Works matching DE "PRESTO Engineering Inc."
Results: 13
THE TRANSFORMATION OF FAILURE ANALYSIS—LESSONS FROM 10 YEARS IN THE SERVICE.
- Published in:
- Electronic Device Failure Analysis, 2015, v. 17, n. 3, p. 2
- By:
- Publication type:
- Article
Presto Engineering and DelfMEMS Collaborate on Test Solution.
- Published in:
- 2014
- Publication type:
- Product Review
AROUND THE CIRCUIT:INDUSTRY NEWS.
- Published in:
- Microwave Journal, 2008, v. 51, n. 11, p. 58
- Publication type:
- Article
Presto, Peraso develop 60-GHz transceiver test.
- Published in:
- EE: Evaluation Engineering, 2016, v. 55, n. 6, p. 6
- Publication type:
- Article
'Million unit' company offers RF test and services.
- Published in:
- EE: Evaluation Engineering, 2015, v. 54, n. 1, p. 32
- By:
- Publication type:
- Article
EE INDUSTRY UPDATE.
- Published in:
- EE: Evaluation Engineering, 2014, v. 53, n. 4, p. 6
- Publication type:
- Article
Presto Engineering and CEA-Leti Develop Test and Analysis Capability.
- Published in:
- Electronic Device Failure Analysis, 2010, v. 12, n. 3, p. 40
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- Publication type:
- Article
Presto Engineering Awarded ISO 9001 Certification.
- Published in:
- Electronic Device Failure Analysis, 2009, v. 11, n. 2, p. 45
- By:
- Publication type:
- Article
Presto's In-Silicon Analysis Services Now Available on the 300 mm Probe Station from Micromanipulator.
- Published in:
- Electronic Device Failure Analysis, 2009, v. 11, n. 1, p. 43
- By:
- Publication type:
- Article
Presto Engineering Introduces New Thermal Solution for Analysis of High-Power Devices.
- Published in:
- 2009
- By:
- Publication type:
- Product Review
Presto Engineering and SEMICAPS Announce Strategic OEM Relationship.
- Published in:
- Electronic Device Failure Analysis, 2009, v. 11, n. 1, p. 41
- By:
- Publication type:
- Article
Presto Authorized as Distributor for iRoC Soft Error Rate Testing.
- Published in:
- Electronic Device Failure Analysis, 2008, v. 10, n. 4, p. 46
- By:
- Publication type:
- Article
Presto Engineering Collaborates with Israeli Test House.
- Published in:
- Electronic Device Failure Analysis, 2008, v. 10, n. 4, p. 44
- By:
- Publication type:
- Article