Works matching DE "RECOMBINATION in semiconductors"
1
- Revista Cubana de Física, 2011, v. 28, n. 1E, p. 1E61
- Barrios-Herrera, Lizandra;
- Quintas-Sánchez, Ernesto;
- Martin-Gondre, L.;
- Larrégaray, P.;
- Crespos, C.;
- Rubayo-Soneira, J.;
- Rayez, J-C.
- Article
2
- Revista Cubana de Física, 2009, v. 26, n. 1, p. 83
- Sánchez, M.;
- Rojas, N. Suárez;
- Martin, J. A.;
- Mon, Elis
- Article
3
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 4378, doi. 10.1007/s10854-016-4307-x
- Wang, Shaomeng;
- Li, Qiang;
- Tao, Ke;
- Jia, Rui;
- Jiang, Shuai;
- Wang, Deliang;
- Dong, Hongwei
- Article
4
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 400, doi. 10.1007/s10854-008-9642-0
- Kouissa, S.;
- Aida, M. S.;
- Djemel, A.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 272, doi. 10.1007/s10854-008-9574-8
- Massé, N. F.;
- Marko, I. P.;
- Adams, A. R.;
- Sweeney, S. J.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 316, doi. 10.1007/s10854-008-9672-7
- Sabooni, Mahmood;
- Esmaeili, Morteza;
- Haratizadeh, Hamid;
- Monemar, Bo;
- Amano, Hiroshi
- Article
7
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 32, doi. 10.1007/s10854-007-9507-y
- Weiyan Wang;
- Deren Yang;
- Xuegong Yu;
- Duanlin Que
- Article
8
- Continuum Mechanics & Thermodynamics, 2016, v. 28, n. 6, p. 1671, doi. 10.1007/s00161-016-0500-7
- Article
9
- Inorganic Materials, 2015, v. 51, n. 15, p. 1447, doi. 10.1134/S0020168515150029
- Anfimov, I.;
- Kobeleva, S.;
- Shchemerov, I.
- Article
10
- Inorganic Materials, 2007, v. 43, n. 3, p. 233, doi. 10.1134/S0020168507030041
- Abdinov, A.;
- Jafarov, M.;
- Mamedova, S.
- Article
11
- European Physical Journal D (EPJ D), 2011, v. 63, n. 2, p. 289, doi. 10.1140/epjd/e2011-10513-x
- Imamura, M.;
- Nakamura, J.;
- Fujimasa, S.;
- Yasuda, H.;
- Kobayashi, H.;
- Negishi, Y.
- Article
12
- Physica Status Solidi - Rapid Research Letters, 2014, v. 8, n. 10, p. 827, doi. 10.1002/pssr.201409295
- Ratcliff, Thomas;
- Fong, Kean Chern;
- Shalav, Avi;
- Elliman, Robert;
- Blakers, Andrew
- Article
13
- Neural Computing & Applications, 2009, v. 18, n. 4, p. 369, doi. 10.1007/s00521-008-0187-1
- Wiklendt, Lukasz;
- Chalup, Stephan;
- Middleton, Rick
- Article
14
- Optics & Spectroscopy, 2008, v. 104, n. 3, p. 351, doi. 10.1134/S0030400X08030077
- Khadzhi, P. I.;
- Vasil'ev, V. V.
- Article
15
- High Energy Chemistry, 2009, v. 43, n. 7, p. 599, doi. 10.1134/S0018143909070170
- Maiorova, T. L.;
- Kluev, V. G.;
- Fam Thi Khai, M.;
- Bykovskaya, V. S.
- Article
16
- Scientific Reports, 2021, v. 11, n. 1, p. 1, doi. 10.1038/s41598-021-92866-w
- Davenport, Kevin;
- Trinh, C. T.;
- Hayward, Mark;
- Lips, Klaus;
- Rogachev, Andrey
- Article
17
- Applied Physics A: Materials Science & Processing, 2000, v. 71, n. 3, p. 305, doi. 10.1007/s003390000528
- Castaldini, A.;
- Cavalcoli, D.;
- Cavallini, A.
- Article
18
- Applied Physics A: Materials Science & Processing, 1998, v. 66, n. 7, p. S415, doi. 10.1007/s003390051174
- Kang, C.J.;
- Kim, C.K.;
- Kuk, Y.;
- Williams, C.C.
- Article
19
- Contributions to Plasma Physics, 2016, v. 56, n. 6-8, p. 698, doi. 10.1002/ctpp.201611004
- Article
20
- Contributions to Plasma Physics, 2016, v. 56, n. 6-8, p. 717, doi. 10.1002/ctpp.201610053
- Nishikata, H.;
- Hayashi, Y.;
- Ohno, N.;
- Kajita, S.;
- Kuwabara, T.
- Article
21
- Semiconductors, 2018, v. 52, n. 3, p. 273, doi. 10.1134/S1063782618030065
- Bannaya, V. F.;
- Nikitina, E. V.
- Article
22
- Semiconductors, 2014, v. 48, n. 3, p. 302, doi. 10.1134/S1063782614030130
- Article
23
- Semiconductors, 2013, v. 47, n. 11, p. 1442, doi. 10.1134/S1063782613110122
- Article
24
- Semiconductors, 2012, v. 46, n. 1, p. 29, doi. 10.1134/S1063782612010162
- Article
25
- Semiconductors, 2011, v. 45, n. 11, p. 1494, doi. 10.1134/S1063782611110261
- Sokolova, Z.;
- Tarasov, I.;
- Asryan, L.
- Article
26
- Semiconductors, 2011, v. 45, n. 11, p. 1501, doi. 10.1134/S1063782611110200
- Petuhov, A.;
- Il'inskaya, N.;
- Kizhaev, S.;
- Stoyanov, N.;
- Yakovlev, Yu.
- Article
27
- Semiconductors, 2011, v. 45, n. 6, p. 805, doi. 10.1134/S1063782611060091
- Article
28
- Semiconductors, 2011, v. 45, n. 6, p. 798, doi. 10.1134/S1063782611060170
- Article
29
- Semiconductors, 2011, v. 45, n. 5, p. 567, doi. 10.1134/S1063782611050204
- Maiorova, T.;
- Kluyev, V.;
- Samofalova, T.
- Article
30
- Semiconductors, 2011, v. 45, n. 1, p. 52, doi. 10.1134/S1063782611010209
- Tagiev, B.;
- Tagiev, O.;
- Asadullayeva, S.
- Article
31
- Semiconductors, 2011, v. 45, n. 1, p. 61, doi. 10.1134/S1063782611010246
- Zinovchuk, A.;
- Tkachenko, A.
- Article
32
- Semiconductors, 2010, v. 44, n. 13, p. 1723, doi. 10.1134/S106378261013021X
- Article
33
- Semiconductors, 2010, v. 44, n. 7, p. 912, doi. 10.1134/S1063782610070146
- Korolev, N. A.;
- Nikitenko, V. R.;
- Tyutnev, A. P.
- Article
34
- Semiconductors, 2009, v. 43, n. 5, p. 602, doi. 10.1134/S106378260905011X
- Makhnij, V. P.;
- Bojko, Yu. N.;
- Skrypnyk, N. V.
- Article
35
- Semiconductors, 2009, v. 43, n. 3, p. 292, doi. 10.1134/S1063782609030063
- Maiorova, T. L.;
- Klyuev, V. G.
- Article
36
- Semiconductors, 2008, v. 42, n. 6, p. 642, doi. 10.1134/S106378260806002X
- Article
37
- Semiconductors, 2008, v. 42, n. 6, p. 737, doi. 10.1134/S1063782608060171
- Vorob'ev, L. E.;
- Zerova, V. L.;
- Borshchev, K. S.;
- Sokolova, Z. N.;
- Tarasov, I. S.;
- Belenky, G.
- Article
38
- Semiconductors, 2008, v. 42, n. 6, p. 675, doi. 10.1134/S1063782608060080
- Gurin, N. T.;
- Sabitov, O. Yu.
- Article
39
- Semiconductors, 2007, v. 41, n. 6, p. 673, doi. 10.1134/S1063782607060115
- Sachenko, A.;
- Sokolovsky, I.
- Article
40
- Semiconductors, 2007, v. 41, n. 2, p. 130, doi. 10.1134/S1063782607020029
- Ikusov, D. G.;
- Sizov, F. F.;
- Staryi, S. V.;
- Teterkin, V. V.
- Article
41
- Semiconductors, 2006, v. 40, n. 5, p. 570, doi. 10.1134/S1063782606050101
- Grushko, N. S.;
- Loginova, E. A.;
- Potanakhina, L. N.
- Article
42
- Semiconductors, 2006, v. 40, n. 5, p. 598, doi. 10.1134/S1063782606050150
- Bulakh, B. M.;
- Korsunska, N.;
- Khomenkova, L. Yu.;
- Staraya, T. R.;
- Sheĭnkman, M. K.
- Article
43
- Semiconductors, 2006, v. 40, n. 2, p. 234, doi. 10.1134/S1063782606020229
- Berashevich, J. A.;
- Lazarouk, S. K.;
- Borisenko, V. E.
- Article
44
- Semiconductors, 2005, v. 39, n. 6, p. 658, doi. 10.1134/1.1944855
- Pavlyshenko, B. M.;
- Shuvar, R. Ya.
- Article
45
- Semiconductors, 2004, v. 38, n. 8, p. 946, doi. 10.1134/1.1787117
- Martis, A.;
- Cuadra, L.;
- Lopez, N.;
- Luque, A.
- Article
46
- Semiconductors, 2004, v. 38, n. 6, p. 639, doi. 10.1134/1.1766363
- Article
47
- Semiconductors, 2004, v. 38, n. 1, p. 99, doi. 10.1134/1.1641140
- Sachenko, A.V.;
- Kryuchenko, Yu.V.
- Article
48
- Semiconductors, 2003, v. 37, n. 12, p. 1430, doi. 10.1134/1.1634668
- Article
49
- Semiconductors, 2003, v. 37, n. 1, p. 38, doi. 10.1134/1.1538536
- Kovalenko, V.F.;
- Shutov, S.V.
- Article
50
- Semiconductors, 2003, v. 37, n. 1, p. 115
- Bulyarski&icaron;, S.V.;
- Ionychev, V.K.;
- Kuz'min, V.V.
- Article