Works about SEMICONDUCTOR diodes
1
- International Journal of Nanoscience, 2004, v. 3, n. 6, p. 859, doi. 10.1142/S0219581X04002760
- WU, CHUN-GUEY;
- CHEN, PI-YU;
- CHANG, SU-SAN
- Article
2
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 540, doi. 10.1007/s10854-009-9954-8
- Article
3
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 2, p. 199, doi. 10.1007/s10854-009-9893-4
- Shahraki, Mohammad Maleki;
- Shojaee, Seyyed Ali;
- Nemati, Ali;
- Sani, Mohammad Ali Faghihi
- Article
4
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 718, doi. 10.1007/s10854-008-9793-z
- Article
5
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 105, doi. 10.1007/s10854-008-9635-z
- Cimilli, F. E.;
- Efeoğlu, H.;
- Sağlam, M.;
- Türüt, A.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 505, doi. 10.1007/s10854-008-9691-4
- Tanaka, Tooru;
- Saito, Katsuhiko;
- Nishio, Mitsuhiro;
- Qixin Guo;
- Ogawa, Hiroshi
- Article
7
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 1, p. 49, doi. 10.1007/s10854-008-9602-8
- Ramírez, M. A.;
- Fernández, J. F.;
- De la Rubia, M.;
- de Frutos, J.;
- Bueno, P. R.;
- Longo, E.;
- Varela, J. A.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 299, doi. 10.1007/s10854-007-9555-3
- Adachi, Masahiro;
- Hashimoto, Yutaka;
- Kanzaki, Katsuhisa;
- Ohashi, Shuji;
- Morita, Yasuhiro;
- Abe, Tomoki;
- Kasada, Hirofumi;
- Ando, Koshi;
- Tajima, Michio
- Article
9
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 87, doi. 10.1007/s10854-008-9629-x
- Renaud, Cédric;
- Josse, Yves;
- Chih-Wen Lee;
- Nguyen, Thien-Phap
- Article
10
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 338, doi. 10.1007/s10854-008-9575-7
- Altieri-Weimar, Paola;
- Jaeger, Arndt;
- Lutz, Thomas;
- Stauss, Peter;
- Streubel, Klaus;
- Thonke, Klaus;
- Sauer, Rolf
- Article
11
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 155, doi. 10.1007/s10854-007-9478-z
- Bou Sanayeh, Marwan;
- Brick, Peter;
- Schmid, Wolfgang;
- Mayer, Bernd;
- Müller, Martin;
- Reufer, Martin;
- Streubel, Klaus;
- Schwirzke-Schaaf, Sandy;
- Tomm, Jens W.;
- Danilewsky, Andreas;
- Bacher, Gerd
- Article
12
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 4, p. 339, doi. 10.1007/s10854-007-9325-2
- Zhanchao Wu;
- Jianxin Shi;
- Jing Wang;
- Menglian Gong;
- Qiang Su
- Article
13
- Journal of Materials Science Letters, 2003, v. 22, n. 20, p. 1415, doi. 10.1023/A:1025755229012
- Krasnov, A. N.;
- Kim, W. Y.
- Article
14
- Journal of Materials Science Letters, 2003, v. 22, n. 20, p. 1423, doi. 10.1023/A:1025759313991
- Article
15
- Phytochemical Analysis, 2003, v. 14, n. 5, p. 306, doi. 10.1002/pca.720
- Ari Tolonen;
- Anja Hohtola;
- Jorma Jalonen
- Article
16
- 2019
- Joachimi, Wolfgang;
- Hemmleb, Matthias;
- Grauel, Uwe;
- Wang, Zhu-Jun;
- Willinger, Marc;
- Moldovan, Grigore
- Abstract
17
- Measurement Techniques, 2013, v. 56, n. 9, p. 1066, doi. 10.1007/s11018-013-0331-x
- Kostryukov, S.;
- Ermachikhin, A.;
- Litvinov, V.;
- Kholomina, T.;
- Rybin, N.
- Article
18
- Measurement Techniques, 2008, v. 51, n. 7, p. 786
- I. Sivokon’;
- S. Sinel’nikov
- Article
19
- Inventions (2411-5134), 2022, v. 7, n. 4, p. 96, doi. 10.3390/inventions7040096
- Ostapchuk, Mikhail;
- Shishov, Dmitry;
- Shevtsov, Daniil;
- Zanegin, Sergey
- Article
20
- Ferroelectrics, 2006, v. 333, n. 1, p. 221, doi. 10.1080/00150190600701285
- Jinding Yu;
- Arai, Yasutomo
- Article
21
- Sensors & Materials, 2019, v. 31, n. 7, Part 1, p. 2183, doi. 10.18494/SAM.2019.2055
- Shun-Lung Yen;
- Shiang-Feng Tang;
- Chung-Wei Ou;
- Chin-Jung Chao;
- Hsin-Yen Cheng;
- Ing-Jiunn Su;
- Tzu-Chiang Chen
- Article
22
- Sensors & Materials, 2016, v. 28, n. 9, p. 1053, doi. 10.18494/sam.2016.1394
- Hau-Wei Lee;
- Te-Ping Chiu;
- Chien-Hung Liu
- Article
23
- Electronics (2079-9292), 2024, v. 13, n. 24, p. 4906, doi. 10.3390/electronics13244906
- Zohar, Moshe;
- Bykhovsky, Dima;
- Hava, Shlomo
- Article
24
- Scientific Reports, 2013, p. 1, doi. 10.1038/srep02787
- Kiyeol Kwak;
- Kyoungah Cho;
- Sangsig Kim
- Article
25
- Journal of Nano- & Electronic Physics, 2019, v. 11, n. 3, p. 1, doi. 10.21272/jnep.11(3).03004
- Pavliuchenko, A. M.;
- Shyiko, O. M.;
- Klochkova, T. I.
- Article
26
- Journal of Nano- & Electronic Physics, 2018, v. 10, n. 4, p. 1, doi. 10.21272/jnep.10(4).04019
- Dobrovolsky, Yu. G.;
- Andreeva, O. P.;
- Gavrilyak, M. S.;
- Pidkamin, L. J.;
- Prokhorov, G. V.
- Article
27
- Journal of Nano- & Electronic Physics, 2018, v. 10, n. 4, p. 1, doi. 10.21272/jnep.10(4).04014
- Storozhenko, I. P.;
- Kaydash, M. V.
- Article
28
- Clinical & Experimental Dermatology, 2006, v. 31, n. 5, p. 638, doi. 10.1111/j.1365-2230.2006.02191.x
- Article
29
- European Physical Journal B: Condensed Matter, 2012, v. 85, n. 3, p. 1, doi. 10.1140/epjb/e2012-20713-3
- Article
30
- Advanced Energy Materials, 2017, v. 7, n. 2, p. n/a, doi. 10.1002/aenm.201601283
- Cook, John B.;
- Kim, Hyung‐Seok;
- Lin, Terri C.;
- Lai, Chun‐Han;
- Dunn, Bruce;
- Tolbert, Sarah H.
- Article
31
- Bulletin of the Polish Academy of Sciences: Technical Sciences, 2020, v. 68, n. 4, p. 793, doi. 10.24425/bpasts.2020.134185
- ALI, A.;
- CHUANWEN, J.;
- KHAN, M. M.;
- HABIB, S.;
- ALI, Y.
- Article
32
- International Journal of High Speed Electronics & Systems, 2008, v. 18, n. 1, p. 179, doi. 10.1142/S0129156408005254
- Reed, Meredith L.;
- Garrett, Gregory A.;
- Sampath, Anand V.;
- Shen, Paul H.;
- Collins, Charles J.;
- Wraback, Michael;
- Jianping Zhang;
- Xuhong Hu;
- Jianyu Deng;
- Lunev, Alex;
- Yuriy Bilenko;
- Katona, Thomas;
- Gaska, Remis
- Article
33
- International Journal of High Speed Electronics & Systems, 2007, v. 17, n. 1, p. 29, doi. 10.1142/S0129156407004199
- Detchprohm, T.;
- Xia, Y.;
- Senawiratne, J.;
- Li, Y.;
- Zhu, M.;
- Zhao, W.;
- Xi, Y.;
- Schubert, E. F.;
- Wetzel, C.
- Article
34
- International Journal of High Speed Electronics & Systems, 2007, v. 17, n. 1, p. 25, doi. 10.1142/S0129156407004187
- Li, Y.;
- Zhao, W.;
- Xia, Y.;
- Zhu, M.;
- Senawiratne, J.;
- Detchprohm, T.;
- Wetzel, C.
- Article
35
- International Journal of High Speed Electronics & Systems, 2005, v. 15, n. 4, p. 821, doi. 10.1142/S0129156405003430
- Zhao, Jian H.;
- Kuang Sheng;
- Lebron-Velilla, Ramon C.
- Article
36
- International Journal of High Speed Electronics & Systems, 2005, v. 15, n. 4, p. 899, doi. 10.1142/S0129156405003454
- Article
37
- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 3, p. 248, doi. 10.1142/S0129156404002971
- Huang, W.;
- Chow, T. P.;
- Yang, J.;
- Butler, J. E.
- Article
38
- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 3, p. 241, doi. 10.1142/S012915640400296X
- Zhu, Lin;
- Losee, Peter;
- Chow, T. Paul
- Article
39
- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 3, p. 78, doi. 10.1142/S0129156404002703
- Sawyer, Shayla;
- Rumyantsev, Sergey L.;
- Pala, Nezih;
- Shur, Michael S.;
- Bilenko, Yuriy;
- Gaska, Remis;
- Kosterin, Pavel V.;
- Salzberg, Brian M.
- Article
40
- International Journal of High Speed Electronics & Systems, 2004, v. 14, n. 2, p. 401, doi. 10.1142/S0129156404002430
- Reed, Robert A.;
- Marshall, Paul W.;
- Label, Kenneth A.
- Article
41
- International Journal of High Speed Electronics & Systems, 2002, v. 12, n. 2, p. 469, doi. 10.1142/S0129156402001393
- Gelmont, B.;
- Woolard, D.;
- Chen, S.
- Article
42
- Microchimica Acta, 2007, v. 159, n. 3/4, p. 207, doi. 10.1007/s00604-007-0740-0
- Yanqin Li;
- Rizzo, Aurora;
- Cingolani, Roberto;
- Gigli, Giuseppe
- Article
43
- Journal of Sensors, 2008, p. 1, doi. 10.1155/2008/782764
- Constandinou, Timothy G.;
- Georgiou, Julius
- Article
44
- Dental Materials Journal, 2011, v. 30, n. 2, p. 151, doi. 10.4012/dmj.2010-114
- Arikawa, Hiroyuki;
- Takahashp, Hideo;
- Minesaki, Yoshito;
- Muraguchi, Kouichi;
- Matsuyama, Takashi;
- Kanie, Takahito;
- Ban, Seiji
- Article
45
- Semiconductors, 2001, v. 35, n. 7, p. 840, doi. 10.1134/1.1385722
- Ankudinov, A. V.;
- Kotel’nikov, E. Yu.;
- Kantsel’son, A. A.;
- Evtikhiev, V. P.;
- Titkov, A. N.
- Article
46
- Semiconductors, 2001, v. 35, n. 4, p. 453, doi. 10.1134/1.1365194
- Stoyanov, N. D.;
- Mikhaılova, M. P.;
- Andreıchuk, O. V.;
- Moiseev, K. D.;
- Andreev, I. A.;
- Afrailov, M. A.;
- Yakovlev, Yu. P.
- Article
47
- Semiconductors, 2001, v. 35, n. 3, p. 321, doi. 10.1134/1.1356155
- Aıdaraliev, M.;
- Zotova, N. V.;
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyı, M. A.;
- Stus’, N. M.;
- Talalakin, G. N.
- Article
48
- Semiconductors, 2001, v. 35, n. 3, p. 316, doi. 10.1134/1.1356154
- Emel’yanov, A. M.;
- Sobolev, N. A.;
- Yakimenko, A. N.
- Article
49
- Semiconductors, 2001, v. 35, n. 3, p. 357, doi. 10.1134/1.1356162
- Zotova, N. V.;
- Karandashev, S. A.;
- Matveev, B. A.;
- Remennyı, M. A.;
- Stus’, N. M.;
- Talalakin, G. N.;
- Shustov, V. V.
- Article
50
- Semiconductors, 2001, v. 35, n. 3, p. 360, doi. 10.1134/1.1356163
- Imenkov, A. N.;
- Kolchanova, N. M.;
- Kubat, P.;
- Moiseev, K. D.;
- Civis, C.;
- Yakovlev, Yu. P.
- Article