Works matching DE "PHASED array antennas"
1
- Journal of Materials Science: Materials in Electronics, 2007, v. 18, n. 9, p. 985, doi. 10.1007/s10854-006-9094-3
- Chunxia Yang;
- Hongqing Zhou;
- Min Liu;
- Tai Qiu
- Article
2
- 2019
- Kirss, Jaan;
- Huhtinen, Heikki;
- Niskanen, Eini;
- Ruohonen, Jyrki;
- Kallio-Packalen, Marja;
- Victorzon, Sarita;
- Victorzon, Mikael;
- Pinta, Tarja;
- Kirss, Jaan Jr
- journal article
3
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 8, p. 868, doi. 10.1134/S1061830924602083
- Ma, Lijun;
- Wu, Juncen;
- Liu, Yu;
- Zhou, Shijian;
- Li, Xiongbing
- Article
4
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 5, p. 471, doi. 10.1134/S1061830924700645
- Bazulin, A. E.;
- Bazulin, E. G.;
- Vopilkin, A. Kh.;
- Kokolev, S. A.;
- Romashkin, S. V.;
- Tikhonov, D. S.
- Article
5
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 4, p. 415, doi. 10.1134/S1061830924600138
- He, Xu;
- Jiang, Xiaobin;
- Mo, Runyang;
- Guo, Jianzhong
- Article
6
- Russian Journal of Nondestructive Testing, 2024, v. 60, n. 3, p. 249, doi. 10.1134/S1061830924700621
- Bazulin, A. E.;
- Bazulin, E. G.;
- Vopilkin, A. Kh.;
- Kokolev, S. A.;
- Romashkin, S. V.;
- Tikhonov, D. S.;
- Efimovskaya, A. A.
- Article
7
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 12, p. 161, doi. 10.1134/S1061830922600642
- Li, Junhan;
- Wang, Shaofeng;
- Mao, Xin;
- Liu, Wenjing;
- Wang, Hailing;
- Zhou, Shengrong
- Article
8
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 3, p. 346, doi. 10.1134/S1061830922601118
- Liu, Zhiping;
- Zhang, Zhiwu;
- Lyu, Duo;
- Zhou, Yongli;
- Hu, Hongwei
- Article
9
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 3, p. 320, doi. 10.1134/S106183092260112X
- Xu, Qian;
- Yang, Xianming;
- Ma, Xiangdong;
- Chu, Jianbo;
- Hu, Binding;
- Wang, Haitao
- Article
10
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 2, p. 161, doi. 10.1134/S1061830922600642
- Li, Junhan;
- Wang, Shaofeng;
- Mao, Xin;
- Liu, Wenjing;
- Wang, Hailing;
- Zhou, Shengrong
- Article
11
- Russian Journal of Nondestructive Testing, 2023, v. 59, n. 1, p. 40, doi. 10.1134/S1061830922600678
- Ali, Ahmed Jawwad;
- Jellani, Adil;
- Wadood, Abdul;
- Hussain, Syed Wilayat
- Article
12
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 12, p. 1079, doi. 10.1134/S1061830922600757
- Lyu, Duo;
- Hu, Hongwei;
- Shen, Xiaowei;
- Li, Xiongbing;
- Wang, Xianghong
- Article
13
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 7, p. 537, doi. 10.1134/S1061830922070051
- Bazulin, E. G.;
- Evseev, I. V.
- Article
14
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 6, p. 444, doi. 10.1134/S1061830922060043
- Dong, Huang Huan;
- Jie, Qian Sheng;
- Xiang, Shen Zheng;
- Du, Wang;
- Yue, Chen Ding;
- Qiang, Wang
- Article
15
- Russian Journal of Nondestructive Testing, 2022, v. 58, n. 5, p. 355, doi. 10.1134/S1061830922050060
- Xu, Qian;
- Wang, Haitao;
- Tian, Guiyun;
- Li, Xin;
- Hu, Binding;
- Huang, Dehai;
- Chu, Jianbo;
- Yang, Xianming
- Article
16
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 9, p. 762, doi. 10.1134/S1061830921090084
- Ranjbar Naserabadi, M. J.;
- Sina Sodagar
- Article
17
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 9, p. 739, doi. 10.1134/S1061830921090023
- Bazulin, A. E.;
- Bazulin, E. G.;
- Vopilkin, A. Kh.;
- Tikhonov, D. S.
- Article
18
- Russian Journal of Nondestructive Testing, 2021, v. 57, n. 6, p. 423, doi. 10.1134/S1061830921060048
- Bazulin, E. G.;
- Evseev, I. V.
- Article
19
- Russian Journal of Nondestructive Testing, 2020, v. 56, n. 7, p. 566, doi. 10.1134/S1061830920070086
- Qiang Wang;
- Zhu, Kai;
- Wu, Linlin;
- Li, Haihang;
- Xu, Xiaomeng;
- Gong, Sifan
- Article
20
- Russian Journal of Nondestructive Testing, 2020, v. 56, n. 6, p. 479, doi. 10.1134/S1061830920060029
- Benammar Abdessalem;
- Chibane Farid
- Article
21
- Russian Journal of Nondestructive Testing, 2020, v. 56, n. 4, p. 340, doi. 10.1134/S1061830920040099
- Yakun Shi;
- Li, Xiaohong;
- Zhang, Jun
- Article
22
- Russian Journal of Nondestructive Testing, 2019, v. 55, n. 7, p. 499, doi. 10.1134/S1061830919070040
- Dolmatov, D. O.;
- Sednev, D. A.;
- Bulavinov, A. N.;
- Pinchuk, R. V.
- Article
23
- Russian Journal of Nondestructive Testing, 2018, v. 54, n. 4, p. 232, doi. 10.1134/S1061830918040058
- Dolmatov, D. O.;
- Demyanyuk, D. G.;
- Sednev, D. A.;
- Pinchuk, R. V.
- Article
24
- Russian Journal of Nondestructive Testing, 2018, v. 54, n. 4, p. 223, doi. 10.1134/S106183091804006X
- Kartashev, V. G.;
- Kachanov, V. K.;
- Sokolov, I. V.;
- Kontsov, R. V.;
- Fadin, A. S.
- Article
25
- Russian Journal of Nondestructive Testing, 2017, v. 53, n. 12, p. 839, doi. 10.1134/S106183091712004X
- Mirchev, Y. N.;
- Chukachev, P. H.;
- Mihovski, M. M.
- Article
26
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 12, p. 728, doi. 10.1134/S1061830913120061
- Murav'eva, O. V.;
- Myshkin, A. V.
- Article
27
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 7, p. 404, doi. 10.1134/S1061830913070024
- Article
28
- Russian Journal of Nondestructive Testing, 2013, v. 49, n. 6, p. 301, doi. 10.1134/S1061830913060053
- Nemytova, O.;
- Rinkevich, A.;
- Perov, D.
- Article
29
- Russian Journal of Nondestructive Testing, 2011, v. 47, n. 6, p. 381, doi. 10.1134/S1061830911060052
- Article
30
- Russian Journal of Nondestructive Testing, 2011, v. 47, n. 1, p. 45, doi. 10.1134/S1061830911010049
- Article
31
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 10, p. 754, doi. 10.1134/S1061830910100050
- Article
32
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 7, p. 475, doi. 10.1134/S1061830910070016
- Article
33
- Russian Journal of Nondestructive Testing, 2010, v. 46, n. 5, p. 342, doi. 10.1134/S1061830910050050
- Kachanov, V.;
- Sokolov, I.;
- Timofeev, D.;
- Turkin, M.;
- Shalimova, E.
- Article
34
- Measurement Techniques, 2021, v. 64, n. 2, p. 119, doi. 10.1007/s11018-021-01905-5
- Gusenitsa, Ya. N.;
- Snegirev, A. L.;
- Pokotilo, S. A.
- Article
35
- Measurement Techniques, 2014, v. 57, n. 1, p. 87, doi. 10.1007/s11018-014-0412-5
- Article
36
- Noise Notes, 2011, v. 10, n. 1, p. 39, doi. 10.1260/1475-4738.10.1.39
- Article
37
- Noise & Vibration Worldwide, 2022, v. 53, n. 9/10, p. 417, doi. 10.1177/09574565221136901
- Article
38
- Indian Journal of Veterinary Sciences & Biotechnology, 2024, v. 20, n. 2, p. 28
- Mohandas, Sonaa;
- Unny, Madhavan;
- Yesudas, Ajith;
- George, Arun;
- Philip, Laiju M.
- Article
39
- Journal of Test & Measurement Technology, 2022, v. 36, n. 3, p. 260, doi. 10.3969/j.issn.1671-7449.2022.03.013
- Article
40
- International Review of Applied Sciences & Engineering, 2021, v. 12, n. 2, p. 119, doi. 10.1556/1848.2020.00187
- Benzeroual, Hajar;
- Khamlichi, Abdellatif;
- Zakriti, Alia
- Article
41
- International Review of Applied Sciences & Engineering, 2020, v. 11, n. 2, p. 147, doi. 10.1556/1848.2020.20022
- Achbal, Mariam;
- Khamlichi, Abdellatif;
- El Khannoussi, Fadoua
- Article
42
- Electronics (2079-9292), 2025, v. 14, n. 11, p. 2114, doi. 10.3390/electronics14112114
- Zhang, Xu;
- Sun, Guohao;
- Li, Dingkang;
- Liu, Zhengyang;
- Ji, Yuandong
- Article
43
- Electronics (2079-9292), 2025, v. 14, n. 7, p. 1308, doi. 10.3390/electronics14071308
- Tubbal, Faisel;
- Matekovits, Ladislau;
- Raad, Raad
- Article
44
- Electronics (2079-9292), 2025, v. 14, n. 4, p. 807, doi. 10.3390/electronics14040807
- Maxia, Paolo;
- Casula, Giovanni Andrea;
- Navarrini, Alessandro;
- Pisanu, Tonino;
- Valente, Giuseppe;
- Muntoni, Giacomo;
- Montisci, Giorgio
- Article
45
- Electronics (2079-9292), 2025, v. 14, n. 4, p. 754, doi. 10.3390/electronics14040754
- Saeidi, Tale;
- Karamzadeh, Saeid
- Article
46
- Electronics (2079-9292), 2025, v. 14, n. 2, p. 387, doi. 10.3390/electronics14020387
- Xiao, Yuanming;
- He, Lianxing;
- Wei, Xiaoli
- Article
47
- Electronics (2079-9292), 2025, v. 14, n. 2, p. 322, doi. 10.3390/electronics14020322
- Sun, Sicheng;
- Zhao, Yijiu;
- Mei, Sitao;
- Zhou, Naixin;
- Ban, Yongling
- Article
48
- Electronics (2079-9292), 2024, v. 13, n. 21, p. 4282, doi. 10.3390/electronics13214282
- Wang, Yingshu;
- Zhang, Juanjuan;
- Yuan, Shu;
- Ren, Weizhi;
- Wang, Jilin;
- Wang, Hongwei
- Article
49
- Electronics (2079-9292), 2024, v. 13, n. 16, p. 3328, doi. 10.3390/electronics13163328
- Yuan, Guishan;
- Guo, Sai;
- Wang, Kan;
- Xu, Jiawen
- Article
50
- Electronics (2079-9292), 2024, v. 13, n. 16, p. 3119, doi. 10.3390/electronics13163119
- Lee, Woncheol;
- Won, Hoyun;
- Hong, Yang-Ki;
- Choi, Minyeong;
- An, Sung-Yong
- Article