Works matching DE "SELF-testing (Computer science)"
Results: 14
The Organization of Built-in Hardware-Level Mutual Self-Test in Mesh-Connected VLSI Multiprocessors.
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- International Review on Computers & Software, 2022, v. 17, n. 1, p. 7, doi. 10.15866/irecos.v17i1.21841
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- Article
A Review on Structural Software-Based Self-Testing of Embedded Processors.
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- International Review on Computers & Software, 2014, v. 9, n. 5, p. 832
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- Article
Development and testing of an automated computer tablet-based method for self-testing of high and low contrast near visual acuity in ophthalmic patients.
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- Graefe's Archive of Clinical & Experimental Ophthalmology, 2016, v. 254, n. 5, p. 891, doi. 10.1007/s00417-016-3293-2
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- Article
Self-Healing Many-Core Architecture: Analysis and Evaluation.
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- VLSI Design, 2016, p. 1, doi. 10.1155/2016/9767139
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- Article
Study and Realization of Circuit Analysis Online Test System Based on Web.
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- International Journal of Online Engineering, 2014, v. 10, n. 2, p. 52, doi. 10.3991/ijoe.v10i2.3101
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- Article
Environment for the analysis of functional self-test quality in digital systems.
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- Proceedings of the Estonian Academy of Sciences, 2014, v. 63, n. 2, p. 151, doi. 10.3176/proc.2014.2.05
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- Article
Supervised and Unsupervised Self-Testing for HIV in High- and Low-Risk Populations: A Systematic Review.
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- PLoS Medicine, 2013, v. 10, n. 4, p. 1, doi. 10.1371/journal.pmed.1001414
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- Article
A method of self-testing of an analog circuit terminated by an ADC in electronic embedded systems controlled by microcontrollers.
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- Przegląd Elektrotechniczny, 2016, v. 92, n. 11, p. 19, doi. 10.15199/48.2016.11.05
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- Article
Achievement of a wireless portable apparatus for self-checking emergency lights.
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- IEEJ Transactions on Electrical & Electronic Engineering, 2016, v. 11, n. 6, p. 812, doi. 10.1002/tee.22292
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- Article
Compaction of test response at self-testing in the programmable logic matrices.
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- Automation & Remote Control, 2013, v. 74, n. 2, p. 264, doi. 10.1134/S0005117913020082
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- Article
Built in Self-Test: A REVIEW.
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- International Journal of Recent Research Aspects, 2016, p. 83
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- Article
Two-Run RAM March Testing with Address Decimation.
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- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 2, p. 1, doi. 10.1142/S0218126617500311
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- Article
A Cost-efficient Input Vector Monitoring Concurrent On-line BIST Scheme Based on Multilevel Decoding Logic.
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- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 585, doi. 10.1007/s10836-013-5380-1
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- Article
Will an Unsupervised Self-Testing Strategy for HIV Work in Health Care Workers of South Africa? A Cross Sectional Pilot Feasibility Study.
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- PLoS ONE, 2013, v. 8, n. 11, p. 1, doi. 10.1371/journal.pone.0079772
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- Article