Works matching DE "SAMPLING oscilloscopes"
1
- EE: Evaluation Engineering, 2016, v. 55, n. 7, p. 12
- Article
4
- EE: Evaluation Engineering, 2006, v. 45, n. 7, p. 22
- Article
5
- EE: Evaluation Engineering, 2006, v. 45, n. 2, p. 24
- Article
6
- EE: Evaluation Engineering, 2006, v. 45, n. 1, p. 14
- Lauterbach, Michael;
- Schnecker, Michael
- Article
7
- EE: Evaluation Engineering, 2003, v. 42, n. 7, p. 8
- Article
8
- Electronics & Electrical Engineering, 2009, n. 96, p. 113
- Riabinin, J. A.;
- Aksenov, N. Y.
- Article
9
- Materials Science / Medziagotyra, 2014, v. 20, n. 2, p. 232, doi. 10.5755/j01.ms.20.2.6331
- AŠMONTAS, Steponas;
- KIPRIJANOVIČ, Oleg;
- LEVITAS, Boris;
- MATUZAS, Jonas;
- NAIDIONOVA, Irina
- Article
10
- Materials Science / Medziagotyra, 2014, v. 20, n. 2, p. 228, doi. 10.5755/j01.ms.20.2.6330
- AŠMONTAS, Steponas;
- KIPRIJANOVIČ, Oleg;
- LEVITAS, Boris;
- MATUZAS, Jonas;
- NAIDIONOVA, Irina
- Article
11
- Electrical Engineering in Japan, 2010, v. 173, n. 4, p. 1, doi. 10.1002/eej.21031
- Otani, Akihito;
- Tsuda, Yukio;
- Igawa, Koji;
- Shida, Katsunori
- Article
12
- International Journal of Microwave & Optical Technology, 2013, v. 8, n. 3, p. 112
- Chaudhary, Muhammad Akmal;
- Lees, Jonathan;
- Benedikt, Johannes;
- Tasker, Paul
- Article