Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices.Published in:Computers (2073-431X), 2017, v. 6, n. 2, p. 16, doi. 10.3390/computers6020016By:Spinelli, Alessandro S.;Compagnoni, Christian Monzio;Lacaita, Andrea L.Publication type:Article
Transparency Engineering in Quantum Dot‐Based Memories.Published in:Physica Status Solidi. A: Applications & Materials Science, 2018, v. 215, n. 13, p. 1, doi. 10.1002/pssa.201800018By:Arikan, Ismail Firat;Cottet, Nathanaël;Nowozin, Tobias;Bimberg, DieterPublication type:Article