On the fine structure of spectra of the inelastic-electron-scattering cross section and the Si surface parameter.
- Published in:
- Semiconductors, 2015, v. 49, n. 4, p. 423, doi. 10.1134/S106378261504017X
- By:
- Publication type:
- Article
Works matching DE "REFLECTION electron energy loss spectroscopy"
Results: 6
1
2
Extracting the dielectric function from high-energy REELS measurements.
- Published in:
- Surface & Interface Analysis: SIA, 2017, v. 49, n. 9, p. 809, doi. 10.1002/sia.6227
- By:
- Publication type:
- Article
3
REELS study of a LiNi<sub>1/3</sub>Mn<sub>1/3</sub>Co<sub>1/3</sub>O<sub>2</sub> positive electrode.
- Published in:
- Surface & Interface Analysis: SIA, 2016, v. 48, n. 11, p. 1144, doi. 10.1002/sia.6102
- By:
- Publication type:
- Article
4
Band alignment and defect states in amorphous GaInZnO thin films grown on SiO<sub>2</sub>/Si substrates.
- Published in:
- Surface & Interface Analysis: SIA, 2016, v. 48, n. 10, p. 1062, doi. 10.1002/sia.6024
- By:
- Publication type:
- Article
5
Irradiation of potassium-silicate glass surfaces: XPS and REELS study.
- Published in:
- Surface & Interface Analysis: SIA, 2016, v. 48, n. 7, p. 543, doi. 10.1002/sia.5908
- By:
- Publication type:
- Article
6
Surface, interface and electronic properties of F8:F8BT polymeric thin films used for organic light‐emitting diode applications.
- Published in:
- Polymer International, 2018, v. 67, n. 6, p. 691, doi. 10.1002/pi.5552
- By:
- Publication type:
- Article