Works matching DE "PHOTOCONDUCTIVITY"
1
- Advanced Materials Interfaces, 2025, v. 12, n. 13, p. 1, doi. 10.1002/admi.202500087
- Ghopry, Samar;
- Shultz, Andrew;
- Alamri, Mohammed;
- Alzahrani, Saad;
- Wu, Judy
- Article
2
- Advanced Electronic Materials, 2025, v. 11, n. 11, p. 1, doi. 10.1002/aelm.202400878
- Lim, Younghoon;
- Kim, Taehun;
- Eom, Jaesik;
- Harm, Onsik;
- Byeon, Junsung;
- Lim, Jungmoon;
- Lee, Juwon;
- Pak, Sangyeon;
- Cha, SeungNam
- Article
3
- AAPPS Bulletin, 2025, v. 35, p. 3, doi. 10.1007/s43673-025-00145-x
- Ruobing Mei;
- Chao‑Xing Liu
- Article
4
- AAPPS Bulletin, 2025, v. 35, p. 2
- Article
5
- Radiophysics & Quantum Electronics, 2024, v. 67, n. 7, p. 558, doi. 10.1007/s11141-025-10397-0
- Article
6
- Materials (1996-1944), 2025, v. 18, n. 13, p. 2931, doi. 10.3390/ma18132931
- Jeon, Dabin;
- Lee, Seung Hun;
- Lee, Sung-Nam
- Article
7
- International Journal of Nanoscience, 2019, v. 18, n. 3/4, p. N.PAG, doi. 10.1142/S0219581X19400866
- Kukhta, A.;
- Davidenko, N.;
- Davidenko, I.;
- Mokrinskaya, E.;
- Chuprin, N.;
- Tonkopieva, L.
- Article
8
- International Journal of Nanoscience, 2011, v. 10, n. 4/5, p. 555, doi. 10.1142/S0219581X11009386
- MISHRA, J. K.;
- DHAR, S.;
- KHADERABAD, M. A.
- Article
9
- Particle & Particle Systems Characterization, 2018, v. 35, n. 4, p. 1, doi. 10.1002/ppsc.201870012
- Pan, Rui;
- Li, Haiyang;
- Wang, Jun;
- Jin, Xiao;
- Li, Qinghua;
- Wu, Zhiming;
- Gou, Jun;
- Jiang, Yadong;
- Song, Yinglin
- Article
10
- Particle & Particle Systems Characterization, 2018, v. 35, n. 4, p. 1, doi. 10.1002/ppsc.201700304
- Pan, Rui;
- Li, Haiyang;
- Wang, Jun;
- Jin, Xiao;
- Li, Qinghua;
- Wu, Zhiming;
- Gou, Jun;
- Jiang, Yadong;
- Song, Yinglin
- Article
11
- Annalen der Physik, 2019, v. 531, n. 6, p. N.PAG, doi. 10.1002/andp.201800418
- Durnev, Mikhail V.;
- Tarasenko, Sergey A.
- Article
12
- Annalen der Physik, 2015, v. 527, n. 5/6, p. 378, doi. 10.1002/andp.201500115
- Article
14
- Advanced Functional Materials, 2015, v. 25, n. 44, p. 6936, doi. 10.1002/adfm.201503188
- Domanski, Konrad;
- Tress, Wolfgang;
- Moehl, Thomas;
- Saliba, Michael;
- Nazeeruddin, Mohammad Khaja;
- Grätzel, Michael
- Article
15
- Advanced Functional Materials, 2015, v. 25, n. 30, p. 4874, doi. 10.1002/adfm.201501826
- Wang, Peng L.;
- Liu, Zhifu;
- Chen, Pice;
- Peters, John A.;
- Tan, Gangjian;
- Im, Jino;
- Lin, Wenwen;
- Freeman, Arthur J.;
- Wessels, Bruce W.;
- Kanatzidis, Mercouri G.
- Article
16
- Advanced Functional Materials, 2015, v. 25, n. 21, p. 3157, doi. 10.1002/adfm.201500231
- Liu, Kewei;
- Sakurai, Makoto;
- Aono, Masakazu;
- Shen, Dezhen
- Article
17
- Advanced Functional Materials, 2014, v. 24, n. 30, p. 4775, doi. 10.1002/adfm.201400344
- Dhanker, Rijul;
- Chopra, Neetu;
- Giebink, Noel C.
- Article
18
- Advanced Functional Materials, 2014, v. 23, n. 45, p. 5631, doi. 10.1002/adfm.201300775
- Brunel, David;
- Anghel, Costin;
- Kim, Do‐Yoon;
- Tahir, Saïd;
- Lenfant, Stéphane;
- Filoramo, Arianna;
- Kontos, Takis;
- Vuillaume, Dominique;
- Jourdain, Vincent;
- Derycke, Vincent
- Article
19
- Advanced Functional Materials, 2014, v. 24, n. 20, p. 2967, doi. 10.1002/adfm.201303864
- Lu, Ming‐Pei;
- Lu, Ming‐Yen;
- Chen, Lih‐Juann
- Article
20
- Advanced Functional Materials, 2014, v. 24, n. 19, p. 2852, doi. 10.1002/adfm.201303820
- Simmons, Christie B.;
- Akey, Austin J.;
- Mailoa, Jonathan P.;
- Recht, Daniel;
- Aziz, Michael J.;
- Buonassisi, Tonio
- Article
21
- Advanced Functional Materials, 2014, v. 23, n. 39, p. 4977, doi. 10.1002/adfm.201300509
- Bera, Ashok;
- Peng, Haiyang;
- Lourembam, James;
- Shen, Youde;
- Sun, Xiao Wei;
- Wu, T.
- Article
22
- Advanced Functional Materials, 2014, v. 23, n. 37, p. 4657, doi. 10.1002/adfm.201300224
- Wee, Boon‐Hong;
- Hong, Jong‐Dal
- Article
23
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 5, p. 441, doi. 10.1007/s10854-009-9932-1
- Shenghao Wang;
- Jingquan Zhang;
- Bo Wang;
- Lianghuan Feng;
- Yaping Cai;
- Lili Wu;
- Wei Li;
- Zhi Lei;
- Bing Li
- Article
24
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 371, doi. 10.1007/s10854-008-9627-z
- Ghosh, R.;
- Mridha, S.;
- Basak, D.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 4, doi. 10.1007/s10854-008-9671-8
- Ramspeck, K.;
- Bothe, K.;
- Schmidt, J.;
- Brendel, R.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 32, doi. 10.1007/s10854-007-9507-y
- Weiyan Wang;
- Deren Yang;
- Xuegong Yu;
- Duanlin Que
- Article
27
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, n. 8/9, p. 687, doi. 10.1007/s10854-007-9380-8
- Seghier, D.;
- Gislason, H. P.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 447, doi. 10.1007/s10854-007-9248-y
- Cooke, David G.;
- MacDonald, A. Nicole;
- Hryciw, Aaron;
- Meldrum, Al;
- Juan Wang;
- Li, Q.;
- Hegmann, Frank A.
- Article
29
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, p. 389, doi. 10.1007/s10854-007-9235-3
- Congji Zha;
- Rongping Wang;
- Smith, Anita;
- Prasad, Amrita;
- Jarvis, Ruth;
- Luther-Davies, Barry
- Article
30
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 9, p. 925, doi. 10.1007/s10854-007-9116-9
- Bhatia, V.;
- Gupta, D.;
- Kabra, D.;
- Narayan, K. S.
- Article
31
- Journal of Materials Science Letters, 2003, v. 22, n. 24, p. 1763, doi. 10.1023/B:JMSL.0000005415.44479.33
- Li-Fang Tong;
- Li-Wei Li;
- Yong-Gang Shangguan;
- Qiang Zheng
- Article
32
- Journal of Materials Science Letters, 2003, v. 22, n. 4, p. 287, doi. 10.1023/A:1022360514665
- Kumar, M.C. Santhosh;
- Pradeep, B.
- Article
33
- Microscopy & Microanalysis, 2024, v. 30, p. 1, doi. 10.1093/mam/ozae044.1066
- Article
34
- Measurement Techniques, 2010, v. 53, n. 6, p. 620, doi. 10.1007/s11018-010-9551-5
- Miroshnikova, I.;
- Komissarov, A.;
- Miroshnikov, B.
- Article
35
- Ferroelectrics, 2010, v. 397, n. 1, p. 198, doi. 10.1080/00150193.2010.484786
- Matiyev, A. Kh.;
- Georgobiani, A. N.;
- Kodin, V. V.;
- Matiyev, M. A.
- Article
36
- Ferroelectrics, 2007, v. 352, n. 1, p. 100, doi. 10.1080/00150190701358183
- Davidenko, N. A.;
- Ishchenko, A. A.;
- Pavlov, V. A.;
- Chuprina, N. G.;
- Kuranda, N. N.
- Article
37
- Ferroelectrics, 2007, v. 352, n. 1, p. 143, doi. 10.1080/00150190701358241
- Rossella, F.;
- Grando, D.;
- Galinetto, P.;
- Degiorgio, V.;
- Kokanyan, E.
- Article
38
- Ferroelectrics, 2007, v. 346, n. 1, p. 10, doi. 10.1080/00150190601180042
- Ishikawa, T.;
- Kurita, M.;
- Koshihara, S.;
- Takesada, M.;
- Itoh, M.
- Article
39
- Ferroelectrics, 2006, v. 337, n. 1, p. 179, doi. 10.1080/00150190600716804
- Galinetto, P.;
- Rossella, F.;
- Samoggia, G.;
- Trepakov, V.;
- Kotomin, E.;
- Heifets, E.;
- Markovin, P.;
- Jastrabik, L.
- Article
40
- Ferroelectrics, 2006, v. 334, n. 1, p. 113, doi. 10.1080/00150190600692773
- Trepakov, V. A.;
- Gubaev, A. I.;
- Kapphan, S. E.;
- Galinetto, P.;
- Rossella, F.;
- Boatner, L. A.;
- Syrnikov, P. P.;
- Jastrabik, L.
- Article
41
- Ferroelectrics, 2005, v. 322, n. 1, p. 69, doi. 10.1080/00150190500315251
- Panchenko, T. V.;
- Kopylova, S. Yu
- Article
42
- Ferroelectrics, 2005, v. 318, n. 1, p. 35, doi. 10.1080/00150190590965992
- Afanasjev, P. V.;
- Afanasjev, V. P.;
- Bulat, D. Yu.;
- Pankrashkin, A. V.;
- Pronin, I. P.;
- Suchaneck, G.;
- Gerlach, G.
- Article
43
- Ferroelectrics, 2005, v. 314, n. 1, p. 201, doi. 10.1080/00150190590926463
- Zverev, D. G.;
- Migachev, S. A.;
- Mamin, R. F.;
- Nikitin, S. I.;
- Sadykov, M. F.;
- Başaran, B.;
- Mikailov, F. A.
- Article
44
- Ferroelectrics, 2004, v. 307, n. 1, p. 137, doi. 10.1080/00150190490492259
- Zverev, D. U.;
- Migachev, S. A.;
- Mamin, R. F.;
- Nikitin, S. I.;
- Sadykov, M. E.
- Article
45
- Ferroelectrics, 2004, v. 298, n. 1, p. 141, doi. 10.1080/00150190490423390
- Ishikawa, T.;
- Itoh, M.;
- Kurita, M.;
- Shimoda, H.;
- Takesada, M.;
- Yagi, T.;
- Koshihara, S.
- Article
46
- Ferroelectrics, 2003, v. 291, n. 1, p. 101, doi. 10.1080/00150190390222592
- Mamin, R. E;
- Migachev, S. A.;
- Nikitin, S. I.;
- Sadykov, M. F.;
- Zverev, D. G.
- Article
47
- Ferroelectrics, 2003, v. 283, n. 1, p. 97, doi. 10.1080/00150190390204178
- Mamin, R.F.;
- Migachev, S.A.;
- Sadykov, M.F.;
- Zverev, D.O.
- Article
48
- Ferroelectrics, 2002, v. 278, n. 1, p. 177, doi. 10.1080/00150190214482
- Beresnev, Leonid;
- Vorontsov, Mikhail;
- Gowens, John
- Article
49
- Sensors & Materials, 2017, v. 29, n. 3, p. 311, doi. 10.18494/SAM.2017.1443
- Fumiya Sato;
- Kenta Takahashi;
- Takashi Abe;
- Masanori Okuyama;
- Haruo Noma;
- Masayuki Sohgawa
- Article
50
- Israel Journal of Chemistry, 2008, v. 48, n. 1, p. 9, doi. 10.1560/IJC.48.1.9
- Sakran, Fadi;
- Golosovsky, Michael;
- Davidov, Dan
- Article