Works matching DE "PIEZOELECTRIC ceramic testing"
1
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 15942, doi. 10.1007/s10854-017-7491-4
- Abbasipour, Mina;
- Khajavi, Ramin;
- Yousefi, Ali;
- Yazdanshenas, Mohammad;
- Razaghian, Farhad
- Article
2
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 9, p. 3962, doi. 10.1007/s10854-014-2114-9
- Sun, Huajun;
- Zhang, Yong;
- Liu, Xiaofang;
- Liu, Yi;
- Guo, Shanshan;
- Chen, Wen
- Article
3
- Revista Cubana de Física, 2009, v. 26, n. 2A, p. 174
- Costa, J.;
- Suárez, A.;
- Saniger, J.;
- Calderón, F.
- Article
4
- Piezoelectrics & Acoustooptics, 2017, v. 39, n. 4, p. 605
- Article
5
- Indian Journal of Pure & Applied Physics, 2019, v. 57, n. 3, p. 212
- Uniyal, Manish;
- Bhatt, S. C.;
- Kashyap, Sidharth
- Article
6
- Electronics & Communications in Japan, 2013, v. 96, n. 3, p. 53, doi. 10.1002/ecj.10416
- Nagata, Hajime;
- Takenaka, Tadashi
- Article
7
- Journal of Materials Science, 2019, v. 54, n. 2, p. 1126, doi. 10.1007/s10853-018-2906-z
- Zhao, Yongjie;
- Liu, Jialin;
- Yan, Dong
- Article
8
- Instruments & Experimental Techniques, 2018, v. 61, n. 4, p. 596, doi. 10.1134/S002044121804005X
- Golub, V. V.;
- Zhilin, Yu. V.;
- Marchuk, N. A.
- Article
9
- Journal of the American Ceramic Society, 2012, v. 95, n. 3, p. 855, doi. 10.1111/j.1551-2916.2011.05050.x
- Oh, Nam-Kun;
- Han, Guifang;
- Yoon, Woon-Ha;
- Choi, Jong-Jin;
- Hahn, Byung-Dong;
- Kim, Jong-Woo;
- Ahn, Cheol-Woo;
- Choi, Joon Hwan;
- Park, Dong-Soo;
- Kim, Jeong-Joo;
- Ryu, Jungho;
- Nan, C.-W.
- Article
