Works matching DE "SEMICONDUCTOR analysis"


Results: 118
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    Application of the dual-beam FIB/SEM to metals research.

    Published in:
    Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
    By:
    • Sivel, V. G. M.;
    • Van Den Brand, J.;
    • Wang, W. R.;
    • Mohdadi, H.;
    • Tichelaar, F. D.;
    • Alkemade, P. F. A.;
    • Zanbergen, H. W.
    Publication type:
    Article
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    Glow discharge mass spectrometry.

    Published in:
    Analytical & Bioanalytical Chemistry, 2005, v. 381, n. 1, p. 173, doi. 10.1007/s00216-004-2933-2
    By:
    • Hoffmann, Volker;
    • Kasik, Martin;
    • Robinson, Peter K.;
    • Venzago, Cornel
    Publication type:
    Article
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    Cyclotron radiation of semiconductor crystals.

    Published in:
    Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018, v. 21, n. 1, p. 54, doi. 10.15407/spqeo21.01.054
    By:
    • Milenin, G. V.;
    • Milenin, V. V.;
    • Red'ko, R. A.
    Publication type:
    Article
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