Works matching DE "PHOTOELECTRICITY"
1
- Advanced Functional Materials, 2025, v. 35, n. 29, p. 1, doi. 10.1002/adfm.202425595
- Wen, Zhixuan;
- Ling, Haoyang;
- Xin, Weiwen;
- Zhou, Teng;
- Wang, Nan;
- Zhang, Yu;
- Xia, Shixuan;
- Guo, Jingyi;
- Tian, Chungui;
- Kong, Xiang‐Yu;
- Fu, Honggang
- Article
2
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 22, n. 10, p. 1, doi. 10.1002/pssa.202400844
- Podzyvalov, Sergei;
- Kalygina, Vera;
- Yudin, Nikolay;
- Slyunko, Elena;
- Zinovev, Mikhail;
- Kuznetsov, Vladimir;
- Shaimerdenova, Leila;
- Baalbaki, Houssain
- Article
3
- Physica Status Solidi. A: Applications & Materials Science, 2025, v. 222, n. 12, p. 1, doi. 10.1002/pssa.202400306
- Yang, Ping;
- Yang, Zenghui;
- Deng, Shuairong;
- Zhao, Wei;
- Ding, Yi;
- Pan, Yongqi;
- Zhou, Hang;
- Meng, Dechao;
- Wei, Su‐Huai
- Article
4
- Advanced Engineering Materials, 2025, v. 27, n. 13, p. 1, doi. 10.1002/adem.202402770
- Wang, Yanfeng;
- Song, Jianmin;
- Liu, Jia;
- Wang, Min;
- Zhang, Nan;
- Wu, Pengcheng;
- Meng, Xudong;
- Wang, Xing;
- Hou, Denglu;
- Li, Junjie
- Article
5
- International Journal of Nanoscience, 2003, v. 2, n. 6, p. 391, doi. 10.1142/S0219581X03001486
- Filatov, D.O.;
- Karpovich, I.A.;
- Shilova, T.V.;
- Demikhovskii, V.Ya.;
- Khomitskiy, D.V.
- Article
6
- Innovation, 2007, v. 7, n. 3, p. 16
- Kietzke, Thomas;
- Sellinger, Alan
- Article
7
- Annalen der Physik, 2019, v. 531, n. 7, p. N.PAG, doi. 10.1002/andp.201800440
- Article
8
- Annalen der Physik, 2019, v. 531, n. 6, p. N.PAG, doi. 10.1002/andp.201800418
- Durnev, Mikhail V.;
- Tarasenko, Sergey A.
- Article
9
- Advanced Functional Materials, 2016, v. 26, n. 26, p. 4749, doi. 10.1002/adfm.201600031
- Liu, Dongdong;
- Ma, Liyi;
- An, Yanxin;
- Li, Yu;
- Liu, Yuxin;
- Wang, Lu;
- Guo, Jin;
- Wang, Jianhua;
- Zhou, Jing
- Article
10
- Advanced Functional Materials, 2014, v. 23, n. 44, p. 5511, doi. 10.1002/adfm.201300760
- Perea‐López, Néstor;
- Elías, Ana Laura;
- Berkdemir, Ayse;
- Castro‐Beltran, Andres;
- Gutiérrez, Humberto R.;
- Feng, Simin;
- Lv, Ruitao;
- Hayashi, Takuya;
- López‐Urías, Florentino;
- Ghosh, Sujoy;
- Muchharla, Baleeswaraiah;
- Talapatra, Saikat;
- Terrones, Humberto;
- Terrones, Mauricio
- Article
11
- Advanced Functional Materials, 2014, v. 24, n. 22, p. 3464, doi. 10.1002/adfm.201303952
- Cernetic, Nathan;
- Wu, Sanfeng;
- Davies, Joshua A.;
- Krueger, Benjamin W.;
- Hutchins, Daniel O.;
- Xu, Xiaodong;
- Ma, Hong;
- Jen, Alex K.‐Y.
- Article
12
- Advanced Functional Materials, 2013, v. 23, n. 22, p. 2887, doi. 10.1002/adfm.201203259
- Wen, Liping;
- Tian, Ye;
- Guo, Yongli;
- Ma, Jie;
- Liu, Weida;
- Jiang, Lei
- Article
13
- Journal of Thermal Analysis & Calorimetry, 2005, v. 79, n. 3, p. 677, doi. 10.1007/s10973-005-0595-8
- Y. Q. Li;
- L. H. Zhang;
- H. Gong
- Article
14
- Journal of Thermal Analysis & Calorimetry, 2004, v. 76, n. 3, p. 949, doi. 10.1023/B:JTAN.0000032280.69249.a8
- Gajerski, R.;
- Radecka, M.;
- Wierzbicka, M.;
- Rekas, M.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 6, p. 554, doi. 10.1007/s10854-009-9956-6
- Zhiyue Han;
- Jingchang Zhang;
- Xiuying Yang;
- Hong Zhu;
- Weiliang Cao
- Article
16
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 2, p. 153, doi. 10.1007/s10854-009-9886-3
- Güneş, M.;
- Yavas, M. E. D.;
- Klomfass, J.;
- Finger, F.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 12, p. 1225, doi. 10.1007/s10854-009-9856-9
- Minhong Jiang;
- Xinyu Liu;
- Guohua Chen;
- Jun Cheng;
- Xiujuan Zhou
- Article
18
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 9, p. 885, doi. 10.1007/s10854-008-9811-1
- Bo-In Noh;
- Jeong-Won Yoon;
- Bo-Young Lee;
- Seung-Boo Jung
- Article
19
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 2, p. 144, doi. 10.1007/s10854-008-9667-4
- Vijayakumar, Arun;
- Warren, Andrew P.;
- Todi, Ravi M.;
- Sundaram, Kalpathy B.
- Article
20
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 446, doi. 10.1007/s10854-008-9665-6
- Jin-Kook Lee;
- Bo-Hwa Jeong;
- Sung-Il Jang;
- Yun-Seon Yeo;
- Sung-Hae Park;
- Ji-Un Kim;
- Young-Guen Kim;
- Yong-Wook Jang;
- Kim, Mi-Ra
- Article
21
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 234, doi. 10.1007/s10854-008-9694-1
- Kadys, A.;
- Jarasiunas, K.;
- Saucedo, E.;
- Dieguez, E.;
- Launay, J.;
- Verstraeten, D.
- Article
22
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 687, doi. 10.1007/s10854-007-9380-8
- Seghier, D.;
- Gislason, H. P.
- Article
23
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 868, doi. 10.1007/s10854-007-9543-7
- Fang, L. M.;
- Zu, X. T.;
- Li, Z. J.;
- Zhu, S.;
- Liu, C. M.;
- Wang, L. M.;
- Gao, F.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 111, doi. 10.1007/s10854-007-9156-1
- Gharghi, M.;
- Sivoththaman, S.
- Article
25
- Science & Education, 2011, v. 20, n. 7/8, p. 719, doi. 10.1007/s11191-009-9214-6
- Article
26
- Measurement Techniques, 2016, v. 59, n. 9, p. 929, doi. 10.1007/s11018-016-1069-z
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
27
- Measurement Techniques, 2016, v. 59, n. 5, p. 491, doi. 10.1007/s11018-016-0995-0
- Yanushkin, V.;
- Kolyada, Yu.;
- Krushnyak, N.
- Article
28
- Measurement Techniques, 2015, v. 58, n. 3, p. 272, doi. 10.1007/s11018-015-0698-y
- Article
29
- Measurement Techniques, 2015, v. 57, n. 12, p. 1338, doi. 10.1007/s11018-015-0631-4
- Bogomolova, S.;
- Lukashov, Yu.;
- Shvarts, M.
- Article
30
- Measurement Techniques, 2014, v. 57, n. 3, p. 255, doi. 10.1007/s11018-014-0441-0
- Yanushkin, V.;
- Kolyada, Yu.
- Article
31
- Measurement Techniques, 2012, v. 55, n. 3, p. 292, doi. 10.1007/s11018-012-9953-7
- Article
32
- Measurement Techniques, 2011, v. 54, n. 5, p. 490, doi. 10.1007/s11018-011-9754-4
- Krasovskii, P.;
- Troyan, V.;
- Pushkin, M.;
- Borisyuk, P.;
- Borman, V.;
- Tronin, V.
- Article
33
- Measurement Techniques, 2008, v. 51, n. 3, p. 242, doi. 10.1007/s11018-008-9041-1
- Yu. Kolyada;
- Yu. Korolev;
- N. Krushnyak;
- V. Razgulin;
- V. Yanushkin
- Article
34
- Photochem, 2024, v. 4, n. 1, p. 14, doi. 10.3390/photochem4010002
- Yao, Guoying;
- Yang, Zhenyu;
- Zeng, Tao
- Article
35
- Instruments (2410-390X), 2023, v. 7, n. 3, p. 24, doi. 10.3390/instruments7030024
- Lee, Eldred;
- Larkin, Kevin D.;
- Yue, Xin;
- Wang, Zhehui;
- Fossum, Eric R.;
- Liu, Jifeng
- Article
36
- Advanced Sustainable Systems, 2024, v. 8, n. 4, p. 1, doi. 10.1002/adsu.202300439
- Zhang, Yuanyuan;
- Huang, Xunhuai;
- Zheng, Qian;
- Yang, Jinman;
- Zhai, Linzhi;
- Song, Yanhua
- Article
37
- Journal of Jilin University (Science Edition) / Jilin Daxue Xuebao (Lixue Ban), 2019, v. 57, n. 2, p. 411, doi. 10.13413/j.cnki.jdxblxb.2018003
- 张晓茹;
- 刘继平;
- 李海波;
- 刘 晗;
- 潘 庆;
- 杨涪铨;
- 张斯淇;
- 刘晓静;
- 吴向尧
- Article
38
- Ferroelectrics, 2007, v. 352, n. 1, p. 100, doi. 10.1080/00150190701358183
- Davidenko, N. A.;
- Ishchenko, A. A.;
- Pavlov, V. A.;
- Chuprina, N. G.;
- Kuranda, N. N.
- Article
39
- Ferroelectrics, 2007, v. 352, n. 1, p. 143, doi. 10.1080/00150190701358241
- Rossella, F.;
- Grando, D.;
- Galinetto, P.;
- Degiorgio, V.;
- Kokanyan, E.
- Article
40
- Ferroelectrics, 2005, v. 320, n. 1, p. 99, doi. 10.1080/00150190590966928
- Bozgeyik, M. S.;
- Mamedov, Amirullah M.
- Article
41
- Ferroelectrics, 2005, v. 314, n. 1, p. 157, doi. 10.1080/00150190590926382
- Article
42
- Ferroelectrics, 2004, v. 303, n. 1, p. 155, doi. 10.1080/00150190490453126
- Park, J.-B.;
- Hwang, J. Y.;
- Seo, D.S.;
- Park, S.-K.;
- Moon, D.G.;
- Han, J. I.
- Article
43
- Ferroelectrics, 2004, v. 298, n. 1, p. 141, doi. 10.1080/00150190490423390
- Ishikawa, T.;
- Itoh, M.;
- Kurita, M.;
- Shimoda, H.;
- Takesada, M.;
- Yagi, T.;
- Koshihara, S.
- Article
44
- Ferroelectrics, 2003, v. 296, n. 1, p. 83, doi. 10.1080/00150190390239161
- Babur, Yunus;
- Mamedov, Amirullah M.
- Article
45
- Ferroelectrics, 2003, v. 287, n. 1, p. 63, doi. 10.1080/00150190390201775
- Preethy Menon, C.;
- Philip, J.
- Article
46
- Plasma Physics Reports, 2012, v. 38, n. 9, p. 729, doi. 10.1134/S1063780X12080181
- Losseva, T.;
- Popel, S.;
- Golub', A.
- Article
47
- Plasma Physics Reports, 2011, v. 37, n. 8, p. 696, doi. 10.1134/S1063780X11070117
- Kopnin, S.;
- Morzhakova, A.;
- Popel, S.;
- Shukla, P.
- Article
48
- Plasma Physics Reports, 2009, v. 35, n. 8, p. 647, doi. 10.1134/S1063780X09080042
- Article
49
- Plasma Physics Reports, 2004, v. 30, n. 5, p. 437, doi. 10.1134/1.1744953
- Shuaibov, A. K.;
- Dashchenko, A. I.;
- Shevera, I. V.
- Article
50
- Electronics (2079-9292), 2023, v. 12, n. 12, p. 2655, doi. 10.3390/electronics12122655
- Chen, Zihao;
- Cai, Pinggen;
- Wen, Qiye;
- Chen, Hao;
- Tang, Yongjian;
- Yi, Zao;
- Wei, Kaihua;
- Li, Gongfa;
- Tang, Bin;
- Yi, Yougen
- Article