Works matching DE "SEMICONDUCTOR device testing"
1
- Advanced Energy Materials, 2014, v. 4, n. 4, p. n/a, doi. 10.1002/aenm.201300775
- Seol, Minsu;
- Youn, Duck Hyun;
- Kim, Jae Young;
- Jang, Ji‐Wook;
- Choi, Mingi;
- Lee, Jae Sung;
- Yong, Kijung
- Article
2
- Applied Stochastic Models in Business & Industry, 2015, v. 31, n. 5, p. 732, doi. 10.1002/asmb.2100
- Kurz, Daniel;
- Lewitschnig, Horst;
- Pilz, Jürgen
- Article
3
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 215, doi. 10.1007/s10836-017-5700-y
- Sarson, Peter;
- Yanagida, Tomonori;
- Shibuya, Shohei;
- Machida, Kosuke;
- Kobayashi, Haruo
- Article
4
- International Journal of Industrial Engineering, 2016, v. 23, n. 5, p. 294
- Zernig, Anja;
- Bluder, Olivia;
- Pilz, Juergen;
- Kaestner, Andre;
- Krauth, Alban
- Article
5
- International Journal of Reliability, Quality & Safety Engineering, 2013, v. 20, n. 4, p. -1, doi. 10.1142/S0218539313500113
- KARY CHIEN, WEI-TING;
- ATMAN, ZHAO YONG;
- CHANG, VENSON;
- WU, JEFF
- Article
6
- Semiconductors, 2016, v. 50, n. 3, p. 326, doi. 10.1134/S1063782616030222
- Tarasova, E.;
- Khananova, A.;
- Obolensky, S.;
- Zemlyakov, V.;
- Sveshnikov, Yu.;
- Egorkin, V.;
- Ivanov, V.;
- Medvedev, G.;
- Smotrin, D.
- Article
8
- EE: Evaluation Engineering, 2017, v. 56, n. 2, p. 19
- Article
9
- Laser & Photonics Reviews, 2014, v. 8, n. 5, p. L59, doi. 10.1002/lpor.201400045
- Hempel, Martin;
- Tomm, Jens W.;
- Yue, Fangyu;
- Bettiati, Mauro A.;
- Elsaesser, Thomas
- Article