The vital contribution of manufacturing technology.
- Published in:
- 2001
- By:
- Publication type:
- Editorial
Works matching DE "SEMATECH Inc."
Results: 29
1
2
TECHNOLOGY NEWS.
- Published in:
- Solid State Technology, 2000, v. 43, n. 7, p. 36
- Publication type:
- Article
3
Japan sees rising demand for LCD driver ICs.
- Published in:
- Solid State Technology, 2000, v. 43, n. 5, p. 69
- By:
- Publication type:
- Article
4
Interface `99: Focus on future litho costs.
- Published in:
- Solid State Technology, 2000, v. 43, n. 2, p. 25
- Publication type:
- Article
5
EUV & EPL: Int'l SEMATECH says two NGL options may co-exist.
- Published in:
- Solid State Technology, 2000, v. 43, n. 2, p. 23
- By:
- Publication type:
- Article
6
300mm factory layout and automated materials handling.
- Published in:
- Solid State Technology, 1999, v. 42, n. 12, p. 35
- By:
- Publication type:
- Article
7
SEMI session shows standards emerging for 300mm tools.
- Published in:
- Solid State Technology, 1999, v. 42, n. 12, p. 20
- Publication type:
- Article
8
SEMATECH may merge with Int'l arm.
- Published in:
- Solid State Technology, 1999, v. 42, n. 6, p. 14
- Publication type:
- Article
9
Worldwide highlights.
- Published in:
- Solid State Technology, 1999, v. 42, n. 3, p. 16
- Publication type:
- Article
10
Optical lithography to 2000 and beyond.
- Published in:
- Solid State Technology, 1999, v. 42, n. 2, p. 31
- By:
- Publication type:
- Article
11
13001 makes 0.12-microm lines with 248-nm exposure.
- Published in:
- Solid State Technology, 1999, v. 42, n. 1, p. 20
- By:
- Publication type:
- Article
12
Factory Mutual and SEMATECH establish protocols.
- Published in:
- Solid State Technology, 1998, v. 41, n. 10, p. 38
- By:
- Publication type:
- Article
13
Sematech team makes 100-nm features.
- Published in:
- Solid State Technology, 1998, v. 41, n. 8, p. 38
- By:
- Publication type:
- Article
14
`Manufacturable' 100-nm features from 248-nm lithography.
- Published in:
- Solid State Technology, 1998, v. 41, n. 7, p. 54
- By:
- Publication type:
- Article
15
Tech briefs.
- Published in:
- Solid State Technology, 1998, v. 41, n. 5, p. 32
- Publication type:
- Article
16
SEMATECH achieves low-k plus copper.
- Published in:
- Solid State Technology, 1998, v. 41, n. 1, p. 32
- By:
- Publication type:
- Article
17
Praise for SEMATECH.
- Published in:
- 2012
- By:
- Publication type:
- Opinion
18
Step Change in Safe Harbors: Public--Private Partnerships.
- Published in:
- 2009
- By:
- Publication type:
- Editorial
19
POLICY ISSUES IN COLLABORATIVE RESEARCH AND DEVELOPMENT.
- Published in:
- International Trade Journal, 1991, v. 6, n. 1, p. 63, doi. 10.1080/08853909108523732
- By:
- Publication type:
- Article
20
Pushing the limits.
- Published in:
- 2010
- By:
- Publication type:
- Interview
21
TECHNICAL BULLETINS.
- Published in:
- Advanced Materials & Processes, 2005, v. 163, n. 12, p. 12
- Publication type:
- Article
22
Carbon nanotubes measure dimensions in semiconductors.
- Published in:
- Advanced Materials & Processes, 2005, v. 163, n. 7, p. 25
- Publication type:
- Article
23
Statistics in the semiconductor industry: A competitive necessity.
- Published in:
- American Statistician, 1995, v. 49, n. 3, p. 245, doi. 10.2307/2684194
- By:
- Publication type:
- Article
24
SEMATECH and collaborative research: Lessons in the design of high-technology consortia.
- Published in:
- Journal of Policy Analysis & Management, 1994, v. 13, n. 4, p. 723, doi. 10.2307/3325495
- By:
- Publication type:
- Article
25
Nippon senso buys American.
- Published in:
- Bulletin of the Atomic Scientists, 1991, v. 47, n. 1, p. 7
- Publication type:
- Article
26
SHARPEN YOUR SKILLS AND IMPROVE YOUR LAB BY PARTICIPATING IN SUNY POLY SEMATECH FAILURE ANALYSIS COUNCIL MEETINGS.
- Published in:
- Electronic Device Failure Analysis, 2015, v. 17, n. 4, p. 56
- By:
- Publication type:
- Article
27
Collaboration and Information Sharing Results in Improved Failure Analysis Tools, Techniques, and Outcomes.
- Published in:
- Electronic Device Failure Analysis, 2010, v. 12, n. 4, p. 44, doi. 10.31399/asm.edfa.2010-4.p044
- By:
- Publication type:
- Article
28
SEMATECH Reports New Approach to Simulate Transistor Noise.
- Published in:
- Electronic Device Failure Analysis, 2010, v. 12, n. 1, p. 43
- Publication type:
- Article
29
SEMATECH After Five Years: High-Technology Consortia and U.S. Competitiveness.
- Published in:
- California Management Review, 1993, v. 35, n. 4, p. 9, doi. 10.2307/41166752
- By:
- Publication type:
- Article