Works matching DE "RELIABILITY of electronics"

Results: 60

Lyapunov stability analysis and FIL implementation for boundary‐based hybrid controller in boost converter.

Published in:

Advanced Control for Applications, 2024, v. 6, n. 3, p. 1, doi. 10.1002/adc2.216

By:

Patel, Hardik;
Shah, Ankit

Publication type:

Article

深空环境下电子器件可靠性研究进展.

Published in:

Systems Engineering & Electronics, 2025, v. 47, n. 4, p. 1184, doi. 10.12305/j.issn.1001-506X.2025,04,15

By:

关旗龙;
杭春进;
，李胜利;
唐晓玖;
于丹;
丁颖

Publication type:

Article

Coherence and reliability of a wearable inertial measurement unit for measuring postural sway.

Published in:

BMC Research Notes, 2019, v. 12, n. 1, p. N.PAG, doi. 10.1186/s13104-019-4238-8

By:

Ekvall Hansson, Eva;
Tornberg, Åsa

Publication type:

Article

Optimal Location of Sectionners and Distributed Generation Resources to Improve Reliability in Distribution Networks.

Published in:

Mathematical Modelling of Engineering Problems, 2021, v. 8, n. 2, p. 165, doi. 10.18280/mmep.080201

By:

Lorenzini, Giulio;
Kamarposhti, Mehrdad Ahmadi;
Ahmed Solyman, Ahmed Amin

Publication type:

Article

Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices.

Published in:

Computers (2073-431X), 2017, v. 6, n. 2, p. 16, doi. 10.3390/computers6020016

By:

Spinelli, Alessandro S.;
Compagnoni, Christian Monzio;
Lacaita, Andrea L.

Publication type:

Article

Simulation Of Reliability For Electronic Means With Regard To Temperature Fields.

Published in:

Reliability: Theory & Applications, 2016, v. 11, n. 4, p. 84

By:

Artyukhova, M.;
Polesskiy, S.;
Linetskiy, B.;
Ivanov, I.

Publication type:

Article

CURRENT APPROACHES TO ANALYSIS OF THE PROJECT RELIABILITY OF ELECTRONIC DEVICES OF CYCLIC USE.

Published in:

Reliability: Theory & Applications, 2015, v. 10, n. 3, p. 20

By:

Artyukhova, M.;
Polesskiy, S.;
Zhadnov, V.

Publication type:

Article

Boundary Layers Defect Diagnosis and Analysis of Through Silicon Via (TSV).

Published in:

International Journal of Performability Engineering, 2019, v. 15, n. 1, p. 97, doi. 10.23940/ijpe.19.01.p10.97106

By:

Yuan Chen;
Peng Zhang;
Kuiliang Xia;
Hongzhong Huang

Publication type:

Article

Ensuring a High Quality Digital Device through Design for Testability.

Published in:

Journal of Computing & Information Technology, 2012, v. 20, n. 4, p. 235, doi. 10.2498/cit.1001982

By:

Ngene, Christopher Umerah

Publication type:

Article

Interface energy-driven indium whisker growth on ceramic substrates.

Published in:

Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 12, p. 16881, doi. 10.1007/s10854-021-06250-5

By:

Li, Shuai;
Liu, Yushuang;
Zhang, Peigen;
Zhang, Yan;
Lu, Chengjie;
Pan, Long;
Ding, Jianxiang;
Sun, Zhengming

Publication type:

Article

Electrochemical Corrosion of SAC Alloys: A Review.

Published in:

Metals (2075-4701), 2020, v. 10, n. 10, p. 1276, doi. 10.3390/met10101276

By:

Gharaibeh, Ali;
Felhősi, Ilona;
Keresztes, Zsófia;
Harsányi, Gábor;
Illés, Balázs;
Medgyes, Bálint

Publication type:

Article

A PSO-based optimum consumer incentive policy for WEEE incorporating reliability of components.

Published in:

International Journal of Production Research, 2012, v. 50, n. 16, p. 4372, doi. 10.1080/00207543.2011.590538

By:

Agarwal, Gaurav;
Barari, Sikhar;
Tiwari, M.K.

Publication type:

Article

Dedicated channels.

Published in:: Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 1, p. 3, doi. 10.1049/el.2017.4501
Publication type:: Article

PHYSICS-OF-FAILURE AND COMPUTER-AIDED SIMULATION FUSION APPROACH WITH A SOFTWARE SYSTEM FOR ELECTRONICS RELIABILITY ANALYSIS.

Published in:

Maintenance & Reliability / Eksploatacja i Niezawodność, 2020, v. 22, n. 2, p. 340, doi. 10.17531/ein.2020.2.17.

By:

Bo SUN;
Yu LI;
Zili WANG;
Zhifeng LI;
Quan XIA;
Yi REN;
Qiang FENG;
Dezhen YANG;
Cheng QIAN

Publication type:

Article

ESD improvement in P-i-N diode through introducing a lighter and deeper anode junction.

Published in:

International Journal of Nanoelectronics & Materials, 2017, v. 10, n. 2, p. 159

By:

See, J. H.;
Md Arshad, M. K.;
Fathil, M. F. M.

Publication type:

Article

Analysis of reliability for fault tolerant design in NANO CMOS logic circuit.

Published in:

International Journal of Nanoelectronics & Materials, 2017, v. 10, n. 2, p. 123

By:

Manimekalai, D.;
Dixit, Pradipkumar

Publication type:

Article

Design Validation and Reliability Assurance of Electronic Systems Using the Next Generation RGT Models.

Published in:

Defence Science Journal, 2023, v. 73, n. 5, p. 594, doi. 10.14429/dsj.73.18798

By:

Basha, Mustaq;
Ware, Nilesh R.

Publication type:

Article

High‐Density Post‐Perovskite for Ultra‐Sensitive Hard X‐Ray Detection.

Published in:

Angewandte Chemie, 2025, v. 137, n. 19, p. 1, doi. 10.1002/ange.202425448

By:

Xia, Mengling;
Li, Yuzhu;
Li, Chenxing;
Xu, Yinsheng;
Niu, Guangda

Publication type:

Article

A low-overhead soft-hard fault-tolerant architecture, design and management scheme for reliable high-performance many-core 3D-NoC systems.

Published in:

Journal of Supercomputing, 2017, v. 73, n. 6, p. 2705, doi. 10.1007/s11227-016-1951-0

By:

Dang, Khanh;
Meyer, Michael;
Okuyama, Yuichi;
Abdallah, Abderazek

Publication type:

Article

Reliability Model for Electronic Devices under Time Varying Voltage.

Published in:

Quality & Reliability Engineering International, 2016, v. 32, n. 4, p. 1295, doi. 10.1002/qre.1867

By:

Méndez González, Luis Carlos;
Rodríguez Borbón, Manuel Iván;
Valles‐Rosales, Delia J.;
Del Valle, Arturo;
Rodriguez, Arnoldo

Publication type:

Article

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons.

Published in:

Eng (2673-4117), 2024, v. 5, n. 1, p. 319, doi. 10.3390/eng5010017

By:

Marques, Cleiton;
Wrobel, Frédéric;
Aguiar, Ygor;
Michez, Alain;
Boch, Jérôme;
Saigné, Frédéric;
García Alía, Rubén

Publication type:

Article

Comparative study between sliding mode control and the vector control of a brushless doubly fed reluctance generator based on wind energy conversion systems.

Published in:

Electrical Engineering & Electromechanics, 2022, n. 1, p. 51, doi. 10.20998/2074-272X.2022.1.07

By:

Oualah, O.;
Kerdoun, D.;
Boumassata, A.

Publication type:

Article

On-State Voltage Measurement Circuit for Condition Monitoring of MOSFETs in Resonant Converters.

Published in:

Electronics (2079-9292), 2024, v. 13, n. 19, p. 3902, doi. 10.3390/electronics13193902

By:

Ventimiglia, Marco;
Scuto, Alfio;
Sorrentino, Giuseppe;
Belverde, Gaetano;
Iannuzzo, Francesco;
Rizzo, Santi Agatino

Publication type:

Article

The Reliability of SAC305 Individual Solder Joints during Creep–Fatigue Conditions at Room Temperature.

Published in:

Crystals (2073-4352), 2022, v. 12, n. 9, p. N.PAG, doi. 10.3390/cryst12091306

By:

Abueed, Mohammed;
Al Athamneh, Raed;
Tanash, Moayad;
Hamasha, Sa'd

Publication type:

Article

Assessment of AF4 Parylene Cohesion/Adhesion on Si and SiO 2 Substrates by Means of Pull-Off Energy.

Published in:

Coatings (2079-6412), 2023, v. 13, n. 2, p. 237, doi. 10.3390/coatings13020237

By:

Sinani, Taulant;
Solonenko, Dmytro;
Miskovic, Goran

Publication type:

Article

Validity and reliability of the Newtest Powertimer 300-series® testing system.

Published in:

Journal of Sports Sciences, 2009, v. 27, n. 1, p. 77, doi. 10.1080/02640410802448723

By:

Enoksen, Eystein;
Tønnessen, Espen;
Shalfawi, Shaher

Publication type:

Article

Research on Small Square PCB Rogowski Coil Measuring Transient Current in the Power Electronics Devices.

Published in:

Sensors (14248220), 2019, v. 19, n. 19, p. 4176, doi. 10.3390/s19194176

By:

Jiao, Chaoqun;
Zhang, Juan;
Zhao, Zhibin;
Zhang, Zuoming;
Fan, Yuanliang

Publication type:

Article

TRAINING CALENDAR.

Published in:

2024

By:

Ring, Rosalinda M.

Publication type:

Calendar

NOTEWORTHY NEWS.

Published in:: Electronic Device Failure Analysis, 2022, v. 24, n. 1, p. 32
Publication type:: Article

TRAINING CALENDAR.

Published in:

Electronic Device Failure Analysis, 2021, v. 23, n. 4, p. 50

By:

Ring, Rosalinda M.

Publication type:

Article

DIRECTORY OF INDEPENDENT FA PROVIDERS.

Published in:

Electronic Device Failure Analysis, 2021, v. 23, n. 4, p. 47

By:

Ring, Rosalinda M.

Publication type:

Article

ESREF 2018.

Published in:: 2018
Publication type:: Proceeding

Industry Updates.

Published in:: Journal of Failure Analysis & Prevention, 2009, v. 9, n. 6, p. 527, doi. 10.1007/s11668-009-9302-6
Publication type:: Article

Reliability analysis of electronic equipment subjected to shock and vibration – A review.

Published in:

Shock & Vibration, 2009, v. 16, n. 1, p. 45, doi. 10.1155/2009/546053

By:

Amy, Robin Alastair;
Aglietti, Guglielmo S.;
Richardson, Guy

Publication type:

Article

A SHORT ANALYSIS OF THE OF THE SMARTPHONES RELIABILITY.

Published in:

Fiability & Durability / Fiabilitate si Durabilitate, 2017, n. 1, p. 126

By:

PARIS, Adrian Stere

Publication type:

Article

THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY.

Published in:

International Journal of Reliability, Quality & Safety Engineering, 2013, v. 20, n. 4, p. -1, doi. 10.1142/S0218539313500113

By:

KARY CHIEN, WEI-TING;
ATMAN, ZHAO YONG;
CHANG, VENSON;
WU, JEFF

Publication type:

Article

TWO-STAGE DESIGN OF EXPERIMENTS APPROACH FOR PREDICTION OF RELIABILITY OF OPTOCOUPLERS.

Published in:

International Journal of Reliability, Quality & Safety Engineering, 2012, v. 19, n. 2, p. -1, doi. 10.1142/S0218539312500076

By:

THADURI, ADITHYA;
VERMA, A. K.;
VINOD, GOPIKA;
RAJESH, M. G.;
KUMAR, UDAY

Publication type:

Article

High‐Temperature Hybridized Copper–Boron Nitride Materials from Additive Manufacturing.

Published in:

Advanced Engineering Materials, 2023, v. 25, n. 3, p. 1, doi. 10.1002/adem.202201056

By:

Sheng, Aaron;
Khuje, Saurabh;
Yu, Jian;
Zhuang, Cheng-Gang;
Ren, Shenqiang

Publication type:

Article

Threshold voltage instability of SiC MOSFETs under very‐high temperature and wide gate bias.

Published in:

IET Power Electronics (Wiley-Blackwell), 2024, v. 17, n. 15, p. 2393, doi. 10.1049/pel2.12786

By:

Chen, Cong;
Cai, Yumeng;
Sun, Peng;
Zhao, Zhibin

Publication type:

Article

БАГАТОРІВНЕВІ ГНУЧКІ СИСТЕМИ РОЗПОДІЛУ ЕЛЕКТРИЧНОЇ ЕНЕРГІЇ.

Published in:

Technical Electrodynamics / Tekhnichna Elektrodynamika, 2024, n. 5, p. 63, doi. 10.15407/techned2024.05.063

By:

Жаркін, А. Ф.;
Попов, В. А.;
Ярмолюк, О. С.;
Палачов, С. О.;
Наталич, В. О.

Publication type:

Article

Bending Setups for Reliability Investigation of Flexible Electronics.

Published in:

Micromachines, 2021, v. 12, n. 1, p. 78, doi. 10.3390/mi12010078

By:

Saleh, Rafat;
Barth, Maximilian;
Eberhardt, Wolfgang;
Zimmermann, André

Publication type:

Article

An Investigation of the Indentation Elastic Modulus for Metal Films on Flexible Substrates Considering the Substrate Effect.

Published in:

Materials (1996-1944), 2025, v. 18, n. 1, p. 154, doi. 10.3390/ma18010154

By:

Lee, Jong-Hyup;
Ham, Ju-Been;
Kim, Young-Cheon

Publication type:

Article

Influence of Solder Mask on Electrochemical Migration on Printed Circuit Boards.

Published in:

Materials (1996-1944), 2024, v. 17, n. 17, p. 4242, doi. 10.3390/ma17174242

By:

Klimtová, Markéta;
Veselý, Petr;
Králová, Iva;
Dušek, Karel

Publication type:

Article

Unlocking the Potential of Rare Earth‐Enriched Aluminum Oxo Clusters for Enhanced Dielectric Properties.

Published in:

Chinese Journal of Chemistry, 2025, v. 43, n. 9, p. 1042, doi. 10.1002/cjoc.202401181

By:

Ji, Ruiduan;
Liu, Xiaoyu;
Pei, Haizhou;
Fang, Wei‐Hui;
Huang, Weiguo;
Zhang, Jian

Publication type:

Article

Reliability of a phased-mission system with a storage component.

Published in:

Systems Science & Control Engineering, 2018, v. 6, n. 1, p. 279, doi. 10.1080/21642583.2018.1484306

By:

Qiu, Hui;
Yan, Xiangbin;
Ma, Xiaoyang;
Peng, Rui

Publication type:

Article

Analysis of the effect of location and failure rates of fault current limiters on substations reliability.

Published in:

International Transactions on Electrical Energy Systems, 2017, v. 27, n. 11, p. n/a, doi. 10.1002/etep.2379

By:

Modaresi, Seyed Mahmoud;
Lesani, Hamid

Publication type:

Article

Comparative Study for DC-DC Converter Output Bank's Reliability Evaluation Using Prediction Standards MIL-HDBK-217F vs. Telcordia SR-332.

Published in:

Energies (19961073), 2024, v. 17, n. 16, p. 3957, doi. 10.3390/en17163957

By:

Butnicu, Dan

Publication type:

Article

Alternative Solutions for Small Hydropower Plants.

Published in:

Energies (19961073), 2022, v. 15, n. 4, p. 1275, doi. 10.3390/en15041275

By:

Liszka, Damian;
Krzemianowski, Zbigniew;
Węgiel, Tomasz;
Borkowski, Dariusz;
Polniak, Andrzej;
Wawrzykowski, Konrad;
Cebula, Artur

Publication type:

Article

Overview of Control Algorithm Verification Methods in Power Electronics Systems.

Published in:

Energies (19961073), 2021, v. 14, n. 14, p. 4360, doi. 10.3390/en14144360

By:

Szcześniak, Paweł;
Grobelna, Iwona;
Novak, Mateja;
Nyman, Ulrik

Publication type:

Article

Research Progress on the Solder Joint Reliability of Electronics Using in Deep Space Exploration.

Published in:

Chinese Journal of Mechanical Engineering, 2023, v. 36, n. 1, p. 1, doi. 10.1186/s10033-023-00834-4

By:

Guan, Qilong;
Hang, Chunjin;
Li, Shengli;
Yu, Dan;
Ding, Ying;
Wang, Xiuli;
Tian, Yanhong

Publication type:

Article