Works about RAPID thermal processing


Results: 504
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    Degradation of SiC-MESFETs by irradiation.

    Published in:
    Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 175, doi. 10.1007/s10854-007-9330-5
    By:
    • Ohyama, H.;
    • Takakura, K.;
    • Uemura, K.;
    • Shigaki, K.;
    • Kudou, T.;
    • Matsumoto, T.;
    • Arai, M.;
    • Kuboyama, S.;
    • Kamezawa, C.;
    • Simoen, E.;
    • Claeys, C.
    Publication type:
    Article
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    Growth and low-concentration gas monitoring with highly reproducible ultra-thin (<80 nm) SnO<sub>2</sub> multiple nano structured layers.

    Published in:
    International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2025, v. 39, n. 14, p. 1, doi. 10.1142/S0217979225501164
    By:
    • Sharma, Mahesh C.;
    • Yadav, Rakesh;
    • Sharma, Shubham K.;
    • Tanwar, Abhay S.;
    • Lamor, Saitan S.;
    • Bhargava, Nidhi;
    • Sharma, Krishna S.;
    • Bafna, Minal;
    • Kutwade, Vishnu V.;
    • Sharma, Ramphal
    Publication type:
    Article
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    P-type Gallium Nitride creation through O+ implantation.

    Published in:
    International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2025, v. 39, n. 6, p. 1, doi. 10.1142/S021797922540017X
    By:
    • Wei, Sufen;
    • Xu, Hao;
    • Yang, Cheng-Fu
    Publication type:
    Article
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