Works matching DE "QUANTUM electronics"
1
- Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 6, p. 1, doi. 10.1007/s00339-025-08644-2
- Aguirre, C. A.;
- Faúndez, J.;
- Díaz, P.;
- Laroze, D.;
- Mosquera, A. S.;
- Costa, N. C.;
- Barba-Ortega, J.
- Article
2
- Advanced Electronic Materials, 2025, v. 11, n. 9, p. 1, doi. 10.1002/aelm.202400840
- Paasio, Ella;
- Ranta, Rikhard;
- Majumdar, Sayani
- Article
3
- NPJ 2D Materials & Applications, 2025, v. 9, n. 1, p. 1, doi. 10.1038/s41699-025-00573-1
- Lee, Sangmin;
- Kim, Miyoung;
- Kwon, Young-Kyun
- Article
4
- Revista Cubana de Física, 2018, v. 35, n. 2, p. 115
- CANO, L. E.;
- GUIMARÃAES, P. S. S.;
- PORTACIO, A.
- Article
5
- Revista Cubana de Física, 2018, v. 35, n. 2, p. 97
- CAUSIL, D.;
- URANGO-BAQUERO, M.;
- PORTACIO, Y A.
- Article
6
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 5, p. 4885, doi. 10.1007/s10854-019-00783-6
- Granada-Ramirez, D. A.;
- Arias-Cerón, J. S.;
- Gómez-Herrera, M. L.;
- Luna-Arias, J. P.;
- Pérez-González, M.;
- Tomás, S. A.;
- Rodríguez-Fragoso, P.;
- Mendoza-Alvarez, J. G.
- Article
7
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 19, p. 16805, doi. 10.1007/s10854-018-9775-8
- Zhang, S. L.;
- Lin, C. F.;
- Weng, Y. L.;
- He, L. C.;
- Guo, T. L.;
- Zhang, Y. A.;
- Zhou, X. T.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 9, p. 7820, doi. 10.1007/s10854-018-8781-1
- Amollo, Tabitha A.;
- Mola, Genene T.;
- Nyamori, Vincent O.
- Article
9
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 9, p. 7318, doi. 10.1007/s10854-018-8721-0
- Veerathangam, K.;
- Senthil Pandian, Muthu;
- Ramasamy, P.
- Article
10
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 7, p. 5830, doi. 10.1007/s10854-018-8555-9
- Horoz, Sabit;
- Ekinci, Arzu;
- Sahin, Omer
- Article
11
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 1, p. 500, doi. 10.1007/s10854-017-7939-6
- Rezaee, Gita;
- Mortazavi, S. Zahra;
- Mirershadi, Soghra;
- Reyhani, Ali
- Article
12
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 17, p. 13201, doi. 10.1007/s10854-017-7155-4
- Zhang, Yijun;
- Zhang, Junwen;
- Jin, Yu;
- Zhang, Jiaqi;
- Hu, Guangcai;
- Lin, Sai;
- Yuan, Rongrong;
- Liang, Xiaojuan;
- Xiang, Weidong
- Article
13
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 10, p. 7047, doi. 10.1007/s10854-016-6217-3
- Polupan, G.;
- Torchynska, T.;
- Gomez, J.;
- Douda, J.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 2, p. 1769, doi. 10.1007/s10854-015-3952-9
- Xiong, Jinhua;
- Wang, Liangying;
- Xu, Jingkun;
- Liu, Congcong;
- Zhou, Weiqiang;
- Shi, Hui;
- Jiang, Qinglin;
- Jiang, Fengxing
- Article
15
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 11, p. 8644, doi. 10.1007/s10854-015-3539-5
- Kim, Kwang-Seok;
- Park, Bum-Geun;
- Jung, Kwang-Ho;
- Jung, Seung-Boo;
- Kim, Jong-Woong
- Article
16
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5753, doi. 10.1007/s10854-015-3133-x
- Li, Fang;
- Liu, Kun;
- Zhao, Yuling;
- Cao, Yanyan;
- Li, Zhengquan;
- Xu, Haitao;
- Zhang, Hongbin;
- Guo, Yanchuan;
- Qian, Haisheng
- Article
17
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 445, doi. 10.1007/s10854-009-9936-x
- Young Chae Yoo;
- Kim, Lee-Hyun;
- Il Ki Han
- Article
18
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 3, p. 202, doi. 10.1007/s10854-008-9699-9
- Gao, Huazhong;
- Shao, Mingwang;
- Wang, Sheng;
- Fu, Yan
- Article
19
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 272, doi. 10.1007/s10854-008-9574-8
- Massé, N. F.;
- Marko, I. P.;
- Adams, A. R.;
- Sweeney, S. J.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 68, doi. 10.1007/s10854-007-9442-y
- Zianni, Xanthippi;
- Nassiopoulou, Androula G.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 282, doi. 10.1007/s10854-008-9582-8
- Chao Liu;
- Yong Kon Kwon;
- Jong Heo
- Article
22
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 102, doi. 10.1007/s10854-007-9457-4
- Borkovska, L.;
- Korsunska, N.;
- Venger, Ye.;
- Sadofyev, Yu.;
- Kazakov, I.;
- Kryshtab, T.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 96, doi. 10.1007/s10854-008-9657-6
- Nasi, L.;
- Bocchi, C.;
- Germini, F.;
- Prezioso, M.;
- Gombia, E.;
- Mosca, R.;
- Frigeri, P.;
- Trevisi, G.;
- Seravalli, L.;
- Franchi, S.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 101, doi. 10.1007/s10854-008-9703-4
- Kaniewska, M.;
- Engström, O.;
- Kaczmarczyk, M.;
- Zaremba, G.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 347, doi. 10.1007/s10854-008-9656-7
- Piotrowski, T.;
- Kaczmarczyk, M.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 714, doi. 10.1007/s10854-007-9389-z
- Andrews, Aaron Maxwell;
- Schramböck, Matthias;
- Roch, Tomas;
- Schrenk, Werner;
- Gornik, Erich;
- Strasser, Gottfried
- Article
27
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 363, doi. 10.1007/s10854-007-9241-5
- Wen, X. M.;
- Dao, L. V.;
- Davis, J. A.;
- Hannaford, P.;
- Mokkapati, S.;
- Tan, H. H.;
- Jagadish, C.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 305, doi. 10.1007/s10854-007-9221-9
- van Dao, Lap;
- Davis, Jeff;
- Xiaoming Wen;
- Hannaford, Peter
- Article
29
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 135, doi. 10.1007/s10854-007-9172-1
- Article
30
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 339, doi. 10.1007/s10854-007-9246-0
- Correia, Helena M. G.;
- Ramos, Marta M. D.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 191, doi. 10.1007/s10854-007-9205-9
- Jung, S. I.;
- Yeo, H. Y.;
- Yun, I.;
- Leem, J. Y.;
- Han, I. K.;
- Kim, J. S.;
- Lee, J. I.
- Article
32
- Journal of Materials Science Letters, 2003, v. 22, n. 24, p. 1767, doi. 10.1023/B:JMSL.0000005416.82116.7e
- Kim, M. D.;
- Lee, H. S.;
- Lee, J. Y.;
- Kim, T. W.;
- Yoo, K. H.;
- Kim, G.-H.
- Article
33
- Biomedical Microdevices, 2008, v. 10, n. 3, p. 367, doi. 10.1007/s10544-007-9144-5
- Pattani, Varun P.;
- Li, Chunfei;
- Desai, Tejal A.;
- Vu, Tania Q.
- Article
34
- Inorganic Materials, 2018, v. 54, n. 11, p. 1109, doi. 10.1134/S0020168518110158
- Vasil’ev, M. G.;
- Vasil’ev, A. M.;
- Izotov, A. D.;
- Shelyakin, A. A.
- Article
35
- Inorganic Materials, 2018, v. 54, n. 5, p. 413, doi. 10.1134/S002016851805014X
- Smirnov, M. S.;
- Ovchinnikov, O. V.;
- Hazal, Nassra Amir Razuki;
- Zvyagin, A. I.
- Article
36
- Inorganic Materials, 2009, v. 45, n. 12, p. 1326, doi. 10.1134/S0020168509120024
- Blagin, A. V.;
- Barannik, A. A.;
- Lunin, L. S.;
- Lunina, M. L.;
- Maronchuk, I. E.;
- Kulyutkina, T. F.
- Article
37
- Cogent Engineering, 2016, v. 3, n. 1, p. N.PAG, doi. 10.1080/23311916.2016.1237864
- Abdullah-Al-Shafi, Md.;
- Bahar, Ali Newaz;
- Ai, Qingsong
- Article
38
- Astronomy Reports, 2012, v. 56, n. 7, p. 553, doi. 10.1134/S1063772912060029
- Bayandina, O.;
- Val'tts, I.;
- Larionov, G.
- Article
39
- Astronomy Reports, 2010, v. 54, n. 4, p. 295, doi. 10.1134/S1063772910040037
- Kalenskii, S.;
- Johansson, L.
- Article
40
- Astronomy Reports, 2009, v. 53, n. 6, p. 528, doi. 10.1134/S1063772909060055
- Lyubchenko, S. Yu.;
- Alakoz, A. V.;
- Val'tts, I. E.;
- Slysh, V. I.
- Article
41
- Atoms (2218-2004), 2018, v. 6, n. 4, p. 59, doi. 10.3390/atoms6040059
- Kraft-Bermuth, Saskia;
- Hengstler, Daniel;
- Egelhof, Peter;
- Enss, Christian;
- Fleischmann, Andreas;
- Keller, Michael;
- Stöhlker, Thomas
- Article
42
- Administração: Ensino e Pesquisa, 2016, v. 17, n. 1, p. 177, doi. 10.13058/raep.2016.v17n1.416
- Article
43
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 234, doi. 10.1002/sdtp.10362
- Hsu, Chia‐Wei;
- Huang, Ji‐Yuan;
- Chen, Hung‐Shing;
- Sun, Pei‐Li;
- Luo, Ronnier
- Article
44
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 1465, doi. 10.1002/sdtp.10015
- Hao, Junjie;
- Chen, Wei;
- Qin, Jing;
- Wang, Kai
- Article
45
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 1469, doi. 10.1002/sdtp.10016
- Luo, Zhenyue;
- Xu, Su;
- Gao, Yating;
- Lee, Yun‐Han;
- Liu, Yifan;
- Wu, Shin‐Tson
- Article
46
- 2013
- Kim, Yohan;
- Ippen, Christian;
- Greco, Tonino;
- Wedel, Armin;
- Park, Myeongjin;
- Lee, Changhee;
- Han, Chul Jong;
- Kim, Jiwan
- Other
47
- Nanotechnology Reviews, 2017, v. 6, n. 6, p. 601, doi. 10.1515/ntrev-2017-0145
- Article
48
- Applied Nanoscience, 2020, v. 10, n. 12, p. 5121, doi. 10.1007/s13204-020-01329-7
- Zhitlukhina, Elena;
- Belogolovskii, Mikhail;
- Seidel, Paul
- Article
49
- European Physical Journal D (EPJ D), 2021, v. 75, n. 8, p. 1, doi. 10.1140/epjd/s10053-021-00228-y
- Taccogna, F.;
- Bechu, S.;
- Aanesland, A.;
- Agostinetti, P.;
- Agnello, R.;
- Aleiferis, S.;
- Angot, T.;
- Antoni, V.;
- Bacal, M.;
- Barbisan, M.;
- Bentounes, J.;
- Bès, A.;
- Capitelli, M.;
- Cartry, G.;
- Cavenago, M.;
- Celiberto, R.;
- Chitarin, G.;
- Delogu, R.;
- De Lorenzi, A.;
- Esposito, F.
- Article
50
- European Physical Journal D (EPJ D), 2010, v. 60, n. 1, p. 137, doi. 10.1140/epjd/e2010-00107-7
- Article