Works matching DE "SEMICONDUCTOR characterization"
1
- Advanced Functional Materials, 2015, v. 25, n. 15, p. 2222, doi. 10.1002/adfm.201404215
- Kwon, Kyungmook;
- Shim, Jaeho;
- Lee, Jeong Oen;
- Choi, Kyunghan;
- Yu, Kyoungsik
- Article
2
- Advanced Functional Materials, 2014, v. 24, n. 40, p. 6365, doi. 10.1002/adfm.201401440
- Mahjouri‐Samani, Masoud;
- Gresback, Ryan;
- Tian, Mengkun;
- Wang, Kai;
- Puretzky, Alexander A.;
- Rouleau, Christopher M.;
- Eres, Gyula;
- Ivanov, Ilia N.;
- Xiao, Kai;
- McGuire, Michael A.;
- Duscher, Gerd;
- Geohegan, David B.
- Article
3
- 2010
- Dinghao Tang;
- Hongyang Liu;
- Jingyue Liu
- Abstract
4
- Scientific Reports, 2015, p. 7872, doi. 10.1038/srep07872
- Ang, Yee Sin;
- Ma, Zhongshui;
- Zhang, Chao
- Article
5
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep06395
- Jiangwei Liu;
- Meiyong Liao;
- Masataka Imura;
- Akihiro Tanaka;
- Hideo Iwai;
- Yasuo Koide
- Article
6
- Gazi University Journal of Science, 2010, v. 23, n. 2, p. 171
- Temiz, Mustafa;
- Unal, Mehmet
- Article
7
- Journal of Materials Science, 2012, v. 47, n. 4, p. 1950, doi. 10.1007/s10853-011-5989-3
- Mahalingam, T.;
- Dhanasekaran, V.;
- Chandramohan, R.;
- Rhee, Jin-Koo
- Article
8
- Journal of Materials Science, 2012, v. 47, n. 4, p. 1669, doi. 10.1007/s10853-011-5988-4
- Wochnik, Angela;
- Heinzl, Christoph;
- Auras, Florian;
- Bein, Thomas;
- Scheu, Christina
- Article
9
- Journal of Materials Science, 2012, v. 47, n. 4, p. 1893, doi. 10.1007/s10853-011-5978-6
- Devarepally, K.;
- Cox, D.;
- Fry, A.;
- Stolojan, V.;
- Curry, R.;
- Munz, M.
- Article
10
- Journal of Materials Science, 2012, v. 47, n. 1, p. 465, doi. 10.1007/s10853-011-5821-0
- Li, Xiu-Yan;
- Wang, Jiao-Na;
- Zhang, Lian-Lian;
- Li, Cong-Ju
- Article
11
- Journal of Materials Science, 2011, v. 46, n. 9, p. 3157, doi. 10.1007/s10853-010-5198-5
- Musaev, O. R.;
- Dusevich, V.;
- Wrobel, J. M.;
- Kruger, M. B.
- Article
12
- ZAMM -- Journal of Applied Mathematics & Mechanics / Zeitschrift für Angewandte Mathematik und Mechanik, 2001, v. 81, n. 9, p. 623, doi. 10.1002/1521-4001(200109)81:9<623::AID-ZAMM623>3.0.CO;2-1
- Article
13
- Journal of Microscopy, 1999, v. 194, n. 2/3, p. 393, doi. 10.1046/j.1365-2818.1999.00543.x
- Richter;
- Süptitz;
- Lienau, CH.;
- Elsaesser;
- Ramsteiner;
- Nötzel;
- Ploog
- Article
14
- EE: Evaluation Engineering, 2011, v. 50, n. 11, p. 22
- Article
16
- Electronics & Electrical Engineering, 2010, n. 99, p. 3
- Špánik, P.;
- Šul, R.;
- Frívaldský, M.;
- Drgońa, P.;
- Kandráč, J.
- Article
17
- South African Journal of Science, 2000, v. 96, n. 2, p. 55
- Malik, M. Azad;
- O'Brien, P.;
- Revaprasadu, N.
- Article
18
- Journal of Electronic Materials, 2019, v. 48, n. 1, p. 536, doi. 10.1007/s11664-018-6746-z
- Castillo, Jorge;
- Garcia-Perez, Roman;
- Huq, Hasina
- Article
19
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 974, doi. 10.1007/s11664-016-4973-8
- More, A.;
- Patil, R.;
- Dalavi, D.;
- Suryawanshi, M.;
- Burungale, V.;
- Kim, J.;
- Patil, P.
- Article
20
- Journal of Electronic Materials, 2017, v. 46, n. 2, p. 1210, doi. 10.1007/s11664-016-5105-1
- Kwon, Sera;
- Park, Hyun-Woo;
- Chung, Kwun-Bum
- Article
21
- Particle & Particle Systems Characterization, 2016, v. 33, n. 7, p. 358, doi. 10.1002/ppsc.201600027
- Iacono, Fabiola;
- de la Cueva, Leonor;
- Gallego, José María;
- Juarez, Beatriz H.;
- Otero, Roberto
- Article
22
- Nonlinear Dynamics, 2016, v. 86, n. 3, p. 1937, doi. 10.1007/s11071-016-3006-8
- Jiang, Ning;
- Xue, Chenpeng;
- Lv, Yunxin;
- Qiu, Kun
- Article
23
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 878, doi. 10.1007/s10854-016-5602-2
- Lei, Yun;
- He, Yue;
- Fang, Chengyi
- Article
24
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9842, doi. 10.1007/s10854-016-5051-y
- Talebi, Ruhollah;
- Safari, Alireza
- Article
25
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 6, p. 2501, doi. 10.1007/s10854-014-1902-6
- Gurumurthy, S.;
- Pattabi, Manjunatha;
- Krishna, Shreedhar;
- Gaikwad, A.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 8, p. 995, doi. 10.1007/s10854-010-0249-x
- Kumar, Suresh;
- Kundu, Virender;
- Vohra, Anil;
- Chakarvarti, S. K.
- Article
27
- Physica Status Solidi. A: Applications & Materials Science, 2015, v. 212, n. 8, p. 1751, doi. 10.1002/pssa.201431802
- El‐Atab, Nazek;
- Rizk, Ayman;
- Tekcan, Burak;
- Alkis, Sabri;
- Okyay, Ali K.;
- Nayfeh, Ammar
- Article
28
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 7, p. 1545, doi. 10.1002/pssa.201330619
- Huang, Qin;
- Wang, Liu;
- Bi, Xiaofang
- Article
29
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 5, p. 1179, doi. 10.1002/pssa.201330446
- Tang, Zeguo;
- Liu, Qiming;
- Chen, Qiang;
- Khatri, Ishwor;
- Shirai, Hajime
- Article
30
- Physica Status Solidi. A: Applications & Materials Science, 2013, v. 210, n. 7, p. 1328, doi. 10.1002/pssa.201200815
- Nagaoka, Akira;
- Yoshino, Kenji;
- Taniguchi, Hiroki;
- Taniyama, Tomoyasu;
- Kakimoto, Koichi;
- Miyake, Hideto
- Article
31
- Human Factors & Ergonomics in Manufacturing & Service Industries, 2014, v. 24, n. 2, p. 207, doi. 10.1002/hfm.20369
- ChEN, Te ‐ Hung;
- Lin, Chih ‐ Long;
- Wang, Mao ‐ Jiun J.
- Article
32
- 2017
- Khan, Z. N.;
- Ahmed, S.;
- Ali, M.
- Correction Notice
33
- Journal of Superconductivity & Novel Magnetism, 2019, v. 32, n. 3, p. 627, doi. 10.1007/s10948-018-4713-9
- Bouazizi, S.;
- Makni-Chakroun, J.;
- Cheikhrouhou-Koubaa, W.;
- Koubaa, M.;
- Cheikhrouhou, A.;
- Ayadi, F.;
- Nachbaur, V.
- Article
34
- Journal of Superconductivity & Novel Magnetism, 2017, v. 30, n. 8, p. 2031, doi. 10.1007/s10948-017-4173-7
- Sultana, Rabia;
- Awana, Geet;
- Pal, Banabir;
- Maheshwari, P.;
- Mishra, Monu;
- Gupta, Govind;
- Gupta, Anurag;
- Thirupathaiah, S.;
- S. Awana, V.
- Article
35
- Journal of Superconductivity & Novel Magnetism, 2010, v. 23, n. 1, p. 17, doi. 10.1007/s10948-009-0574-6
- Mamaev, Y. A.;
- Gerchikov, L. G.;
- Yashin, Y. P.
- Article
36
- Cellulose, 2017, v. 24, n. 2, p. 1069, doi. 10.1007/s10570-016-1157-x
- Gimenez, Alejandro;
- Luna-Bárcenas, Gabriel;
- Yáñez-Limón, J.;
- Esparza, Rodrigo;
- Jiménez-Sandoval, Sergio;
- Medellin-Rodriguez, F.
- Article
37
- Physica Status Solidi (B), 2014, v. 251, n. 8, p. 1498, doi. 10.1002/pssb.201350266
- Halawany, Ahmed El;
- Leuenberger, Michael N.
- Article
39
- Telkomnika, 2011, v. 9, n. 1, p. 133, doi. 10.12928/telkomnika.v9i1.679
- Article
40
- International Journal of Modern Physics C: Computational Physics & Physical Computation, 2016, v. 27, n. 3, p. -1, doi. 10.1142/S0129183116500352
- Mohammad, Rezek;
- Katırcıoğlu, Şenay
- Article
42
- Semiconductors, 2008, v. 42, n. 6, p. 746, doi. 10.1134/S1063782608060183
- Astrova, E. V.;
- Nechitaĭlov, A. A.
- Article
43
- Macromolecular Symposia, 2016, v. 362, n. 1, p. 3, doi. 10.1002/masy.201670015
- Article
44
- Nature Materials, 2013, v. 12, n. 9, p. 785, doi. 10.1038/nmat3742
- Article
45
- ETRI Journal, 2013, v. 35, n. 4, p. 571, doi. 10.4218/etrij.13.1912.0018
- Yong Suk Yang;
- In-Kyu You;
- Hyun Han;
- Jae Bon Koo;
- Sang Chul Lim;
- Soon-Won Jung;
- Bock Soon Na;
- Hye-Min Kim;
- Minseok Kim;
- Seok-Hwan Moon
- Article
46
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005, v. 8, n. 4, p. 5
- Primachenko, V. E.;
- Kirillova, S. I.;
- Manoilov, E. G.;
- Kizyak, I. M.;
- Bulakh, B. M.;
- Chernobai, V. A.;
- Venger, E. F.
- Article
47
- Optical & Quantum Electronics, 2009, v. 41, n. 1, p. 17, doi. 10.1007/s11082-009-9317-y
- Sonawane, B.;
- Bhole, M.;
- Patil, D.
- Article
48
- Materials Research Innovations, 2017, v. 21, n. 6, p. 358, doi. 10.1080/14328917.2016.1265244
- Wang, Sea-Fue;
- Hsu, Yung-Fu;
- Ku, Feng-Chi;
- Liu, Zu-You
- Article
49
- Materials Research Innovations, 2010, v. 14, n. 1, p. 34, doi. 10.1179/143307510X12599329343565
- Dhanaraj, G.;
- Raghothamachar, B.;
- Dudley, M.
- Article
50
- Crystal Research & Technology, 2013, v. 48, n. 4, p. 200, doi. 10.1002/crat.201200512
- Article