 48, n. 5, p. 3345, doi. 10.1007/s11664-019-06982-5
- Dryden, Daniel M.;
- Nikolic, Rebecca J.;
- Islam, M. Saif
- Article
22
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 571, doi. 10.1007/s11664-018-6737-0
- Vaghayenegar, M.;
- Doyle, K. J.;
- Trivedi, S.;
- Wijewarnasuriya, P.;
- Smith, David J.
- Article
23
- Journal of Electronic Materials, 2009, v. 38, n. 8, p. 1781, doi. 10.1007/s11664-009-0844-x
- Sporken, R.;
- Kiran, R.;
- Casselman, T.;
- Aqariden, F.;
- Velicu, S.;
- Chang, Yong;
- Sivananthan, S.
- Article
24
- Journal of Electronic Materials, 2009, v. 38, n. 4, p. 523, doi. 10.1007/s11664-008-0617-y
- Tang, K.;
- Huang, W.;
- Chow, T. Paul
- Article
25
- Journal of Electronic Materials, 2009, v. 38, n. 4, p. 574, doi. 10.1007/s11664-008-0647-5
- Bolen, M. L.;
- Capano, M. A.
- Article
26
- Journal of Electronic Materials, 2004, v. 33, n. 6, p. 556, doi. 10.1007/s11664-004-0046-5
- Zhu, J.;
- Emanetoglu, N. W.;
- Chen, Y.;
- Yakshinskiy, B. V.;
- Lu, Y.
- Article
27
- Journal of Electronic Materials, 2004, v. 33, n. 4, p. 358, doi. 10.1007/s11664-004-0143-5
- Lee, J. W.;
- Lim, W. T.;
- Baek, I. K.;
- Yoo, S. R.;
- Jeon, M. H.;
- Cho, G. S.;
- PEARTON, S. J.
- Article
28
- Technical Physics, 1999, v. 44, n. 6, p. 726, doi. 10.1134/1.1259454
- Dmitruk, N. L.;
- Borkovskaya, O. Yu.;
- Mamontova, I. B.
- Article
29
- Acta Physica Polonica: A, 2011, v. 119, n. 3, p. 447
- Radjenović, B.;
- Radmilović-Radjenović, M.
- Article
30
- Journal of Microelectronic & Electronic Packaging, 2015, v. 12, n. 3, p. 161, doi. 10.4071/imaps.416
- Do Hyun Jung;
- Agarwal, Shalu;
- Kumar, Santosh;
- Jae Pil Jung
- Article
31
- Journal of Microelectronic & Electronic Packaging, 2010, v. 7, n. 1, p. 58, doi. 10.4071/1551-4897-7.1.58
- Ranganathan, N.;
- Malar, A.;
- Lee, D. Y.;
- Prasad, K.;
- Pey, K. L.
- Article
32
- Journal of Microelectronic & Electronic Packaging, 2010, v. 7, n. 1, p. 44, doi. 10.4071/1551-4897-7.1.44
- Yunas, Jumril;
- Johari, Juliana;
- Hamzah, A. A.;
- Gebeshuber, Ille C.;
- Majlis, Burhanuddin Yeop
- Article
33
- Photovoltaics International, 2011, n. 12, p. 103
- Rentsch, Jochen;
- Birmann, Katrin;
- Dannenberg, Tobias;
- Nievendick, Jan;
- Oltersdorf, Antje;
- Zimmer, Martin
- Article
34
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2011, v. 25, n. 2, p. 277, doi. 10.1142/S0217979211054744
- Article
35
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2002, v. 16, n. 28/29, p. 4318, doi. 10.1142/S0217979202015340
- Shi, J.;
- Choi, W. K.;
- Chor, E. F.
- Article
36
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2002, v. 16, n. 28/29, p. 4484, doi. 10.1142/S0217979202015662
- Xu, Yuesheng;
- Zhang, Chunling;
- Tang, Lei;
- Liu, Caichi;
- Hao, Jingchen
- Article
37
- Revista Colombiana de Física, 2006, v. 38, n. 1, p. 69
- Tirado-Mejia, L.;
- Osorio, J.;
- Segura, J.;
- Ortiz, C.;
- Gutiérrez, N. J.;
- De los Rios, M.;
- Fonthal, G.;
- Ariza-Calderón, H.
- Article
38
- Nanoscale Research Letters, 2010, v. 5, n. 11, p. 1721, doi. 10.1007/s11671-010-9701-3
- Li, Xiaocheng;
- Li, Junshuai;
- Chen, Ting;
- Tay, Beng;
- Wang, Jianxiong;
- Yu, Hongyu
- Article
39
- Nanoscale Research Letters, 2010, v. 5, n. 3, p. 576, doi. 10.1007/s11671-009-9507-3
- Heyn, Ch.;
- Stemmann, A.;
- Köppen, T.;
- Strelow, Ch.;
- Kipp, T.;
- Grave, M.;
- Mendach, S.;
- Hansen, W.
- Article
40
- International Journal of Plasma Science & Engineering, 2008, p. 1, doi. 10.1155/2008/154035
- Hong-Ji Lee;
- Che-Lun Hung;
- Chia-Hao Leng;
- Nan-Tzu Lian;
- Ling-Wu Young;
- Tahone Yang;
- Kuang-Chao Chen;
- Chih-Yuan Lu
- Article
41
- Microwave Journal, 2007, v. 50, n. 11, p. 126
- Hal-Wen Liu;
- Zhiguo Shi;
- Knoechel, R. H.;
- Schuenemann, K. F.
- Article
42
- Angewandte Chemie, 2015, v. 127, n. 13, p. 4004, doi. 10.1002/ange.201410807
- Zhang, Yingmeng;
- Zhang, Weixin;
- Yang, Zeheng;
- Gu, Heyun;
- Zhu, Qing;
- Yang, Shihe;
- Li, Mei
- Article
43
- Advanced Functional Materials, 2014, v. 24, n. 24, p. 3827, doi. 10.1002/adfm.201304129
- Hildreth, Owen J.;
- Schmidt, Daniel R.
- Article
44
- Optics & Spectroscopy, 2009, v. 106, n. 2, p. 288, doi. 10.1134/S0030400X09020222
- Koreshev, S. N.;
- Ratushnyĭ, V. P.
- Article
45
- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 10, p. 2341, doi. 10.1002/pssa.201532223
- Li, Wanyong;
- Luo, Yi;
- Xiong, Bing;
- Sun, Changzheng;
- Wang, Lai;
- Wang, Jian;
- Han, Yanjun;
- Yan, Jianchang;
- Wei, Tongbo;
- Lu, Hongxi
- Article
46
- Applied Physics A: Materials Science & Processing, 2012, v. 106, n. 1, p. 5, doi. 10.1007/s00339-011-6675-7
- Ho, Stephen;
- Herman, Peter;
- Aitchison, J.
- Article
47
- Applied Physics A: Materials Science & Processing, 2012, v. 106, n. 1, p. 151, doi. 10.1007/s00339-011-6658-8
- Soomro, M.;
- Hussain, I.;
- Bano, N.;
- Hussain, S.;
- Nur, O.;
- Willander, M.
- Article
48
- Applied Physics A: Materials Science & Processing, 2011, v. 104, n. 4, p. 1091, doi. 10.1007/s00339-011-6377-1
- Deng, Changmeng;
- Geng, Yongyou;
- Wu, Yiqun
- Article
49
- Applied Physics A: Materials Science & Processing, 2011, v. 104, n. 1, p. 349, doi. 10.1007/s00339-010-6146-6
- Xu, Wubing;
- Chen, Jiahe;
- Ma, Xiangyang;
- Yang, Deren;
- Gong, Longfei;
- Tian, Daxi
- Article
50
- Applied Physics A: Materials Science & Processing, 2011, v. 104, n. 1, p. 23, doi. 10.1007/s00339-011-6475-0
- Kim, Hyoungjoon;
- Park, Yong-Hee;
- Kim, Ilsoo;
- Kim, Jungwon;
- Choi, Heon-Jin;
- Kim, Woochul
- Article