Works matching DE "SECONDARY ion emission"
1
- Plasma Physics Reports, 2012, v. 38, n. 7, p. 585, doi. 10.1134/S1063780X12060050
- Lopatin, I.;
- Schanin, P.;
- Akhmadeev, Yu.;
- Kovalsky, S.;
- Koval, N.
- Article
2
- Philosophical Magazine Letters, 2007, v. 87, n. 8, p. 541, doi. 10.1080/09500830701286227
- Morrall, P.;
- Price, D. W.;
- Nelson, A. J.;
- Siekhaus, W. J.;
- Nelson, E.;
- Wu, K. J.;
- Stratman, M.;
- McLean II, W.
- Article
3
- Molecules, 2022, v. 27, n. 3, p. 648, doi. 10.3390/molecules27030648
- Arabczyk, Walerian;
- Rogowski, Jacek;
- Pelka, Rafał;
- Lendzion-Bieluń, Zofia
- Article
4
- Journal of Structural Chemistry, 2014, v. 55, n. 5, p. 995, doi. 10.1134/S002247661405031X
- Article
5
- Journal of Plasma Physics, 2005, v. 71, n. 1, p. 35, doi. 10.1017/s0022377804002983
- Y. CANG;
- F. OSMAN;
- H. HORA;
- J. ZHANG;
- J. BADZIAK;
- J. WOLOWSKI;
- K. JUNGWIRTH;
- K. ROHLENA;
- J. ULLSCHMIED
- Article
6
- Rapid Communications in Mass Spectrometry: RCM, 2021, v. 35, n. 1, p. 1, doi. 10.1002/rcm.8958
- Jones, Clive;
- Fike, David A.
- Article
7
- 2019
- Tolstogouzov, Alexander;
- Drozdov, Mikhail N.;
- Belykh, Sergey F.;
- Gololobov, Gennady P.;
- Ieshkin, Alexei E.;
- Mazarov, Paul;
- Suvorov, Dmitriy V.;
- Fu, Dejun;
- Pelenovich, Vasiliy;
- Zeng, Xiaomei;
- Zuo, Wenbin
- Letter to the Editor
8
- Technical Physics, 2011, v. 56, n. 4, p. 546, doi. 10.1134/S1063784211040177
- Isakhanov, Z.;
- Mukhtarov, Z.;
- Umirzakov, B.;
- Ruzibaeva, M.
- Article
9
- Technical Physics, 2009, v. 54, n. 11, p. 1566, doi. 10.1134/S1063784209110024
- Kudriavtsev, Yu.;
- Asomoza, R.
- Article
10
- Technical Physics, 2009, v. 54, n. 4, p. 580, doi. 10.1134/S1063784209040215
- Ksenofontov, V. A.;
- Sadanov, E. V.;
- Velikodnaya, O. A.
- Article
11
- Technical Physics, 2008, v. 53, n. 4, p. 451, doi. 10.1134/S1063784208040099
- Article
12
- Technical Physics, 2005, v. 50, n. 4, p. 427, doi. 10.1134/1.1901780
- Article
13
- Technical Physics, 2002, v. 47, n. 7, p. 915, doi. 10.1134/1.1495059
- Mis’kevich, A. I.;
- Zhao Xiaolin
- Article
14
- Technical Physics, 2001, v. 46, n. 2, p. 227, doi. 10.1134/1.1349282
- Volkolupov, Yu. Ya.;
- Dovbnya, A. N.;
- Zakutin, V. V.;
- Krasnogolovets, M. A.;
- Reshetnyak, N. G.;
- Mitrochenko, V. V.;
- Romas’ko, V. P.;
- Churyumov, G. I.
- Article
15
- Technical Physics, 2000, v. 45, n. 10, p. 1351, doi. 10.1134/1.1318977
- Article
16
- Radiocarbon, 2013, v. 55, n. 2, p. 865, doi. 10.1017/S0033822200058021
- Salehpour, M.;
- Håkansson, K.;
- Westermark, P.;
- Antoni, G.;
- Wikström, G.;
- Possnert, G.
- Article
17
- Journal of Materials Science, 2010, v. 45, n. 11, p. 2983, doi. 10.1007/s10853-010-4297-7
- Jiménez, J. A.;
- Lysenko, S.;
- Liu, H.
- Article
18
- Journal of Materials Science, 2006, v. 41, n. 5, p. 1623, doi. 10.1007/s10853-006-4658-4
- Dhareshwar, L. J.;
- Chaurasia, S.;
- Murali, C. G.;
- Gupta, N. K.;
- Godwal, B. K.
- Article
19
- Progress in Physics of Metals / Uspehi Fiziki Metallov, 2018, v. 19, n. 1, p. 49, doi. 10.15407/ufm.19.01.049
- CHEREPIN, V. T.;
- VASYLYEV, M. O.;
- MAKEEVA, I. M.;
- KOLESNIK, V. M.;
- VOLOSHKO, S. M.
- Article
20
- Instruments & Experimental Techniques, 2003, v. 46, n. 1, p. 85, doi. 10.1023/A:1022551827411
- Gavrilov, N. V.;
- Emlin, D. R.;
- Kamenetskikh, A. S.
- Article
21
- High Energy Chemistry, 2003, v. 37, n. 2, p. 83, doi. 10.1023/A:1022832315078
- Kundina, Yu. F.;
- Tyutnev, A. P.;
- Saenko, V. S.;
- Shakhbazov, S. Yu.;
- Pozhidaev, E. D.
- Article
22
- Applied Physics A: Materials Science & Processing, 2008, v. 92, n. 4, p. 999, doi. 10.1007/s00339-008-4676-y
- Kaplan, A.;
- Lenner, M.;
- Huchon, C.;
- Palmer, R. E.
- Article
23
- Surface & Interface Analysis: SIA, 2016, v. 48, n. 7, p. 428, doi. 10.1002/sia.5957
- Grasso, Salvatore;
- Fumagalli, Francesco;
- Polignano, Marialuisa;
- Ravizza, Enrica;
- Spadoni, Simona;
- Soncini, Valter
- Article
24
- Russian Journal of Nondestructive Testing, 2004, v. 40, n. 12, p. 830, doi. 10.1007/s11181-005-0114-9
- Syurdo, A.;
- Kortov, V.;
- Mil’man, I.;
- Slesarev, A.;
- Mikhailovich, A.
- Article
25
- Technical Physics Letters, 2002, v. 28, n. 6, p. 475, doi. 10.1134/1.1490964
- Bulyarskii, S. V.;
- Zhukov, A. V.;
- Prikhod’ko, V. V.
- Article
26
- Journal of Geophysical Research. Atmospheres, 2020, v. 125, n. 18, p. 1, doi. 10.1029/2020JD033220
- Li, Jiarong;
- Zhu, Chao;
- Chen, Hui;
- Fu, Hongbo;
- Xiao, Hang;
- Wang, Xiaofei;
- Herrmann, Hartmut;
- Chen, Jianmin
- Article
27
- Surface & Interface Analysis: SIA, 2025, v. 57, n. 1, p. 36, doi. 10.1002/sia.7361
- Kakhamonova, Guliston;
- Akhunov, Shovkatjon Dj.;
- Nazarov, Makhmanazar M.;
- Mavlonov, Ramazon R.;
- Usmanov, Dilshadbek T.
- Article
28
- International Review on Modelling & Simulations, 2010, v. 3, n. 3, p. 401
- Boumhali, A.;
- Eddahby, M.;
- Dzairy, K.;
- Dezairi, A.;
- Saifaoui, D.;
- Louafi, J.;
- Lahouaichri, S.;
- Moultif, R.
- Article
29
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2025, v. 39, n. 5, p. 1, doi. 10.1142/S021797922450440X
- Article
30
- Geophysical Research Abstracts, 2019, v. 21, p. 1
- Mann, Ingrid;
- Myrvang, Margaretha;
- Jozwicki, Dorota
- Article
31
- Tribology Transactions, 2004, v. 47, n. 1, p. 86, doi. 10.1080/05698190490278967
- HIRATSUKA, KEN'ICHI;
- KAJDAS, CZESLAW;
- YOSHIDA, MAKOTO
- Article
32
- Bulletin of the Astronomical Society of India, 2005, v. 33, n. 2, p. 233
- George, Koshy;
- Chandrasekhar, T.
- Article
33
- Journal of Dispersion Science & Technology, 2006, v. 27, n. 8, p. 1187, doi. 10.1080/01932690600859853
- Gu, Zhenfang;
- Sun, Hua;
- Mu, Jin;
- Zhang, Zhiqing;
- Wang, Lei;
- Kang, Shi‐Zhao
- Article
34
- Journal of Experimental & Theoretical Physics, 2013, v. 116, n. 2, p. 186, doi. 10.1134/S1063776113010093
- Minnebaev, K.;
- Tolpin, K.;
- Yurasova, V.
- Article
35
- Journal of Communications Technology & Electronics, 2012, v. 57, n. 1, p. 27, doi. 10.1134/S1064226911120229
- Article
36
- Journal of Polymer Research, 2009, v. 16, n. 5, p. 481, doi. 10.1007/s10965-008-9251-x
- Article
37
- Microscopy & Microanalysis, 2019, p. 334, doi. 10.1017/S1431927618002167
- Article
38
- Surface Review & Letters, 2005, v. 12, n. 1, p. 107, doi. 10.1142/S0218625X05006858
- Article
39
- Semiconductors, 2010, v. 44, n. 5, p. 653, doi. 10.1134/S1063782610050180
- Ivanov, P. A.;
- Grekhov, I. V.;
- Potapov, A. S.;
- Samsonova, T. P.;
- Il'inskaya, N. D.;
- Kon'kov, O. I.;
- Serebrennikova, O. Yu.
- Article
40
- Journal of Engineering Physics & Thermophysics, 2023, v. 96, n. 5, p. 1271, doi. 10.1007/s10891-023-02793-y
- Goncharov, V. K.;
- Gusakov, G. A.;
- Puzyrev, M. V.
- Article
41
- Laser & Particle Beams, 2008, v. 26, n. 4, p. 555, doi. 10.1017/S0263034608000591
- Article
42
- Laser & Particle Beams, 2008, v. 26, n. 3, p. 473, doi. 10.1017/S0263034608000487
- Article
43
- European Physical Journal D (EPJ D), 2012, v. 66, n. 10, p. 1, doi. 10.1140/epjd/e2012-30133-2
- Martinez, R.;
- Ponciano, C.R.;
- Silveira, E.F.
- Article