Works matching DE "REFLOW soldering"
1
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15966, doi. 10.1007/s10854-018-9682-z
- Shang, Shengyan;
- Kunwar, Anil;
- Yao, Jinye;
- Wang, Yunpeng;
- Zhao, Ning;
- Huang, Mingliang;
- Ma, Haitao
- Article
2
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3917, doi. 10.1007/s10854-016-6005-0
- Li, Wenyin;
- Xiao, Dingbang;
- Wu, Xuezhong;
- Hou, Zhanqiang;
- Chen, Zhihua;
- Wang, Xinghua;
- Zhou, Jian
- Article
3
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 1, p. 1070, doi. 10.1007/s10854-016-5630-y
- Dušek, Karel;
- Rudajevová, Alexandra
- Article
4
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 9, p. 9941, doi. 10.1007/s10854-016-5063-7
- Chu, Kunmo;
- Park, Sunghoon;
- Lee, Changseung;
- Sohn, Yoonchul
- Article
5
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4898, doi. 10.1007/s10854-016-4373-0
- Tao, Yeqing;
- Ding, Dongyan;
- Li, Ting;
- Guo, Jason;
- Yu, Yunhong
- Article
6
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 1, p. 543, doi. 10.1007/s10854-015-3787-4
- Dušek, K.;
- Rudajevová, A.;
- Plaček, M.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 3196, doi. 10.1007/s10854-015-2817-6
- Tang, Y.;
- Li, G.;
- Luo, S.;
- Wang, K.;
- Zhou, B.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 3, p. 1649, doi. 10.1007/s10854-014-2589-4
- Lee, Sang-Min;
- Yoon, Jeong-Won;
- Jung, Seung-Boo
- Article
9
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 4012, doi. 10.1007/s10854-014-2123-8
- Fouzder, Tama;
- Li, Qingqian;
- Chan, Y.;
- Chan, Daniel
- Article
10
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 2052, doi. 10.1007/s10854-012-1055-4
- Goh, Yingxin;
- Lee, Seen;
- Haseeb, A.
- Article
11
- Journal of Electronic Materials, 2019, v. 48, n. 3, p. 1746, doi. 10.1007/s11664-018-06882-0
- Park, Hyun-Joon;
- Lee, Choong-Jae;
- Min, Kyung Deuk;
- Jung, Seung-Boo
- Article
12
- Journal of Electronic Materials, 2018, v. 47, n. 1, p. 133, doi. 10.1007/s11664-017-5883-0
- Park, Hwan-Pil;
- Seo, Gwancheol;
- Kim, Sungchul;
- Kim, Young-Ho
- Article
13
- Journal of Electronic Materials, 2016, v. 45, n. 7, p. 3744, doi. 10.1007/s11664-016-4504-7
- Article
14
- Journal of Electronic Materials, 2015, v. 44, n. 2, p. 744, doi. 10.1007/s11664-014-3528-0
- Key Chung, C.;
- Zhu, Z.;
- Kao, C.
- Article
15
- Materialwissenschaft und Werkstoffechnik, 2017, v. 48, n. 3/4, p. 235, doi. 10.1002/mawe.201600764
- Adawiyah, M.A. Rabiatul;
- Azlina, O. Saliza
- Article
16
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 18, p. 22771, doi. 10.1007/s10854-021-06711-x
- Shang, Min;
- Dong, Chong;
- Yao, Jinye;
- Wang, Chen;
- Ma, Haoran;
- Ma, Haitao;
- Wang, Yunpeng
- Article
17
- Defence Technology, 2019, v. 15, n. 6, p. 861, doi. 10.1016/j.dt.2019.05.003
- Min Guo;
- Xu-dong Zu;
- Xiao-jun Shen;
- Zheng-xiang Huang
- Article
18
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 12, p. 810, doi. 10.1049/el.2017.0357
- Article
19
- Materials (1996-1944), 2017, v. 10, n. 4, p. 327, doi. 10.3390/ma10040327
- Liang Zhang;
- Zhi-quan Liu;
- Fan Yang;
- Su-juan Zhong
- Article
20
- Advanced Engineering Materials, 2015, v. 17, n. 4, p. 512, doi. 10.1002/adem.201400226
- Pawełkiewicz, Magdalena;
- Danielewski, Marek;
- Janczak‐Rusch, Jolanta
- Article
21
- Micromachines, 2018, v. 9, n. 4, p. 172, doi. 10.3390/mi9040172
- Hyeon, Ik-Jae;
- Baek, Chang-Wook
- Article
22
- Electronics Letters (Wiley-Blackwell), 2021, v. 57, n. 24, p. 948, doi. 10.1049/ell2.12303
- Ando, Yuji;
- Makisako, Ryutaro;
- Takahashi, Hidemasa;
- Wakejima, Akio;
- Suda, Jun
- Article
23
- International Journal of Industrial Engineering, 2014, v. 21, n. 1, p. 19
- Tsung-Nan Tsai;
- Chiu-Wen Tsai
- Article
24
- Journal of Microelectronic & Electronic Packaging, 2022, v. 19, n. 1, p. 8, doi. 10.4071/imaps.1546248
- Tsun-Sheng Chou, Ricky;
- Lau, John H.;
- Chang-Fu Chen, Gary;
- Yu-Cheng Huang, Jones;
- Channing Cheng-Lin Yang;
- Hsing-Ning Liu;
- Tzyy-Jang Tseng
- Article
25
- 2016
- Marques-Costa, Robson;
- da Silva-Vieira, Antonio;
- Pereira-Lopes, Raimundo Valdan;
- Cabral-Leite, Jandecy;
- Tetsuo-Fujiyama, Roberto
- Case Study
26
- Research on Chemical Intermediates, 2014, v. 40, n. 7, p. 2463, doi. 10.1007/s11164-014-1655-0
- Chee, Sang-Soo;
- Lee, Jong-Hyun
- Article
27
- Micro & Nano Letters (Wiley-Blackwell), 2016, v. 11, n. 12, p. 840, doi. 10.1049/mnl.2016.0361
- Hyun Jin Kim;
- Seok Pil Jang;
- Jong-Hyun Lee;
- Yong-Jun Park
- Article
28
- Metals (2075-4701), 2016, v. 6, n. 5, p. 109, doi. 10.3390/met6050109
- Yunxia Chen;
- Xulei Wu;
- Xiaojing Wang;
- Hai Huang
- Article