Works matching DE "RADIOFREQUENCY sputtering"
1
- Advanced Engineering Materials, 2025, v. 27, n. 12, p. 1, doi. 10.1002/adem.202402801
- Balada, Eduard Llorens;
- Shkondin, Evgeniy;
- Canulescu, Stela;
- Stamate, Eugen
- Article
2
- Surface Review & Letters, 2025, v. 32, n. 8, p. 1, doi. 10.1142/S0218625X25400098
- HUANG, EN-MIN;
- CHANG, SHENG-PO;
- LIU, TZU-YUAN;
- TSAI, YUN-CHIEH;
- CHANG, SHOOU-JINN;
- CHEN, JONE-FANG
- Article
3
- Nanomaterials (2079-4991), 2025, v. 15, n. 11, p. 780, doi. 10.3390/nano15110780
- Lee, Yih-Shing;
- Chang, Chih-Hsiang;
- Le, Bing-Shin;
- Nguyen, Vo-Truong Thao;
- Tien, Tsung-Cheng;
- Lin, Horng-Chih
- Article
4
- Integrated Ferroelectrics, 2025, v. 241, n. 1-3, p. 237, doi. 10.1080/10584587.2025.2482427
- Singh, Gurvinder;
- Kumar, Arun;
- Bura, Manu;
- Malik, Nisha;
- Gupta, Divya;
- Aggarwal, Sanjeev
- Article
5
- Integrated Ferroelectrics, 2025, v. 241, n. 1-3, p. 189, doi. 10.1080/10584587.2025.2482423
- Chhoker, Kalpana;
- Gupta, Divya;
- Malik, Nisha;
- Kumar, Arun;
- Kumar, Sanjeev;
- Aggarwal, Sanjeev
- Article
6
- Integrated Ferroelectrics, 2025, v. 241, n. 1-3, p. 60, doi. 10.1080/10584587.2025.2482411
- Sharma, Babita;
- Gupta, Reema;
- Naorem, Bilasini Devi;
- Tomar, Monika
- Article
7
- Journal of Radioanalytical & Nuclear Chemistry, 2025, v. 334, n. 5, p. 3409, doi. 10.1007/s10967-025-10060-y
- Ebrahimi, M.;
- Rafi-Kheiri, Hossein;
- Seyedhabashi, M.
- Article
8
- Journal of Materials Science, 2025, v. 60, n. 21, p. 8569, doi. 10.1007/s10853-025-10929-z
- Karthikeyan, R.;
- Cherian, Christie Thomas;
- Fernandes, Rohan Pascal
- Article
9
- Materials (1996-1944), 2025, v. 18, n. 10, p. 2395, doi. 10.3390/ma18102395
- Carrasco-Hernández, Anel Rocío;
- Reyes-Rojas, Armando;
- Rojas-George, Gabriel;
- la Cruz, Antonio Ramírez-De;
- Esparza-Ponce, Hilda Esperanza
- Article
10
- Journal of Electronic Materials, 2025, v. 54, n. 5, p. 4083, doi. 10.1007/s11664-025-11851-5
- Deng, Weijie;
- Liu, Hongyu;
- Luo, Jing;
- Zhang, Rengang
- Article
11
- Journal of Electronic Materials, 2024, v. 53, n. 8, p. 4869, doi. 10.1007/s11664-024-11220-8
- Hu, Shao-Hwa;
- Lin, Yen-Sheng;
- Su, Shui-Hsiang;
- Dai, Hang;
- He, Jing-Shi
- Article
12
- Journal of Electronic Materials, 2024, v. 53, n. 5, p. 2410, doi. 10.1007/s11664-024-10983-4
- Hu, Shao-Hwa;
- Lin, Yen-Sheng;
- Su, Shui-Hsiang;
- He, Jing-Shi;
- Ai, Ya-Zhao
- Article
13
- Surface Engineering, 2022, v. 38, n. 4, p. 411, doi. 10.1080/02670844.2022.2096826
- Ye, Wei;
- Du, Pengfei;
- Xiao, Sheng;
- Li, Mengfei
- Article
14
- Surface Engineering, 2020, v. 36, n. 4, p. 438, doi. 10.1080/02670844.2019.1672956
- Zhao, Zilong;
- Miao, Qiang;
- Liang, Wenping;
- Xia, Jinjiao;
- Lin, Hao;
- Qi, Yan;
- Zuo, Shiwei
- Article
15
- Surface Engineering, 2020, v. 36, n. 1, p. 49, doi. 10.1080/02670844.2018.1555214
- Article
16
- Surface Engineering, 2019, v. 35, n. 11, p. 982, doi. 10.1080/02670844.2019.1596578
- Sarkar, Satyajit;
- Pradhan, Siddhartha Kumar
- Article
17
- Surface Engineering, 2017, v. 33, n. 4, p. 270, doi. 10.1080/02670844.2016.1235006
- Yang, J.;
- Huang, J.;
- Lu, Y. X.;
- Ji, H. H.;
- Zhang, L.;
- Tang, K.;
- Cao, M.;
- Hu, Y.;
- Wang, L. J.
- Article
18
- Surface Engineering, 2015, v. 31, n. 10, p. 770, doi. 10.1179/1743294415Y.0000000024
- Xie, Y. P.;
- Wang, X. D.;
- Lang, C.
- Article
19
- Surface Engineering, 2015, v. 31, n. 3, p. 173, doi. 10.1179/1743294414Y.0000000314
- Wu, C.-H.;
- Hung, F.-Y.;
- Lui, T.-S.;
- Chen, L.-H.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 19, p. 18287, doi. 10.1007/s10854-019-02183-2
- Yu, Shihui;
- Zhang, Chunmei;
- Yang, Pan;
- Wu, Muying;
- Sun, Yongtao;
- Li, Lingxia
- Article
21
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 17, p. 16502, doi. 10.1007/s10854-019-02026-0
- Deng, Xiaoling;
- Zeng, Zhixin;
- Xu, Ruicheng;
- Qin, Xiaofeng;
- Li, Xinxin;
- Wang, Yongqiang;
- Gao, Rongli;
- Wang, Zhenhua;
- Chen, Gang;
- Cai, Wei;
- Fu, Chunlin
- Article
22
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 16, p. 15224, doi. 10.1007/s10854-019-01895-9
- Jha, Rajesh Kumar;
- Singh, Prashant;
- Goswami, Manish;
- Singh, B. R.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13280, doi. 10.1007/s10854-019-01691-5
- Singh, Manisha R.;
- Sahni, Mohit;
- Singh, Munendra;
- Bhattacharya, Bhaskar;
- Kumar, Naresh
- Article
24
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13271, doi. 10.1007/s10854-019-01690-6
- Li, Yajie;
- Wu, Muying;
- Sun, Yongtao;
- Yu, Shihui
- Article
25
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13005, doi. 10.1007/s10854-019-01662-w
- Yang, Shumin;
- Zhong, Jingming;
- Sun, Benshuang;
- Zeng, Xueyun;
- Luo, Wen;
- Zhao, Xu;
- Shu, Yongchun;
- Chen, Jie;
- He, Jilin
- Article
26
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 13, p. 12170, doi. 10.1007/s10854-019-01575-8
- Kaya, Senol;
- Yilmaz, Ercan
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15726, doi. 10.1007/s10854-018-9200-3
- Juárez-Amador, L. I.;
- Galván-Arellano, M.;
- Andraca-Adame, J. A.;
- Romero-Paredes, G.;
- Kennedy-Magos, A.;
- Peña-Sierra, R.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15682, doi. 10.1007/s10854-018-9166-1
- Regmi, G.;
- Rohini, M.;
- Reyes-Figueroa, P.;
- Maldonado, Arturo;
- de la Luz Olvera, María;
- Velumani, S.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13297, doi. 10.1007/s10854-017-7165-2
- Zhao, Xunna;
- Li, Jia;
- Yang, Ye;
- Zhu, Chaoting;
- Huang, Jinhua;
- Duan, Juanmei;
- Lu, Yuehui;
- Lan, Pinjun;
- Song, Weijie
- Article
30
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13763, doi. 10.1007/s10854-017-7221-y
- Zeng, Yang;
- Liang, Guangxing;
- Fan, Ping;
- Xie, Yizhu;
- Fan, Bo;
- Hu, Juguang;
- Zheng, Zhuanghao;
- Zhang, Xianghua;
- Luo, Jingting;
- Zhang, Dongping
- Article
31
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13659, doi. 10.1007/s10854-017-7208-8
- Shi, Qin;
- Ren, Wei;
- Kong, Wenwen;
- Wang, Lei;
- Ma, Chao;
- Xu, Jinbao;
- Chang, Aimin;
- Jiang, Chunqi
- Article
32
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13920, doi. 10.1007/s10854-017-7241-7
- Abubakar, Saleh;
- Kaya, Senol;
- Aktag, Aliekber;
- Yilmaz, Ercan
- Article
33
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 14010, doi. 10.1007/s10854-017-7251-5
- Nouiri, M.;
- Ayadi, Z.;
- Djessas, K.;
- El Mir, L.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 16, p. 11979, doi. 10.1007/s10854-017-7007-2
- Karthick, K.;
- Srinivasan, D.;
- Christopher, J.
- Article
35
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 13, p. 9876, doi. 10.1007/s10854-017-6742-8
- Shi, Qin;
- Ren, Wei;
- Kong, Wenwen;
- Gao, Bo;
- Wang, Lei;
- Ma, Chao;
- Chang, Aimin;
- Bian, Liang
- Article
36
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 12, p. 8725, doi. 10.1007/s10854-017-6597-z
- Koc, Umran;
- Karaca, Gozde;
- Oksuz, Aysegul;
- Oksuz, Lutfi
- Article
37
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7376, doi. 10.1007/s10854-017-6426-4
- Akin, N.;
- Kinaci, B.;
- Ozen, Y.;
- Ozcelik, S.
- Article
38
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 6, p. 4713, doi. 10.1007/s10854-016-6113-x
- Arman, Ali;
- Luna, Carlos;
- Mardani, Mohsen;
- Hafezi, Fatemeh;
- Achour, Amine;
- Ahmadpourian, Azin
- Article
39
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 6, p. 5058, doi. 10.1007/s10854-016-6163-0
- Sharma, Govind;
- Dutta, Shankar;
- Singh, Sushil;
- Chatterjee, Ratnamala
- Article
40
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 12, p. 13154, doi. 10.1007/s10854-016-5461-x
- Lok, R.;
- Kaya, S.;
- Karacali, H.;
- Yilmaz, E.
- Article
41
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2175, doi. 10.1007/s10854-015-4084-y
- Foschini, C.;
- Tararam, R.;
- Simões, A.;
- Rocha, L.;
- Santos, C.;
- Longo, E.;
- Varela, J.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 5, p. 2800, doi. 10.1007/s10854-015-2761-5
- Murugan, R.;
- Vijayaprasath, G.;
- Mahalingam, T.;
- Hayakawa, Y.;
- Ravi, G.
- Article
43
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 639, doi. 10.1007/s10854-014-2439-4
- Bansal, Akansha;
- Srivastava, Pooja;
- Singh, B.
- Article
44
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 1, p. 78, doi. 10.1007/s10854-014-2366-4
- Paudel, N.;
- Wieland, K.;
- Compaan, A.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 5060, doi. 10.1007/s10854-014-2271-x
- Fan, Ping;
- Zheng, Zhuang-hao;
- Fan, Wei-fang;
- Zhang, Yin;
- Luo, Jing-ting;
- Zhang, Dong-ping;
- Liang, Guang-xing
- Article
46
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 8, p. 3264, doi. 10.1007/s10854-014-2012-1
- Tuan, Thi;
- Kuo, Dong-Hau;
- Li, Cheng-Che;
- Yen, Wei-Chun
- Article
47
- Journal of Solid State Electrochemistry, 2019, v. 23, n. 12, p. 3217, doi. 10.1007/s10008-019-04312-7
- Mahdhi, Hayet;
- Ayadi, Z. Ben;
- Djessas, K.
- Article
48
- Journal of Solid State Electrochemistry, 2015, v. 19, n. 12, p. 3621, doi. 10.1007/s10008-015-2963-z
- Sivajee Ganesh, K.;
- Purusottam Reddy, B.;
- Jeevan Kumar, P.;
- Jayanthbabu, K.;
- Rosaiah, P.;
- Hussain, O.
- Article
49
- Measurement Techniques, 2016, v. 59, n. 4, p. 423, doi. 10.1007/s11018-016-0983-4
- Esipov, Yu.;
- Biryukov, S.;
- Masychev, S.;
- Mukhortov, V.
- Article
50
- Inorganic Materials, 2020, v. 56, n. 11, p. 1188, doi. 10.1134/S0020168520100118
- Pavlenko, A. V.;
- Zakharchenko, I. N.;
- Kudryavtsev, Yu. A.;
- Kiseleva, L. I.;
- Alikhadzhiev, S. Kh.
- Article