Novel Architecture for Logic Test Using Single Cycle Access Structure.
- Published in:
- Journal of VLSI Circuits & Systems (JVCS), 2021, v. 3, n. 1, p. 1, doi. 10.31838/jvcs/03.01.01
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- Publication type:
- Article
Works matching DE "SCAN chain (Microelectronics)"
Results: 7
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INTERACTIVE MAPPING USING RANGE SENSOR DATA UNDER LOCALIZATION UNCERTAINTY.
- Published in:
- Journal of Automation, Mobile Robotics & Intelligent Systems, 2013, v. 7, n. 1, p. 47
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- Publication type:
- Article
3
Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based Technique.
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- Journal of Electronic Testing, 2014, v. 30, n. 3, p. 329, doi. 10.1007/s10836-014-5453-9
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- Publication type:
- Article
4
Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction.
- Published in:
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 625, doi. 10.1007/s10836-013-5404-x
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- Publication type:
- Article
5
Design of Test Wrapper Scan Chain Based on Differential Evolution.
- Published in:
- Journal of Engineering Science & Technology Review, 2013, v. 6, n. 2, p. 10
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- Publication type:
- Article
6
Robust People Tracking Using an Adaptive Sensor Fusion between a Laser Scanner and Video Camera.
- Published in:
- International Journal of Distributed Sensor Networks, 2013, p. 1, doi. 10.1155/2013/521383
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- Publication type:
- Article
7
LVI AND LVP APPLICATIONS IN IN-LINE SCAN CHAIN FAILURE ANALYSIS.
- Published in:
- Electronic Device Failure Analysis, 2016, v. 18, n. 4, p. 4, doi. 10.31399/asm.edfa.2016-4.p004
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- Publication type:
- Article