Works matching DE "SCANNING capacitance microscopy"
1
- Scientific Reports, 2020, v. 10, n. 1, p. N.PAG, doi. 10.1038/s41598-020-71064-0
- Bah, Micka;
- Valente, Damien;
- Lesecq, Marie;
- Defrance, Nicolas;
- Garcia Barros, Maxime;
- De Jaeger, Jean-Claude;
- Frayssinet, Eric;
- Comyn, Rémi;
- Ngo, Thi Huong;
- Alquier, Daniel;
- Cordier, Yvon
- Article
2
- Crystallography Reports, 2018, v. 63, n. 5, p. 784, doi. 10.1134/S1063774518050115
- Gainutdinov, R. V.;
- Tolstikhina, A. L.;
- Belugina, N. V.;
- Roshchin, B. S.;
- Zolotov, D. A.;
- Asadchikov, V. E.;
- Shut, V. N.;
- Kashevich, I. F.;
- Mozzharov, S. E.
- Article
3
- Crystal Research & Technology, 2017, v. 52, n. 6, p. n/a, doi. 10.1002/crat.201700019
- Szyszka, Adam;
- Dawidowski, Wojciech;
- Stafiniak, Andrzej;
- Prażmowska, Joanna;
- Ściana, Beata;
- Tłaczała, Marek
- Article
4
- Physica Status Solidi. A: Applications & Materials Science, 2014, v. 211, n. 2, p. 509, doi. 10.1002/pssa.201300208
- Periwal, P.;
- Bassani, F.;
- Patriarche, G.;
- Latu‐Romain, L.;
- Brouzet, V.;
- Salem, B.;
- Baron, T.
- Article
5
- Acta Geologica Sinica (English Edition), 2014, v. 88, p. 1466, doi. 10.1111/1755-6724.12382_13
- LIU, Jun;
- JIN, Shuyun;
- WANG, Yujie
- Article
6
- Semiconductors, 2013, v. 47, n. 2, p. 289, doi. 10.1134/S106378261302019X
- Sobolev, N.;
- Loshachenko, A.;
- Poloskin, D.;
- Shek, E.
- Article
7
- Electronic Device Failure Analysis, 2017, v. 19, n. 3, p. 22, doi. 10.31399/asm.edfa.2017-3.p022
- Dixon-Warren, St. J.;
- Drevniok, B.
- Article
8
- Progress in Photovoltaics, 2017, v. 25, n. 1, p. 33, doi. 10.1002/pip.2805
- Xiao, Chuanxiao;
- Jiang, Chun‐Sheng;
- Moutinho, Helio;
- Levi, Dean;
- Yan, Yanfa;
- Gorman, Brian;
- Al‐Jassim, Mowafak
- Article
9
- Progress in Photovoltaics, 2015, v. 23, n. 11, p. 1466, doi. 10.1002/pip.2576
- Korevaar, Bas A.;
- Zorn, Gilad;
- Raghavan, Kamala C.;
- Cournoyer, James R.;
- Dovidenko, Katharine
- Article
