Modeling Nonlinear White Noise in GaN HEMT Devices.
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- Frequenz, 2015, v. 69, n. 1/2, p. 47, doi. 10.1515/freq-2014-0121
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Works matching DE "SEMICONDUCTOR device noise"
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Noise Characterization in InAlAs/InGaAs/InP pHEMTs for Low Noise Applications.
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- International Journal of Electrical & Computer Engineering (2088-8708), 2017, v. 7, n. 1, p. 176, doi. 10.11591/ijece.v7i1.pp176-183
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