Works matching DE "SEMICONDUCTOR analysis"
2
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep06143
- Ching-Hwa Ho;
- Hsin-Hung Chen
- Article
3
- Advanced Energy Materials, 2014, v. 4, n. 1, p. 1, doi. 10.1002/aenm.201300611
- Sun, Yongfu;
- Sun, Zhihu;
- Gao, Shan;
- Cheng, Hao;
- Liu, Qinghua;
- Lei, Fengcai;
- Wei, Shiqiang;
- Xie, Yi
- Article
4
- DAAAM International Scientific Book, 2013, p. 193, doi. 10.2507/daaam.scibook.2013.08
- Article
5
- Quality & Reliability Engineering International, 1992, v. 8, n. 2, p. 93, doi. 10.1002/qre.4680080204
- Glacet, J. Y.;
- Dall'Oro, G. Guerri
- Article
6
- International Journal of Advanced Manufacturing Technology, 2006, v. 29, n. 9-10, p. 990, doi. 10.1007/s00170-005-2585-1
- Mathirajan, M.;
- Sivakumar, A. I.
- Article
7
- Nature, 2009, v. 458, n. 7235, p. 157, doi. 10.1038/458157a
- Article
8
- Journal of Microscopy, 2004, v. 214, n. 3, p. 237, doi. 10.1111/j.0022-2720.2004.01329.x
- Sivel, V. G. M.;
- Van Den Brand, J.;
- Wang, W. R.;
- Mohdadi, H.;
- Tichelaar, F. D.;
- Alkemade, P. F. A.;
- Zanbergen, H. W.
- Article
9
- Thermal Science, 2020, v. 24, n. 3A, p. 1585, doi. 10.2298/TSCI190609025W
- Zhifei WU;
- Yuxia XIANG;
- Jianjun WANG
- Article
10
- Electronics & Electrical Engineering, 2010, n. 99, p. 3
- Špánik, P.;
- Šul, R.;
- Frívaldský, M.;
- Drgońa, P.;
- Kandráč, J.
- Article
11
- Physics of Atomic Nuclei, 2017, v. 80, n. 11, p. 1647, doi. 10.1134/S1063778817090149
- Article
12
- Journal of Electronic Materials, 2009, v. 38, n. 1, p. 54, doi. 10.1007/s11664-008-0528-y
- Takaku, Yoshikazu;
- Makino, Komei;
- Watanabe, Keita;
- Ohnuma, Ikuo;
- Kainuma, Ryosuke;
- Yamada, Yasushi;
- Yagi, Yuji;
- Nakagawa, Ikuo;
- Atsumi, Takashi;
- Ishida, Kiyohito
- Article
13
- Philosophical Magazine, 2006, v. 86, n. 29-31, p. 4727, doi. 10.1080/14786430600740641
- Arslan#, I.;
- Bleloch, A.;
- Stach, E. A.;
- Ogut, S.;
- Browning, N. D.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 120, doi. 10.1007/s10854-016-5500-7
- Čajko, Kristina;
- Lukić-Petrović, Svetlana;
- Šiljegović, Mirjana;
- Petrović, Dragoslav;
- Sekulić, Dalibor
- Article
15
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5243, doi. 10.1007/s10854-016-4420-x
- Adelifard, M.;
- Salamatizadeh, R.;
- Ketabi, S.
- Article
16
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 5, p. 1329, doi. 10.1002/pssa.201532680
- Micard, Gabriel;
- Hahn, Giso;
- Terheiden, Barbara
- Article
17
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 4, p. n/a, doi. 10.1002/pssr.201308326
- Zhang, W.;
- Martin, M.;
- Brown, E. R.
- Article
18
- Studia Universitatis Babes-Bolyai, Chemia, 2017, v. 62, n. 1, p. 195, doi. 10.24193/subbchem.2017.1.17
- Article
19
- DESIDOC Journal of Library & Information Technology, 2018, v. 38, n. 1, p. 5, doi. 10.14429/djlit.38.1.12307
- Makhija, Veena;
- Ahuja, Swapnil
- Article
20
- Advanced Functional Materials, 2017, p. n/a, doi. 10.1002/adfm.201702448
- Huang, Wenjuan;
- Gan, Lin;
- Yang, Haotian;
- Zhou, Nan;
- Wang, Renyan;
- Wu, Wanhui;
- Li, Huiqiao;
- Ma, Ying;
- Zeng, Haibo;
- Zhai, Tianyou
- Article
21
- Advanced Functional Materials, 2017, v. 27, n. 9, p. n/a, doi. 10.1002/adfm.201604163
- Huang, Jia;
- Du, Juan;
- Cevher, Zehra;
- Ren, Yuhang;
- Wu, Xiaohan;
- Chu, Yingli
- Article
22
- Advanced Functional Materials, 2017, v. 27, n. 4, p. n/a, doi. 10.1002/adfm.201604286
- Qiao, Xiaolan;
- Wu, Qinghe;
- Wu, Hongzhuo;
- Zhang, Jidong;
- Li, Hongxiang
- Article
23
- Journal of Intelligent Manufacturing, 2015, v. 26, n. 5, p. 861, doi. 10.1007/s10845-013-0821-3
- Wang, Shengyao;
- Wang, Ling;
- Liu, Min;
- Xu, Ye
- Article
24
- International Journal of Advanced Manufacturing Technology, 2018, v. 99, n. 5-8, p. 1503, doi. 10.1007/s00170-018-2414-y
- Singh, Rashmi;
- Mathirajan, M.
- Article
25
- Journal of Solid State Electrochemistry, 2018, v. 22, n. 11, p. 3621, doi. 10.1007/s10008-018-4069-x
- Waghadkar, Yogesh;
- Shinde, Manish;
- Rane, Sunit;
- Gosavi, Suresh;
- Terashima, Chiaki;
- Fujishima, Akira;
- Chauhan, Ratna
- Article
26
- Inorganic Materials, 2013, v. 49, n. 12, p. 1249, doi. 10.1134/S0020168513140057
- Karandashev, V. K.;
- Zhernokleeva, K. V.;
- Baranovskaya, V. B.;
- Karpov, Yu. A.
- Article
27
- Nanomaterials & Nanotechnology, 2014, v. 4, p. 1, doi. 10.5772/58466
- Syota Kamikawa;
- Taisei Shimizu;
- Yuko Yagi;
- Junji Haruyama
- Article
28
- Applied Physics A: Materials Science & Processing, 2014, v. 114, n. 4, p. 1347, doi. 10.1007/s00339-013-7979-6
- Sbiaa, R.;
- Piramanayagam, S.
- Article
29
- Applied Physics A: Materials Science & Processing, 2006, v. 85, n. 4, p. 457, doi. 10.1007/s00339-006-3701-2
- Article
30
- PLoS ONE, 2017, v. 12, n. 8, p. 1, doi. 10.1371/journal.pone.0181559
- McMahon, Christopher J.;
- Toomey, Joshua P.;
- Kane, Deb M.
- Article
31
- Semiconductors, 2018, v. 52, n. 1, p. 131, doi. 10.1134/S1063782618010190
- Sachenko, A.;
- Belyaev, A.;
- Konakova, R.
- Article
32
- Semiconductors, 2012, v. 46, n. 6, p. 786, doi. 10.1134/S1063782612060140
- Article
33
- Semiconductors, 2011, v. 45, n. 6, p. 832, doi. 10.1134/S106378261106025X
- Article
34
- Semiconductors, 2010, v. 44, n. 10, p. 1258, doi. 10.1134/S1063782610100027
- Article
35
- Semiconductors, 2008, v. 42, n. 6, p. 651, doi. 10.1134/S1063782608060043
- Sidorov, G. Yu.;
- Mikhaĭlov, N. N.;
- Varavin, V. S.;
- Ikusov, D. G.;
- Sidorov, Yu. G.;
- Dvoretskiĭ, S. A.
- Article
36
- Semiconductors, 2008, v. 42, n. 6, p. 655, doi. 10.1134/S1063782608060055
- Article
37
- Semiconductors, 2008, v. 42, n. 6, p. 662, doi. 10.1134/S1063782608060067
- Stamov, I. G.;
- Tkachenko, D. V.
- Article
38
- Semiconductors, 2008, v. 42, n. 6, p. 720, doi. 10.1134/S1063782608060146
- Usov, S.;
- Tsatsul’nikov, A.;
- Lundin, V.;
- Sakharov, A.;
- Zavarin, E.;
- Sinitsyn, M.;
- Ledentsov, N.
- Article
39
- Semiconductors, 2003, v. 37, n. 11, p. 1275, doi. 10.1134/1.1626207
- Yakovyna, V. S.;
- Zayachuk, D. M.;
- Berchenko, N. N.
- Article
40
- Semiconductors, 2003, v. 37, n. 9, p. 1123, doi. 10.1134/1.1610132
- Grekhov, I.V.;
- Kyuregyan, A.S.;
- Mnatsakanov, T.T.;
- Yurkov, S.N.
- Article
41
- Analytical & Bioanalytical Chemistry, 2005, v. 381, n. 1, p. 173, doi. 10.1007/s00216-004-2933-2
- Hoffmann, Volker;
- Kasik, Martin;
- Robinson, Peter K.;
- Venzago, Cornel
- Article
42
- Journal of Experimental & Theoretical Physics, 2007, v. 105, n. 1, p. 198, doi. 10.1134/S1063776107070436
- Shorokhov, A. V.;
- Alekseev, K. N.
- Article
43
- Journal of Experimental & Theoretical Physics, 2005, v. 101, n. 4, p. 708, doi. 10.1134/1.2131940
- Aleshkin, V. Ya.;
- Antonov, A. V.;
- Gavrilenko, L. V.;
- Gavrilenko, V. I.
- Article
44
- Technical Electrodynamics / Tekhnichna Elektrodynamika, 2020, n. 3, p. 69, doi. 10.15407/techned2020.03.069
- Шидловська, Н. А.;
- Захарченко, С. М.
- Article
45
- Modern Physics Letters B, 2002, v. 16, n. 20, p. 747, doi. 10.1142/S021798490200424X
- Grado-Caffaro, M. A.;
- Grado-Caffaro, M.
- Article
46
- Nature Nanotechnology, 2014, v. 9, n. 2, p. 111, doi. 10.1038/nnano.2013.277
- Zhang, Yi;
- Chang, Tay-Rong;
- Zhou, Bo;
- Cui, Yong-Tao;
- Yan, Hao;
- Liu, Zhongkai;
- Schmitt, Felix;
- Lee, James;
- Moore, Rob;
- Chen, Yulin;
- Lin, Hsin;
- Jeng, Horng-Tay;
- Mo, Sung-Kwan;
- Hussain, Zahid;
- Bansil, Arun;
- Shen, Zhi-Xun
- Article
47
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018, v. 21, n. 1, p. 54, doi. 10.15407/spqeo21.01.054
- Milenin, G. V.;
- Milenin, V. V.;
- Red'ko, R. A.
- Article
48
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2018, v. 21, n. 1, p. 5, doi. 10.15407/spqeo21.01.005
- Sachenko, A. V.;
- Konakova, R. V.;
- Belyaev, A. E.
- Article
49
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2008, v. 11, n. 4, p. 381, doi. 10.15407/spqeo11.04.381
- Solntsev, V. S.;
- Litovchenko, V. G.;
- Gorbanyuk, T. I.;
- Evtukh, A. A.
- Article
50
- Semiconductor Physics, Quantum Electronics & Optoelectronics, 2003, v. 6, n. 3, p. 319, doi. 10.15407/spqeo6.03.319
- Serdega, B. K.;
- Venger, E. F.;
- Matyash, I. E.
- Article