Influence of Dopant Incomplete Ionization on the Capacitance of a Reverse-Biased 4H-SiC p<sup>+</sup>−i−n<sup>+</sup> Diode.
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- Technical Physics, 2018, v. 63, n. 6, p. 928, doi. 10.1134/S1063784218060130
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Works matching DE "SEMICONDUCTOR diodes testing"
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Simple Approach to Generalization of Child-Langmuir Law for Non-Zero Injection Velocities in a Planar Diode.
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- Contributions to Plasma Physics, 2017, v. 57, n. 1, p. 40, doi. 10.1002/ctpp.201600052
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What Is a Diode?
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- Elevator World, 2014, v. 62, n. 8, p. 99
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- Article