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Works matching DE "SEMICONDUCTOR device metallization"

Results: 2

1

Metrological aspects of researching the specific contact resistivity of ohmic contacts by using the four-contact method.

Published in:

Semiconductor Physics, Quantum Electronics & Optoelectronics, 2014, v. 17, n. 4, p. 394

By:

Sheremet, V. N.

Publication type:

Article

2

Filament Shape Dependent Reset Behavior Governed by the Interplay between the Electric Field and Thermal Effects in the Pt/TiO<sub>2</sub>/Cu Electrochemical Metallization Device.

Published in:

Advanced Electronic Materials, 2017, v. 3, n. 2, p. 1, doi. 10.1002/aelm.201600404

By:

Kim, Hae Jin;
Yoon, Kyung Jean;
Park, Tae Hyung;
Kim, Han Joon;
Kwon, Young Jae;
Shao, Xing Long;
Kwon, Dae Eun;
Kim, Yu Min;
Hwang, Cheol Seong

Publication type:

Article