Works matching DE "SEMICONDUCTOR analysis"
1
- Advanced Functional Materials, 2017, p. n/a, doi. 10.1002/adfm.201702448
- Huang, Wenjuan;
- Gan, Lin;
- Yang, Haotian;
- Zhou, Nan;
- Wang, Renyan;
- Wu, Wanhui;
- Li, Huiqiao;
- Ma, Ying;
- Zeng, Haibo;
- Zhai, Tianyou
- Article
2
- Advanced Functional Materials, 2017, v. 27, n. 9, p. n/a, doi. 10.1002/adfm.201604163
- Huang, Jia;
- Du, Juan;
- Cevher, Zehra;
- Ren, Yuhang;
- Wu, Xiaohan;
- Chu, Yingli
- Article
3
- Advanced Functional Materials, 2017, v. 27, n. 4, p. n/a, doi. 10.1002/adfm.201604286
- Qiao, Xiaolan;
- Wu, Qinghe;
- Wu, Hongzhuo;
- Zhang, Jidong;
- Li, Hongxiang
- Article
4
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 120, doi. 10.1007/s10854-016-5500-7
- Čajko, Kristina;
- Lukić-Petrović, Svetlana;
- Šiljegović, Mirjana;
- Petrović, Dragoslav;
- Sekulić, Dalibor
- Article
5
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5243, doi. 10.1007/s10854-016-4420-x
- Adelifard, M.;
- Salamatizadeh, R.;
- Ketabi, S.
- Article
6
- International Journal of Advanced Manufacturing Technology, 2018, v. 99, n. 5-8, p. 1503, doi. 10.1007/s00170-018-2414-y
- Singh, Rashmi;
- Mathirajan, M.
- Article
7
- Integrated Ferroelectrics, 2018, v. 194, n. 1, p. 16, doi. 10.1080/10584587.2018.1514889
- Laishram, Radhapiyari;
- Praveen, S.;
- Guisan, Meenakshi;
- Garg, Preeti;
- Rawat, J. S.;
- Prakash, Chandra
- Article
8
- Integrated Ferroelectrics, 2018, v. 191, n. 1, p. 180, doi. 10.1080/10584587.2018.1457872
- Zhang, Yanni;
- Yang, Zhi;
- Ren, Yanbing;
- Chen, Xuhui;
- Yun, Jiangni;
- Yan, Junfeng;
- Zhao, Wu;
- Zhang, Zhiyong
- Article
9
- Integrated Ferroelectrics, 2017, v. 185, n. 1, p. 127, doi. 10.1080/10584587.2017.1370348
- Kar, Uddipta;
- Panda, J.;
- Nath, T. K.
- Article
10
- Physica Status Solidi (B), 2017, v. 254, n. 2, p. n/a, doi. 10.1002/pssb.201600443
- Szemjonov, Alexandra;
- Ithurria, Sandrine;
- Dubertret, Benoit;
- Ciofini, Ilaria;
- Labat, Frédéric;
- Pauporté, Thierry
- Article
11
- Microscopy Today, 2021, v. 29, n. 5, p. 56, doi. 10.1017/S1551929521001115
- Wilson, Laura;
- Laczniak, Dara
- Article
12
- ChemSusChem, 2017, v. 10, n. 22, p. 4552, doi. 10.1002/cssc.201701538
- Hegner, Franziska Simone;
- CardENas ‐ Morcoso, Drialys;
- Giménez, Sixto;
- López, Núria;
- Galan ‐ Mascaros, Jose Ramon
- Article
13
- Thermal Science, 2020, v. 24, n. 3A, p. 1585, doi. 10.2298/TSCI190609025W
- Zhifei WU;
- Yuxia XIANG;
- Jianjun WANG
- Article
14
- NANO (1793-2920), 2009, v. 4, n. 4, p. 239, doi. 10.1142/S179329200900171X
- Article
15
- Philosophical Magazine, 2006, v. 86, n. 29-31, p. 4727, doi. 10.1080/14786430600740641
- Arslan#, I.;
- Bleloch, A.;
- Stach, E. A.;
- Ogut, S.;
- Browning, N. D.
- Article
16
- Journal of Solid State Electrochemistry, 2018, v. 22, n. 11, p. 3621, doi. 10.1007/s10008-018-4069-x
- Waghadkar, Yogesh;
- Shinde, Manish;
- Rane, Sunit;
- Gosavi, Suresh;
- Terashima, Chiaki;
- Fujishima, Akira;
- Chauhan, Ratna
- Article
17
- Technical Electrodynamics / Tekhnichna Elektrodynamika, 2020, n. 3, p. 69, doi. 10.15407/techned2020.03.069
- Шидловська, Н. А.;
- Захарченко, С. М.
- Article
18
- Bulletin of the Chemical Society of Ethiopia, 2017, v. 31, n. 3, p. 435, doi. 10.4314/bcse.v31i3.7
- Ding-Wa Zhang;
- Yin-Feng Wang;
- Wen-Tong Chen
- Article
19
- IETE Journal of Research, 2009, v. 55, n. 6, p. 299, doi. 10.4103/0377-2063.59170
- Srivastava, J. K.;
- Pandey, Preeti;
- Mishra, V. N.;
- Dwivedi, R.
- Article
20
- Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
- Sivel, V. G. M.;
- Van Den Brand, J.;
- Wang, W. R.;
- Mohdadi, H.;
- Tichelaar, F. D.;
- Alkemade, P. F. A.;
- Zanbergen, H. W.
- Article
21
- International Journal of Photoenergy, 2015, v. 2015, p. 1, doi. 10.1155/2015/786562
- Yu, Jiaguo;
- Jaroniec, Mietek;
- Xiao, Wei;
- Trapalis, Christos;
- Liu, Hong
- Article
22
- Journal of Materials Science, 1999, v. 34, n. 23, p. 5783, doi. 10.1023/A:1004710302174
- Article
23
- International Journal of RF & Microwave Computer-Aided Engineering, 2006, v. 16, n. 6, p. 635, doi. 10.1002/mmce.20187
- Article
24
- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 9-10, p. 990, doi. 10.1007/s00170-005-2585-1
- Mathirajan, M.;
- Sivakumar, A. I.
- Article
25
- Nature, 2009, v. 458, n. 7235, p. 157, doi. 10.1038/458157a
- Article
26
- IETE Technical Review, 2020, v. 37, n. 2, p. 169, doi. 10.1080/02564602.2019.1584055
- Singh, Ankit Kumar;
- Pathak, Mukesh Kumar
- Article
27
- European Physical Journal - Applied Physics, 2015, v. 72, n. 3, p. 1, doi. 10.1051/epjap/2015150186
- Zengjun Liu;
- Bo Hu;
- Dongle Li;
- Peng Zhu;
- Yinghua Ye;
- Ruiqi Shen
- Article
28
- Materials Transactions, 2021, v. 62, n. 1, p. 105, doi. 10.2320/matertrans.MT-M2020257
- Article
29
- Energies (19961073), 2020, v. 13, n. 1, p. 103, doi. 10.3390/en13010103
- Article
30
- Angewandte Chemie International Edition, 2017, v. 56, n. 13, p. 3611, doi. 10.1002/anie.201700439
- Hu, Dake;
- Xu, Guanchen;
- Xing, Lei;
- Yan, Xingxu;
- Wang, Jingyi;
- Zheng, Jingying;
- Lu, Zhixing;
- Wang, Peng;
- Pan, Xiaoqing;
- Jiao, Liying
- Article
31
- Technical Physics, 2009, v. 54, n. 4, p. 555, doi. 10.1134/S1063784209040173
- Konshina, E. A.;
- Fedorov, M. A.;
- Rybnikova, A. E.;
- Amosova, L. P.;
- Ivanova, N. L.;
- Isaev, M. V.;
- Kostomarov, D. S.
- Article
32
- Technical Physics, 2007, v. 52, n. 1, p. 86, doi. 10.1134/S106378420701015X
- Kheifets, O.;
- Kobelev, L.;
- Melnikova, N.;
- Nugaeva, L.
- Article
33
- Archives of Metallurgy & Materials, 2015, v. 60, n. 2, p. 1051, doi. 10.1515/amm-2015-0258
- Myronchuk, G.L.;
- Zamurueva, O.V.;
- Oźga, K.;
- Szota, M.;
- El-Naggar, A.M.;
- Alzayed, N.S.;
- Piskach, L.V.;
- Parasyuk, O.V.;
- Albassam, A.A.;
- Fedorchuk, A.O.;
- Kityk, I.V.
- Article
34
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep06143
- Ching-Hwa Ho;
- Hsin-Hung Chen
- Article
35
- DAAAM International Scientific Book, 2013, p. 193, doi. 10.2507/daaam.scibook.2013.08
- Article
36
- Canadian Journal of Physics, 2015, v. 93, n. 12, p. 1638, doi. 10.1139/cjp-2015-0403
- Zarrinkamar, S.;
- Jahankohan, K.;
- Hassanabadi, H.
- Article
37
- Angewandte Chemie, 2017, v. 129, n. 11, p. 3082, doi. 10.1002/ange.201612423
- An, Yang;
- Liu, Yuanyuan;
- An, Pengfei;
- Dong, Juncai;
- Xu, Benyan;
- Dai, Ying;
- Qin, Xiaoyan;
- Zhang, Xiaoyang;
- Whangbo, Myung ‐ Hwan;
- Huang, Baibiao
- Article
38
- Applied Physics A: Materials Science & Processing, 2014, v. 114, n. 4, p. 1347, doi. 10.1007/s00339-013-7979-6
- Sbiaa, R.;
- Piramanayagam, S.
- Article
39
- Applied Physics A: Materials Science & Processing, 2006, v. 85, n. 4, p. 457, doi. 10.1007/s00339-006-3701-2
- Article
40
- Acta Technica Corviniensis - Bulletin of Engineering, 2015, v. 8, n. 1, p. 31
- WEISZ, Daniel R.;
- HIMMELSTOSS, Felix A.
- Article
41
- Materials (1996-1944), 2010, v. 3, n. 5, p. 3430, doi. 10.3390/ma3053430
- Jianmin Tao;
- Sergei Tretiak;
- Jian-Xin Zhu
- Article
42
- Materials (1996-1944), 2010, v. 3, n. 5, p. 3385, doi. 10.3390/ma3053385
- Sanjun Zhang;
- Audebert, Pierre;
- Yi Wei;
- Choueiry, Antoine Al;
- Lanty, Gäetan;
- Bréhier, Antoine;
- Galmiche, Laurent;
- Clavier, Gilles;
- Boissiére, Cédric;
- Lauret, Jean-Sébastien;
- Deleporte, Emmanuelle
- Article
43
- PLoS ONE, 2017, v. 12, n. 8, p. 1, doi. 10.1371/journal.pone.0181559
- McMahon, Christopher J.;
- Toomey, Joshua P.;
- Kane, Deb M.
- Article
44
- Nanoscale Research Letters, 2009, v. 4, n. 4, p. 385, doi. 10.1007/s11671-008-9241-2
- Article
45
- Surface & Interface Analysis: SIA, 2020, v. 52, n. 12, p. 786, doi. 10.1002/sia.6766
- Heide, Paul A.W.;
- Spampinato, Valentina;
- Franquet, Alexis;
- Zborowski, Charlotte;
- Conard, Thierry;
- Ludwig, Jonathan;
- Paredis, Kristof;
- Vandervorst, Wilfried;
- Pirkl, Alexander;
- Niehuis, Ewald
- Article
46
- Surface & Interface Analysis: SIA, 2016, v. 48, n. 11, p. 1100, doi. 10.1002/sia.6093
- Vasilyev, D.;
- Kirschner, J.
- Article
47
- Sensors (14248220), 2015, v. 15, n. 11, p. 28490, doi. 10.3390/s151128490
- Hyesu Jeon;
- Wook Jae Yoo;
- Sang Hun Shin;
- Guwon Kwon;
- Mingeon Kim;
- Hye Jin Kim;
- Young Beom Song;
- Kyoung Won Jang;
- Won Sik Youn;
- Bongsoo Lee
- Article
48
- Doklady Biochemistry & Biophysics, 2010, v. 430, n. 1, p. 41, doi. 10.1134/S1607672910010126
- Zdobnova, T.;
- Dorofeev, S.;
- Tananaev, P.;
- Zlomanov, V.;
- Stremovskiy, O.;
- Lebedenko, E.;
- Balalaeva, I.;
- Deyev, S.;
- Petrov, R.
- Article
49
- Journal of Intelligent Manufacturing, 2015, v. 26, n. 5, p. 861, doi. 10.1007/s10845-013-0821-3
- Wang, Shengyao;
- Wang, Ling;
- Liu, Min;
- Xu, Ye
- Article
50
- Inorganic Materials, 2013, v. 49, n. 12, p. 1249, doi. 10.1134/S0020168513140057
- Karandashev, V. K.;
- Zhernokleeva, K. V.;
- Baranovskaya, V. B.;
- Karpov, Yu. A.
- Article