Works matching DE "PERMITTIVITY measurement"
1
- Applied Physics A: Materials Science & Processing, 2025, v. 131, n. 5, p. 1, doi. 10.1007/s00339-025-08477-z
- Sadou, Hakim;
- Hacib, Tarik;
- Le Bihan, Yann;
- Meyer, Olivier;
- Acikgoz, Hulusi
- Article
2
- Russian Physics Journal, 2025, v. 68, n. 2, p. 282, doi. 10.1007/s11182-025-03430-2
- Priputnev, P. V.;
- Klimov, A. I.;
- Kokin, D. S.
- Article
3
- Annals of Glaciology, 2024, v. 65, p. 1, doi. 10.1017/aog.2024.38
- Hernández-Macià, Ferran;
- Gabarró, Carolina;
- Huntemann, Marcus;
- Naderpour, Reza;
- Johnson, Joel T.;
- Jezek, Kenneth C.
- Article
5
- Propellants, Explosives, Pyrotechnics, 2019, v. 44, n. 2, p. 117, doi. 10.1002/prep.201980201
- Rougier, Benoit;
- Lefrançois, Alexandre;
- Chuzeville, Vincent;
- Poeuf, Sandra;
- Aubert, Hervé
- Article
6
- Propellants, Explosives, Pyrotechnics, 2019, v. 44, n. 2, p. 153, doi. 10.1002/prep.201800097
- Rougier, Benoit;
- Lefrançois, Alexandre;
- Chuzeville, Vincent;
- Poeuf, Sandra;
- Aubert, Hervé
- Article
7
- Propellants, Explosives, Pyrotechnics, 2013, v. 38, n. 6, p. 810, doi. 10.1002/prep.201300068
- Daily, Megan E.;
- Glover, Brian B.;
- Son, Steven F.;
- Groven, Lori J.
- Article
8
- Journal of Materials Science: Materials in Electronics, 2022, v. 33, n. 8, p. 4974, doi. 10.1007/s10854-021-07686-5
- Kasagi, Teruhiro;
- Yamamoto, Shinichiro
- Article
9
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 15, p. 20625, doi. 10.1007/s10854-021-06572-4
- Padhy, Minakshi;
- Choudhary, R. N. P.;
- Achary, P. Ganga Raju
- Article
10
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 12, p. 16979, doi. 10.1007/s10854-021-06262-1
- Yang, Wenyi;
- Chung, D. D. L.
- Article
11
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 12, p. 16494, doi. 10.1007/s10854-021-06206-9
- Singh, Sindhu;
- Singh, Prabhakar;
- Parkash, Om;
- Kumar, Devendra
- Article
12
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 11, p. 15475, doi. 10.1007/s10854-021-06096-x
- Yan, Siyi;
- Li, Peng;
- Ju, Zhongshi;
- Chen, He;
- Ma, Jiangang
- Article
13
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 6, p. 8081, doi. 10.1007/s10854-021-05531-3
- Jena, Dipika Priyadarsini;
- Anwar, Shahid;
- Parida, R. K.;
- Parida, B. N.;
- Nayak, Nimai C.
- Article
14
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 5, p. 5936, doi. 10.1007/s10854-021-05314-w
- Bezerra Junior, M. H.;
- Abreu, T. O.;
- do Carmo, F. F.;
- de Morais, J. E. V.;
- Oliveira, R. G. M.;
- Silva, M. A. S.;
- de Andrade, H. D.;
- Queiroz Junior, I. S.;
- Mota, J. C. M.;
- Sombra, A. S. B.
- Article
15
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 1, p. 290, doi. 10.1007/s10854-020-04775-9
- Zheng, Jia;
- Fu, Qingshan;
- Chen, Xinghan;
- Chakrabarti, Chiranjib;
- Wang, Pengjian;
- Yin, Hongxia;
- Li, Canglong;
- Qiu, Yang;
- Yuan, Songliu
- Article
16
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 24, p. 22408, doi. 10.1007/s10854-020-04742-4
- Kocyigit, A.;
- Yıldız, D. E.;
- Sarılmaz, A.;
- Ozel, F.;
- Yıldırım, M.
- Article
17
- Journal of Materials Science: Materials in Electronics, 2020, v. 31, n. 12, p. 9904, doi. 10.1007/s10854-020-03535-z
- Xiong, Gang;
- Meng, Yifan;
- Li, Jianzhuang;
- Xiang, Feng
- Article
18
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 22, p. 19425, doi. 10.1007/s10854-018-0071-4
- Khatua, Deeptimayee;
- Choudhary, R. N. P.;
- Achary, P. Ganga Raju
- Article
19
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 18, p. 15994, doi. 10.1007/s10854-018-9685-9
- Xu, Ciqun;
- Qu, Yunpeng;
- Fan, Guohua;
- Xie, Peitao;
- Ren, Huan;
- Chen, Jiaqi;
- Liu, Yao;
- Wu, Yulin;
- Fan, Runhua
- Article
20
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 12, p. 10154, doi. 10.1007/s10854-018-9061-9
- Taïbi, K.;
- Si-Ahmed, F.;
- Bidault, O.;
- Millot, N.
- Article
21
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 2, p. 1246, doi. 10.1007/s10854-017-8027-7
- Qu, Yunpeng;
- Xie, Peitao;
- Fan, Guohua;
- Liu, Yao;
- Wu, Yulin;
- Zhang, Lei;
- Fan, Runhua
- Article
22
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 24, p. 19090, doi. 10.1007/s10854-017-7863-9
- Ren, Haishen;
- Xie, Tianyi;
- Dang, Mingzhao;
- Yao, Xiaogang;
- Jiang, Shaohu;
- Zhao, Xiangyu;
- Lin, Huixing;
- Luo, Lan
- Article
23
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 21, p. 15907, doi. 10.1007/s10854-017-7486-1
- Jain Ruth, D.;
- Sundarakannan, B.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 18, p. 13621, doi. 10.1007/s10854-017-7202-1
- Klygach, D.;
- Vakhitov, M.;
- Zherebtsov, D.;
- Kudryavtsev, O.;
- Knyazev, N.;
- Malkin, A.
- Article
25
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 4, p. 3474, doi. 10.1007/s10854-016-5945-8
- Luo, W.;
- Wu, Q.;
- Wu, C.;
- Yu, Y.;
- Shuai, Y.;
- Zhang, W.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 10, p. 10627, doi. 10.1007/s10854-016-5159-0
- Chen, Zhuo;
- Shan, Xinping;
- Li, Guangyao;
- Huang, Ning;
- Hao, Hua;
- Liu, Hanxing
- Article
27
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 5, p. 5233, doi. 10.1007/s10854-016-4418-4
- Kumar, Ranjit;
- Zulfequar, M.;
- Senguttuvan, T.
- Article
28
- Journal of Materials Science: Materials in Electronics, 2016, v. 27, n. 3, p. 2836, doi. 10.1007/s10854-015-4098-5
- Li, Fuyun;
- Zeng, Min;
- Yu, Hongtao;
- Xu, Hui;
- Li, Jing
- Article
29
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 5892, doi. 10.1007/s10854-015-3158-1
- Fang, Liang;
- Wei, Zhenhai;
- Guo, Huanhuan;
- Sun, Yihua;
- Tang, Ying;
- Li, Chunchun
- Article
30
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 853, doi. 10.1007/s10854-014-2474-1
- Chen, Yih-Chien;
- Weng, Min-Zhe
- Article
31
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 916, doi. 10.1007/s10854-014-2482-1
- Niu, Benben;
- Ma, Weibing;
- Li, Qiang;
- Chen, Tiankai;
- Huan, Zhengli;
- Meng, Xueyuan;
- Ma, Jianqiang
- Article
32
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 927, doi. 10.1007/s10854-014-2484-z
- Zhu, Weixin;
- Zhang, Yao;
- Yang, Yixi;
- Zhou, Dong;
- Yang, Chengtao
- Article
33
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 2, p. 998, doi. 10.1007/s10854-014-2495-9
- Cai, Haocheng;
- Li, Lingxia;
- Sun, Hao;
- Gao, Zhengdong;
- Lv, Xiaosong
- Article
34
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5218, doi. 10.1007/s10854-014-2291-6
- Paul, Biplab;
- Halder, Kumaresh;
- Roy, Debasis;
- Bagchi, Biswajoy;
- Bhattacharya, Alakananda;
- Das, Sukhen
- Article
35
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5546, doi. 10.1007/s10854-014-2342-z
- Sharma, Updesh;
- Dutta, Shankar
- Article
36
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 12, p. 5601, doi. 10.1007/s10854-014-2349-5
- Zhang, Jing;
- Wang, Lixi;
- Zhang, Qitu
- Article
37
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 4841, doi. 10.1007/s10854-014-2242-2
- Cai, Wei;
- Fu, Chunlin;
- Chen, Gang;
- Deng, Xiaoling;
- Gao, Rongli;
- Liu, Kaihua
- Article
38
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 4856, doi. 10.1007/s10854-014-2244-0
- Prasad, K.;
- Priyanka;
- AmarNath, K.;
- Chandra, K.;
- Kulkarni, A.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 11, p. 4896, doi. 10.1007/s10854-014-2250-2
- Kumar, Manish;
- Shankar, S.;
- Thakur, O.;
- Ghosh, Anup
- Article
40
- Electrical Engineering, 2020, v. 102, n. 4, p. 2481, doi. 10.1007/s00202-020-01046-y
- Stockbrügger, Jan Ole;
- Ponick, Bernd
- Article
41
- Electrical Engineering, 2020, v. 102, n. 4, p. 2381, doi. 10.1007/s00202-020-01036-0
- Stockbrügger, Jan Ole;
- Ponick, Bernd
- Article
42
- Russian Physics Journal, 2024, v. 67, n. 8, p. 1213, doi. 10.1007/s11182-024-03243-9
- Bobrov, P. P.;
- Kostychov, Yu. A.;
- Krivaltsevich, S. V.;
- Rodionova, O. V.
- Article
43
- Russian Physics Journal, 2022, v. 65, n. 7, p. 1213, doi. 10.1007/s11182-022-02753-8
- Bobrov, P. P.;
- Rodionova, O. V.
- Article
44
- High Temperature, 2017, v. 55, n. 4, p. 473, doi. 10.1134/S0018151X17040046
- Article
45
- Journal of Test & Measurement Technology, 2023, v. 37, n. 2, p. 146, doi. 10.3969/j.issn.1671-7449.2023.02.009
- Article
46
- Journal of Measurements in Engineering, 2019, v. 7, n. 4, p. 183, doi. 10.21595/jme.2019.20925
- Lountala, M. G.;
- Mbango, F. Moukanda;
- Ndagijimana, F.;
- Lilonga-Boyenga, D.
- Article
47
- Nondestructive Testing & Evaluation, 2021, v. 36, n. 2, p. 195, doi. 10.1080/10589759.2020.1714614
- Cao, Binghua;
- Li, Xiaohan;
- Wang, Mengyun;
- Fan, Mengbao
- Article
48
- Photonics, 2025, v. 12, n. 3, p. 283, doi. 10.3390/photonics12030283
- Article
49
- Photonics, 2021, v. 8, n. 10, p. 416, doi. 10.3390/photonics8100416
- Aly, Arafa H.;
- Ameen, Ayman A.;
- Mahmoud, M. A.;
- Matar, Z. S.;
- Al-Dossari, M.;
- Elsayed, Hussein A.
- Article
50
- Physica Status Solidi (B), 2017, v. 254, n. 4, p. n/a, doi. 10.1002/pssb.201600476
- Kondovych, Svitlana;
- Luk'yanchuk, Igor
- Article