Works matching DE "SEMICONDUCTOR equipment"
Results: 33
Adverse User Innovation: The Case of a Semiconductor Equipment Manufacturer.
- Published in:
- Annals of Business Administrative Science (ABAS), 2016, v. 15, n. 6, p. 265, doi. 10.7880/abas.0161109a
- By:
- Publication type:
- Article
Dynamic Outsourcing Development for Sustainable Competitive Advantage in a High-Tech Backend Semiconductor Equipment Firm.
- Published in:
- Sustainability (2071-1050), 2020, v. 12, n. 1, p. 155, doi. 10.3390/su12010155
- By:
- Publication type:
- Article
SID Participates in FPD China.
- Published in:
- Information Display, 2012, v. 28, n. 5/6, p. 54
- By:
- Publication type:
- Article
Components.
- Published in:
- 2012
- Publication type:
- Product Review
Quantum dots go large.
- Published in:
- Nature, 2009, v. 459, n. 7248, p. 760, doi. 10.1038/459760a
- By:
- Publication type:
- Article
A Silicon Nanocrystal Schottky Junction Solar Cell produced from Colloidal Silicon Nanocrystals.
- Published in:
- Nanoscale Research Letters, 2010, v. 5, n. 8, p. 1253, doi. 10.1007/s11671-010-9632-z
- By:
- Publication type:
- Article
A Monolithic U-Band InP HBT Stacked Power Amplifier With On-Chip Active Biasing.
- Published in:
- Microwave Journal, 2018, v. 61, n. 9, p. 40
- By:
- Publication type:
- Article
Interfacial Thermal Fluid Phenomena in Thin Liquid Films.
- Published in:
- International Journal of Emerging Multidisciplinary Fluid Sciences, 2010, v. 2, n. 2/3, p. 87, doi. 10.1260/1756-8315.2.2-3.87
- By:
- Publication type:
- Article
BURN-IN IS HOT TEST TOPIC: The importance of burn-in and test extends from semiconductors to military equipment.
- Published in:
- EE: Evaluation Engineering, 2019, v. 58, n. 11, p. 13
- Publication type:
- Article
BY THE NUMBERS.
- Published in:
- 2019
- Publication type:
- Chart/Diagram/Graph
Power transistors, drivers, controllers energize diverse array of products.
- Published in:
- 2018
- By:
- Publication type:
- Product Review
EE Statistics Insight.
- Published in:
- EE: Evaluation Engineering, 2016, v. 55, n. 2, p. 4
- Publication type:
- Article
IJTAG, heterogeneous integration headline ITC.
- Published in:
- 2015
- By:
- Publication type:
- Conference Paper/Materials
loT offers new life for 200-mm fabs.
- Published in:
- 2015
- By:
- Publication type:
- Editorial
'Million unit' company offers RF test and services.
- Published in:
- EE: Evaluation Engineering, 2015, v. 54, n. 1, p. 32
- By:
- Publication type:
- Article
Modular systems automate IC test.
- Published in:
- EE: Evaluation Engineering, 2014, v. 53, n. 10, p. 18
- By:
- Publication type:
- Article
Measurement and control meet IoT.
- Published in:
- EE: Evaluation Engineering, 2014, v. 53, n. 10, p. 4
- By:
- Publication type:
- Article
Instruments tackle IC test chores.
- Published in:
- 2014
- By:
- Publication type:
- Product Review
PRODUCT PICKS.
- Published in:
- 2012
- Publication type:
- Product Review
Organic Semiconductors: Molecular Self‐Doping Controls Luminescence of Pure Organic Single Crystals (Adv. Funct. Mater. 21/2018).
- Published in:
- Advanced Functional Materials, 2018, v. 28, n. 21, p. 1, doi. 10.1002/adfm.201870137
- By:
- Publication type:
- Article
Effective Use of UV‐Ozone Oxide in Silicon Solar Cell Applications.
- Published in:
- Physica Status Solidi - Rapid Research Letters, 2019, v. 13, n. 2, p. N.PAG, doi. 10.1002/pssr.201800488
- By:
- Publication type:
- Article
Grouping Method of Semiconductor Bonding Equipment Based on Clustering by Fast Search and Find of Density Peaks for Dynamic Matching According to Processing Tasks.
- Published in:
- Processes, 2019, v. 7, n. 9, p. 566, doi. 10.3390/pr7090566
- By:
- Publication type:
- Article
The Property, Preparation and Application of Topological Insulators: A Review.
- Published in:
- Materials (1996-1944), 2017, v. 10, n. 7, p. 814, doi. 10.3390/ma10070814
- By:
- Publication type:
- Article
SINGLE-RANK QUASI-NEWTON METHODS FOR THE SOLUTION OF NONLINEAR SEMICONDUCTOR EQUATIONS.
- Published in:
- Advanced Mathematical Models & Applications, 2020, v. 5, n. 1, p. 70
- By:
- Publication type:
- Article
COMPARATIVE STUDY ON THE ELECTRICAL AND MECHANICAL CHARACTERISTICS OF Ni-30WT%Co AND Cu-2WT%Be ALLOY FOR DEVELOPMENT OF SEMICONDUCTOR TEST PROBE PIN.
- Published in:
- Archives of Metallurgy & Materials, 2019, v. 64, n. 3, p. 943, doi. 10.24425/amm.2019.129477
- By:
- Publication type:
- Article
A percolation model of semiconductor gas sensors with a hierarchical pore structure.
- Published in:
- EAI Endorsed Transactions on the Energy Web, 2019, v. 6, n. 22, p. 1, doi. 10.4108/eai.13-7-2018.156438
- By:
- Publication type:
- Article
Improvement in wettability of pressure-sensitive adhesive on silicon wafer using crosslinking agent with siloxane groups.
- Published in:
- Journal of Applied Polymer Science, 2013, v. 129, n. 1, p. 276, doi. 10.1002/app.38737
- By:
- Publication type:
- Article
A Novel pH-dependent Drift Improvement Method for Zirconium Dioxide Gated pH-Ion Sensitive Field Effect Transistors.
- Published in:
- Sensors (14248220), 2010, v. 10, n. 5, p. 4643, doi. 10.3390/s100504643
- By:
- Publication type:
- Article
From-Core and From-End Direct CH Arylations: A Step-Saving New Synthetic Route to Thieno[3,4- c]pyrrole-4,6-dione (TPD)-Incorporated D--π-A-π-D Functional Oligoaryls.
- Published in:
- Chemistry - A European Journal, 2015, v. 21, n. 24, p. 8754, doi. 10.1002/chem.201501015
- By:
- Publication type:
- Article
「セラミックスの高機能化と製造プロセス革新」に寄せる期待.
- Published in:
- Journal of the Japan Society of Powder & Powder Metallurgy / Funtai Oyobi Fummatsu Yakin, 2018, v. 65, n. 10, p. 605
- By:
- Publication type:
- Article
Real-time deadlock-free scheduling for semiconductor track systems based on colored timed Petri nets.
- Published in:
- OR Spectrum, 2007, v. 29, n. 3, p. 421, doi. 10.1007/s00291-006-0046-3
- By:
- Publication type:
- Article
Hamamatsu to construct new building to increase manufacturing capacity of opto-semiconductors.
- Published in:
- infocus Magazine, 2016, n. 42, p. 99
- Publication type:
- Article
RNT, Kurt J. Lesker Co. to Expand Market Reach for Sputtering Targets.
- Published in:
- Advanced Materials & Processes, 2007, v. 165, n. 11, p. 105
- Publication type:
- Article