Imaging at the Atomic Level.
- Published in:
- EE: Evaluation Engineering, 2007, v. 46, n. 12, p. 32
- By:
- Publication type:
- Article
Works matching DE "PACIFIC Nanotechnology Inc."
Results: 4
1
2
Crystal Sensor enables SPM visualization of nanoscale.
- Published in:
- Advanced Materials & Processes, 2005, v. 163, n. 4, p. 64
- Publication type:
- Article
3
Crystal scanner technology improves AFM operation.
- Published in:
- Advanced Materials & Processes, 2004, v. 162, n. 12, p. 38
- Publication type:
- Article
4
Atomic force microscope sees nanometer-size surface shapes.
- Published in:
- Advanced Materials & Processes, 2003, v. 161, n. 1, p. 19
- Publication type:
- Article