The Fabrication and Characterization of Ni/4H-SiC Schottky Diode Radiation Detectors with a Sensitive Area of up to 4 cm<sup>2</sup>.Published in:Sensors (14248220), 2017, v. 17, n. 10, p. 2334, doi. 10.3390/s17102334By:Lin-Yue Liu;Ling Wang;Peng Jin;Jin-Liang Liu;Xian-Peng Zhang;Liang Chen;Jiang-Fu Zhang;Xiao-Ping Ouyang;Ao Liu;Run-Hua Huang;Song BaiPublication type:Article
Recovery Time of the Schottky-PIN Limiter.Published in:Microwave Journal, 2012, v. 55, n. 11, p. 66By:CHIN LEONG LIMPublication type:Article