Works matching DE "RAPID thermal processing"
1
- Energies (19961073), 2025, v. 18, n. 11, p. 2704, doi. 10.3390/en18112704
- Oh, Seongha;
- Jun, Young-Kil;
- Kim, Nam-Hoon
- Article
2
- Chemistry - A European Journal, 2025, v. 31, n. 32, p. 1, doi. 10.1002/chem.202500598
- Liu, Wenjiao;
- Zhang, Yipeng;
- Wang, Zhichen;
- Dai, Xianyin;
- Li, Xinran;
- Li, Mengtong;
- Nian, Le;
- Wang, Renliang;
- Ge, Yanqing
- Article
3
- Metallurgical & Materials Transactions. Part A, 2025, v. 56, n. 7, p. 2557, doi. 10.1007/s11661-025-07796-3
- Jaishankar, Sathyanarayan Sairam;
- Yao, Donggang;
- Zhou, Jack G.
- Article
4
- Inorganics, 2025, v. 13, n. 5, p. 163, doi. 10.3390/inorganics13050163
- Wang, Sake;
- Sun, Minglei;
- Hung, Nguyen Tuan
- Article
5
- Nanomaterials (2079-4991), 2025, v. 15, n. 10, p. 736, doi. 10.3390/nano15100736
- Huang, Gang;
- Wu, Junhong;
- Li, Haiou;
- Liu, Honggang
- Article
6
- Solid State Technology, 2001, v. 44, n. 9, p. 77
- Article
7
- Solid State Technology, 2000, v. 43, n. 10, p. 155
- Article
8
- Solid State Technology, 2000, v. 43, n. 7, p. 223
- Yoo, Woo Sik;
- Yamazaki, Taro;
- Enjoji, Keiichi
- Article
9
- Solid State Technology, 2000, v. 43, n. 7, p. 233
- Kuppurao, Satheesh;
- Joo, Hyun Sung;
- Miner, Gary
- Article
10
- Solid State Technology, 2000, v. 43, n. 2, p. 69
- Article
11
- Solid State Technology, 1998, v. 41, n. 12, p. 43
- Foad, Majeed A.;
- Jennings, Dean
- Article
12
- Solid State Technology, 1998, v. 41, n. 10, p. 91
- Sharangpani, Rahul;
- Thakur, R. P. S.
- Article
13
- Solid State Technology, 1998, v. 41, n. 7, p. 92
- Article
14
- Solid State Technology, 1998, v. 41, n. 6, p. 121
- Munzinger, P.;
- Lerch, W.;
- Mader, R.;
- Kobayashi, N.
- Article
15
- Journal of Electronic Materials, 2025, v. 54, n. 5, p. 3494, doi. 10.1007/s11664-024-11687-5
- Insawang, Mekhala;
- Vora-ud, Athorn;
- Seetawan, Tosawat;
- Muntini, Melania Suweni;
- Phan, Thang Bach;
- Kumar, Manish
- Article
16
- Journal of Electronic Materials, 2025, v. 54, n. 4, p. 2693, doi. 10.1007/s11664-024-11695-5
- Muntini, Melania Suweni;
- Putri, Nabiha Rassya Islamy Satrio;
- Insawang, Mekala;
- Boonkirdram, Sarawoot;
- Horprathum, Mati;
- Seetawan, Tosawat;
- Vora-ud, Athorn
- Article
17
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 747, doi. 10.1007/s11664-024-11550-7
- Maiti, Partha Pratim;
- Mukherjee, C.;
- Bag, A.;
- Mallik, S.;
- Maiti, C. K.
- Article
18
- Journal of Electronic Materials, 2024, v. 53, n. 9, p. 5374, doi. 10.1007/s11664-024-11290-8
- Trinidad-Urbina, R. E.;
- Castanedo-Pérez, R.;
- Torres-Delgado, G.;
- Sánchez-Martínez, A.;
- Ramírez-Bon, R.
- Article
19
- Journal of Electronic Materials, 2024, v. 53, n. 8, p. 4869, doi. 10.1007/s11664-024-11220-8
- Hu, Shao-Hwa;
- Lin, Yen-Sheng;
- Su, Shui-Hsiang;
- Dai, Hang;
- He, Jing-Shi
- Article
20
- Surface Engineering, 2020, v. 36, n. 5, p. 456, doi. 10.1080/02670844.2018.1564199
- Meziani, Samir;
- Moussi, Aberrahmane;
- Mahiou, Linda;
- Antoni, Frederic;
- Outemzabet, Ratiba
- Article
21
- Chemistry - A European Journal, 2023, v. 29, n. 38, p. 1, doi. 10.1002/chem.202300371
- Zhang, Peng;
- Zhang, Shenjie;
- Yang, Jing;
- Li, Peng;
- Li, Huanrong
- Article
22
- Angewandte Chemie, 2014, v. 126, n. 17, p. 4554, doi. 10.1002/ange.201310714
- Qian, Qiuping;
- Wang, Jian;
- Yan, Feng;
- Wang, Yapei
- Article
23
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 17, p. 15980, doi. 10.1007/s10854-019-01968-9
- Pallavolu, Mohan Reddy;
- Minnam Reddy, Vasudeva Reddy;
- Guddeti, Phaneendra Reddy;
- Park, Chinho
- Article
24
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12612, doi. 10.1007/s10854-019-01622-4
- Bayazıt, Tuğba;
- Olgar, Mehmet Ali;
- Küçükömeroğlu, Tayfur;
- Bacaksız, Emin;
- Tomakin, Murat
- Article
25
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 7, p. 5663, doi. 10.1007/s10854-016-6237-z
- Chen, Xiaobo;
- Yang, Wen;
- Yang, Peizhi;
- Zhao, Fei;
- Tang, Yu;
- Hao, Jiabo
- Article
26
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1971, doi. 10.1007/s10854-016-5751-3
- Guo, Kaixin;
- Mou, Qingfeng;
- He, Tengpeng;
- Kong, Handong;
- Zhang, Rongfen
- Article
27
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 12, p. 9759, doi. 10.1007/s10854-015-3646-3
- Saha, Shantanu;
- Pandey, Sushil;
- Nagar, Saurabh;
- Chakrabarti, Subhananda
- Article
28
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 7666, doi. 10.1007/s10854-015-3407-3
- Dong, Peng;
- Lu, Yunhao;
- Zhao, Jianjiang;
- Yu, Xuegong;
- Ma, Xiangyang;
- Yang, Deren
- Article
29
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 10, p. 7860, doi. 10.1007/s10854-015-3436-y
- Ghosh, S.;
- Das, K.;
- Tripathy, N.;
- Bose, G.;
- Kim, D.;
- Lee, T.;
- Myoung, J.;
- Kar, J.
- Article
30
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 9, p. 6920, doi. 10.1007/s10854-015-3310-y
- Li, Na;
- Hu, Ming;
- Liang, Ji-Ran;
- Liu, Xing;
- Wu, Mai-Jun
- Article
31
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 1, p. 408, doi. 10.1007/s10854-013-1602-7
- Huang, Bohr-Ran;
- Hung, Shang-Chao;
- Lin, Chia-Yi;
- Chen, Yu-Jyun
- Article
32
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 1, p. 343, doi. 10.1007/s10854-013-1592-5
- Li, Jia;
- Yoshitake, Michiko;
- Song, Weijie
- Article
33
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 10, p. 4075, doi. 10.1007/s10854-013-1363-3
- Xu, Qiang;
- La, Rui;
- Cheng, Qijin;
- Zhang, Zifeng;
- Hong, Rongdun;
- Chen, Xiaping;
- Wu, Zhengyun
- Article
34
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 10, p. 3844, doi. 10.1007/s10854-013-1327-7
- Zhu, Ke;
- Yang, Ye;
- Wei, Tiefeng;
- Tan, Ruiqin;
- Cui, Ping;
- Song, Weijie;
- Choy, Kwang-Leong
- Article
35
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 6, p. 2122, doi. 10.1007/s10854-013-1068-7
- Wang, Weiyan;
- Huang, Jinhua;
- Xu, Wei;
- Huang, Junjun;
- Zeng, Yuheng;
- Song, Weijie
- Article
36
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 2, p. 475, doi. 10.1007/s10854-012-0817-3
- Xie, Hai-Bing;
- Liu, Wei-Feng;
- Li, Xin-Yi;
- Yan, Fei;
- Jiang, Guo-Shun;
- Zhu, Chang-Fei
- Article
37
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 7, p. 1279, doi. 10.1007/s10854-012-0786-6
- Zhang, Lei;
- Shen, Honglie;
- You, Jiayi;
- Jiang, Feng;
- Wu, Tianru;
- Tang, Zhengxia
- Article
38
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 4, p. 964, doi. 10.1007/s10854-011-0528-1
- Li, Zhao-Hui;
- Cho, Eou-Sik;
- Kwon, Sang;
- Dagenais, Mario
- Article
39
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 4, p. 430, doi. 10.1007/s10854-010-0155-2
- Wen-Ching Shih;
- Tzyy-Long Wang;
- Ming-Han Chiang;
- Mu-Shiang Wu
- Article
40
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 3, p. 286, doi. 10.1007/s10854-010-0129-4
- Jyothi, I.;
- Rajagopal Reddy, V.;
- Choi, Chel-Jong
- Article
41
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 589, doi. 10.1007/s10854-009-9962-8
- Hua Wang;
- Mu-hui Xu;
- Ji-wen Xu;
- Ming-fang Ren;
- Ling Yang
- Article
42
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 3, p. 285, doi. 10.1007/s10854-009-9906-3
- Janardhanam, V.;
- Kumar, A. Ashok;
- Reddy, V. Rajagopal;
- Reddy, P. Narasimha
- Article
43
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 2, p. 145, doi. 10.1007/s10854-009-9883-6
- Hua Wang;
- Muhui Xu;
- Jiwen Xu;
- Ling Yang;
- Shangju Zhou
- Article
44
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 11, p. 1129, doi. 10.1007/s10854-008-9838-3
- Devika, M.;
- Reddy, N. Koteeswara;
- Reddy, S. Venkatramana;
- Ramesh, K.;
- Gunasekhar, K. R.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 167, doi. 10.1007/s10854-007-9329-y
- Takakura, K.;
- Kudou, T.;
- Hayama, K.;
- Shigaki, K.;
- Ohyama, H.;
- Kayamoto, K.;
- Shibuya, M.
- Article
46
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 2, p. 175, doi. 10.1007/s10854-007-9330-5
- Ohyama, H.;
- Takakura, K.;
- Uemura, K.;
- Shigaki, K.;
- Kudou, T.;
- Matsumoto, T.;
- Arai, M.;
- Kuboyama, S.;
- Kamezawa, C.;
- Simoen, E.;
- Claeys, C.
- Article
47
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 159, doi. 10.1007/s10854-007-9186-8
- Sobajima, Y.;
- Kato, S.;
- Matsuura, T.;
- Toyama, T.;
- Okamoto, H.
- Article
48
- Journal of Solid State Electrochemistry, 2021, v. 25, n. 2, p. 591, doi. 10.1007/s10008-020-04832-7
- Contreras-Ruiz, M. A.;
- Mendez-Blas, A.;
- Calixto, Ma. Estela
- Article
49
- Journal of Solid State Electrochemistry, 2012, v. 16, n. 12, p. 3855, doi. 10.1007/s10008-012-1822-4
- Wu, Xian;
- Liu, Jin;
- Chen, Shang;
- Mai, Fa;
- Li, Chang
- Article
50
- Inorganic Materials, 2014, v. 50, n. 4, p. 365, doi. 10.1134/S0020168514040190
- Zhuravleva, V.;
- Pershukevich, P.;
- Markevich, M.;
- Stel'makh, V.;
- Chaplanov, A.
- Article