Works matching DE "PHOTOCONDUCTING devices"
1
- Advanced Functional Materials, 2017, v. 27, n. 6, p. n/a, doi. 10.1002/adfm.201770034
- Article
2
- Advanced Functional Materials, 2016, v. 26, n. 33, p. 6084, doi. 10.1002/adfm.201601346
- Gong, Fan;
- Luo, Wenjin;
- Wang, Jianlu;
- Wang, Peng;
- Fang, Hehai;
- Zheng, Dingshan;
- Guo, Nan;
- Wang, Jingli;
- Luo, Man;
- Ho, Johnny C.;
- Chen, Xiaoshuang;
- Lu, Wei;
- Liao, Lei;
- Hu, Weida
- Article
3
- Advanced Functional Materials, 2014, v. 24, n. 13, p. 1820, doi. 10.1002/adfm.201470083
- Li, Zejun;
- Hu, Zhenpeng;
- Peng, Jing;
- Wu, Changzheng;
- Yang, Yuchen;
- Feng, Feng;
- Gao, Peng;
- Yang, Jinlong;
- Xie, Yi
- Article
4
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 19, p. 16880, doi. 10.1007/s10854-018-9783-8
- Wageh, S.;
- Karabulut, Abdulkerim;
- Dere, A.;
- Al-Sehemi, Abdullah G.;
- Al-Ghamdi, Ahmed A.;
- El-Tantawy, Farid;
- Yakuphanoglu, F.
- Article
5
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 10, p. 3694, doi. 10.1007/s10854-013-1305-0
- Motevalizadeh, L.;
- Khorshidifar, M.;
- Ebrahimizadeh Abrishami, M.;
- Bagheri Mohagheghi, M.
- Article
6
- Electronics Letters (Wiley-Blackwell), 2019, v. 55, n. 4, p. 216, doi. 10.1049/el.2018.8035
- Yansong Hou;
- Cunzhi Sun;
- Junkang Wu;
- Rongdun Hong;
- Jiafa Cai;
- Xiaping Chen;
- Dingqu Lin;
- Zhengyun Wu
- Article
7
- Electronics Letters (Wiley-Blackwell), 2017, v. 53, n. 3, p. 175, doi. 10.1049/el.2016.3409
- Frigo, N. J.;
- Hutchinson, M. N.;
- Williams, C. R. S.
- Article
8
- International Journal of Metrology & Quality Engineering, 2018, v. 9, p. 1, doi. 10.1051/ijmqe/2018015
- Bardalen, Eivind;
- Karlsen, Bjørnar;
- Malmbekk, Helge;
- Akram, Muhammed Nadeem;
- Ohlckers, Per
- Article
9
- Pharmacognosy Magazine, 2016, v. 12, p. S159, doi. 10.4103/0973-1296.182173
- Shukla, Pushpendra Kumar;
- Misra, Ankita;
- Srivastava, Sharad;
- Rawat, Ajay K. S.
- Article
10
- Technical Physics, 2018, v. 63, n. 2, p. 226, doi. 10.1134/S1063784218020172
- Il'inskaya, N. D.;
- Karandashev, S. A.;
- Lavrov, A. A.;
- Matveev, B. A.;
- Remennyi, M. A.;
- Stus, N. M.;
- Usikova, A. A.
- Article
11
- Electronics Letters (Wiley-Blackwell), 2016, v. 52, n. 17, p. 1474, doi. 10.1049/el.2016.2025
- Mingkun Zhang;
- Wang, Kang L.;
- Hexin Jiang;
- Rongdun Hong;
- Zhengyun Wu
- Article
12
- Optical Engineering, 2014, v. 53, n. 8, p. 1, doi. 10.1117/1.OE.53.8.087103
- Swoboda, Robert;
- Schneider-Hornstein, Kerstin;
- Wille, Holger;
- Langguth, Gernot;
- Zimmermann, Horst
- Article
13
- Optical Engineering, 2012, v. 51, n. 3, p. 036401-1, doi. 10.1117/1.OE.51.3.036401
- Yongguo Chen;
- Weida Hu;
- Xiaoshuang Chen;
- Zhenhua Ye;
- Jun Wang;
- Xiaofang Wang;
- Chenhui Yu;
- Wei Lu
- Article
14
- Sensors (14248220), 2015, v. 15, n. 7, p. 17483, doi. 10.3390/s150717483
- Porrazzo, Ryan;
- Lydecker, Leigh;
- Gattu, Suhasini;
- Bakhru, Hassaram;
- Tokranova, Natalya;
- Castracane, James
- Article
15
- Advanced Functional Materials, 2018, v. 28, n. 40, p. 1, doi. 10.1002/adfm.201802572
- Nguyen, Van Tu;
- Yim, Woongbin;
- Park, Sae June;
- Son, Byung Hee;
- Kim, Young Chul;
- Cao, Thi Thanh;
- Sim, Yumin;
- Moon, Yoon‐Jong;
- Nguyen, Van Chuc;
- Seong, Maeng‐Je;
- Kim, Sun‐Kyung;
- Ahn, Yeong Hwan;
- Lee, Soonil;
- Park, Ji‐Yong
- Article
16
- IET Optoelectronics (Wiley-Blackwell), 2017, v. 11, n. 2, p. 53, doi. 10.1049/iet-opt.2016.0055
- Wang, Yuekun;
- Kostakis, Ioannis;
- Saeedkia, Daryoosh;
- Missous, Mohamed
- Article
17
- IET Optoelectronics (Wiley-Blackwell), 2017, v. 11, n. 2, p. 49, doi. 10.1049/iet-opt.2016.0054
- Gwaro, Jared O.;
- Brenner, Carsten;
- Sumpf, Bernd;
- Klehr, Andreas;
- Fricke, Jörg;
- Hofmann, Martin R.
- Article
18
- IET Optoelectronics (Wiley-Blackwell), 2014, v. 8, n. 2, p. 33, doi. 10.1049/iet-opt.2013.0057
- Kostakis, Ioannis;
- Saeedkia, Daryoosh;
- Missous, Mohamed
- Article
19
- Advanced Electronic Materials, 2019, v. 5, n. 1, p. N.PAG, doi. 10.1002/aelm.201800538
- Guan, Xinwei;
- Wang, Zhenwei;
- Hota, Mrinal K.;
- Alshareef, Husam N.;
- Wu, Tom
- Article
20
- Advanced Electronic Materials, 2016, v. 2, n. 12, p. 1, doi. 10.1002/aelm.201600264
- Nam, Sungho;
- Han, Hyemi;
- Seo, Jooyeok;
- Song, Myeonghun;
- Kim, Hwajeong;
- Anthopoulos, Thomas D.;
- McCulloch, Iain;
- Bradley, Donal D. C.;
- Kim, Youngkyoo
- Article
21
- Przegląd Elektrotechniczny, 2017, v. 93, n. 3, p. 83, doi. 10.15199/48.2017.03.20
- KUCHERUK, Volodymyr;
- PALAMARCHUK, Evgen;
- KULAKOV, Pavel;
- STOROZHUK, Natalia;
- WÓJCIK, Waldemar;
- ZHASSANDYKYZY, Maral
- Article
22
- Sensors & Materials, 2016, v. 28, n. 9, p. 1053, doi. 10.18494/sam.2016.1394
- Hau-Wei Lee;
- Te-Ping Chiu;
- Chien-Hung Liu
- Article
23
- Revista Ingeniería e Investigación, 2015, v. 35, n. 1, p. 60, doi. 10.15446/ing.investig.v35n1.45310
- Article
24
- Materials (1996-1944), 2018, v. 11, n. 10, p. 1794, doi. 10.3390/ma11101794
- Weatherley, Thomas F. K.;
- Massabuau, Fabien C.-P.;
- Kappers, Menno J.;
- Oliver, Rachel A.
- Article
25
- Materials (1996-1944), 2017, v. 10, n. 2, p. 126, doi. 10.3390/ma10020126
- Jyun-Yi Li;
- Sheng-Po Chang;
- Ming-Hung Hsu;
- Shoou-Jinn Chang
- Article
26
- Journal of Chromatographic Science, 2016, v. 54, n. 5, p. 706, doi. 10.1093/chromsci/bmv242
- Meiling Zhang;
- Cui Zhao;
- Xianrui Liang;
- Yin Ying;
- Bing Han;
- Bo Yang;
- Cheng Jiang
- Article
27
- Sensors (14248220), 2017, v. 17, n. 12, p. 2867, doi. 10.3390/s17122867
- Malinowski, Pawel E.;
- Georgitzikis, Epimitheas;
- Maes, Jorick;
- Vamvaka, Ioanna;
- Frazzica, Fortunato;
- Van Olmen, Jan;
- De Moor, Piet;
- Heremans, Paul;
- Hens, Zeger;
- Cheyns, David
- Article
28
- Sensors (14248220), 2017, v. 17, n. 12, p. 2841, doi. 10.3390/s17122841
- Stevens, Eric G.;
- Clayhold, Jeffrey A.;
- Doan, Hung;
- Fabinski, Robert P.;
- Hynecek, Jaroslav;
- Kosman, Stephen L.;
- Parks, Christopher
- Article
29
- Sensors (14248220), 2017, v. 17, n. 8, p. 1774, doi. 10.3390/s17081774
- Min Seok Kim;
- Gil Ju Lee;
- Hyun Myung Kim;
- Young Min Song
- Article
30
- Applied Computational Electromagnetics Society Journal, 2016, v. 31, n. 5, p. 537
- Khorshidi, Mohammadreza;
- Dadashzadeh, Gholamreza
- Article
31
- Journal of Communications Technology & Electronics, 2016, v. 61, n. 3, p. 328, doi. 10.1134/S1064226916030074
- Article
32
- Journal of Communications Technology & Electronics, 2016, v. 61, n. 3, p. 352, doi. 10.1134/S1064226916030165
- Selyakov, A.;
- Burlakov, I.;
- Filachev, A.
- Article
33
- Journal of Analytical Chemistry, 2016, v. 71, n. 7, p. 717, doi. 10.1134/S1061934816070078
- Drobyshev, A.;
- Ryadchikova, N.;
- Savinov, S.
- Article
34
- Scientific Reports, 2015, p. 16457, doi. 10.1038/srep16457
- Han, Hyemi;
- Nam, Sungho;
- Seo, Jooyeok;
- Lee, Chulyeon;
- Kim, Hwajeong;
- Bradley, Donal D. C.;
- Ha, Chang-Sik;
- Kim, Youngkyoo
- Article
35
- Physica Status Solidi. A: Applications & Materials Science, 2016, v. 213, n. 4, p. 925, doi. 10.1002/pssa.201532556
- Kleinow, P.;
- Rutz, F.;
- Aidam, R.;
- Bronner, W.;
- Heussen, H.;
- Walther, M.
- Article
36
- Physica Status Solidi. A: Applications & Materials Science, 2013, v. 210, n. 12, p. 2674, doi. 10.1002/pssa.201329366
- Fukuda, Takeshi;
- Kimura, Sho;
- Kobayashi, Ryohei;
- Furube, Akihiro
- Article
37
- Surface Review & Letters, 2018, v. 25, n. 2, p. -1, doi. 10.1142/S0218625X18500579
- YU, GENYUAN;
- FENG, LISHA;
- MENG, LU;
- YE, ZHIZHEN;
- LU, JIANGUO
- Article
38
- Semiconductors, 2018, v. 52, n. 6, p. 797, doi. 10.1134/S1063782618060064
- Ivanova, M. M.;
- Kachemtsev, A. N.;
- Mikhaylov, A. N.;
- Filatov, D. O.;
- Gorshkov, A. P.;
- Volkova, N. S.;
- Chalkov, V. Yu.;
- Shengurov, V. G.
- Article
39
- Semiconductors, 2016, v. 50, n. 5, p. 646, doi. 10.1134/S1063782616050122
- Il'inskaya, N.;
- Karandashev, S.;
- Karpukhina, N.;
- Lavrov, A.;
- Matveev, B.;
- Remennyi, M.;
- Stus, N.;
- Usikova, A.
- Article
40
- Journal of Electronic Materials, 2018, v. 47, n. 8, p. 4385, doi. 10.1007/s11664-018-6365-8
- Abe, Tomoki;
- Uchida, Shigeto;
- Tanaka, Keita;
- Fujisawa, Takanobu;
- Kasada, Hirofumi;
- Ando, Koshi;
- Akaiwa, Kazuaki;
- Ichino, Kunio
- Article
41
- Journal of Electronic Materials, 2017, v. 46, n. 7, p. 4119, doi. 10.1007/s11664-017-5317-z
- Yoon, Im;
- Cho, Hak;
- Cho, Hoon;
- Kwak, Dong;
- Lee, Sejoon
- Article
42
- Journal of Electronic Materials, 2016, v. 45, n. 9, p. 4640, doi. 10.1007/s11664-016-4466-9
- Qiao, H.;
- Hu, W.;
- Li, T.;
- Li, X.;
- Chang, Y.
- Article
43
- Journal of Electronic Materials, 2016, v. 45, n. 2, p. 1073, doi. 10.1007/s11664-015-4289-0
- Yu, Naisen;
- Dong, Dapeng;
- Qi, Yan;
- Wu, Yunfeng;
- Chen, Lu
- Article
44
- Journal of Electronic Materials, 2015, v. 44, n. 11, p. 4187, doi. 10.1007/s11664-015-3975-2
- Grzesik, Michael;
- Bailey, Robert;
- Mahan, Joe;
- Ampe, Jim
- Article
45
- Journal of Electronic Materials, 2015, v. 44, n. 9, p. 3163, doi. 10.1007/s11664-015-3858-6
- Pawluczyk, J.;
- Piotrowski, J.;
- Pusz, W.;
- Koźniewski, A.;
- Orman, Z.;
- Gawron, W.;
- Piotrowski, A.
- Article
46
- Journal of Electronic Materials, 2013, v. 42, n. 5, p. 854, doi. 10.1007/s11664-013-2537-8
- Suvarna, Puneet;
- Tungare, Mihir;
- Leathersich, Jeffrey;
- Agnihotri, Pratik;
- Shahedipour-Sandvik, F.;
- Douglas Bell, L.;
- Nikzad, Shouleh
- Article
47
- Acta Chromatographica, 2017, v. 29, n. 2, p. 279, doi. 10.1556/1326.2017.29.2.12
- MEI-XIA ZHU;
- SHENG-NAN LI;
- HAI-DAN YOU;
- BIN HAN;
- ZHI-PING WANG;
- YAN-XI HU;
- JIN LI;
- YU-FENG LIU
- Article