Works matching DE "SEMICONDUCTOR device reliability"
1
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5987, doi. 10.1007/s10854-015-3174-1
- Kaya, Senol;
- Yilmaz, Ercan;
- Aktag, Aliekber;
- Seidel, Jan
- Article
2
- Acta Physica Polonica: A, 2015, v. 128, n. 2, p. 228, doi. 10.12693/APhysPolA.128.228
- Article
3
- International Journal of Reliability, Quality & Safety Engineering, 2013, v. 20, n. 4, p. -1, doi. 10.1142/S0218539313500113
- KARY CHIEN, WEI-TING;
- ATMAN, ZHAO YONG;
- CHANG, VENSON;
- WU, JEFF
- Article
