Works matching DE "OPTICAL measurement equipment"
1
- Optical Engineering, 2015, v. 54, n. 7, p. 1, doi. 10.1117/1.OE.54.7.075104
- Kalikivayi, Venkataramana;
- Chacko Pretheesh Kumar, Valiyaparambil;
- Kannan, Krithivasan;
- Ramanathan Ganesan, Angarai
- Article
2
- Ocular Surgery News, 2010, v. 28, n. 7, p. 26
- Article
3
- Insight: Non-Destructive Testing & Condition Monitoring, 2006, v. 48, n. 8, p. 510, doi. 10.1784/insi.2006.48.8.510
- Article
4
- Applied Sciences (2076-3417), 2018, v. 8, n. 12, p. 2671, doi. 10.3390/app8122671
- Wu, Nianhan;
- Zhao, Wu;
- Wang, Xin;
- Tao, Ye;
- Hou, Zhengmeng
- Article
5
- Angewandte Chemie International Edition, 2013, v. 52, n. 51, p. 13694, doi. 10.1002/anie.201306390
- Rivera_Gil, Pilar;
- Vazquez‐Vazquez, Carmen;
- Giannini, Vincenzo;
- Callao, M. Pilar;
- Parak, Wolfgang J.;
- Correa‐Duarte, Miguel A.;
- Alvarez‐Puebla, Ramon A.
- Article
6
- Measurement Techniques, 2018, v. 60, n. 12, p. 1243, doi. 10.1007/s11018-018-1347-z
- Yanushkin, V. N.;
- Melekaev, M. A.
- Article
7
- Measurement Techniques, 2013, v. 56, n. 5, p. 549, doi. 10.1007/s11018-013-0242-x
- Konopel'ko, L.;
- Sokolov, T.
- Article
8
- 2013
- Wang, Han;
- Peng, Yifan;
- Yu, Chao;
- Chen, Beishi;
- Li, Haifeng;
- Liu, Xu
- Other
9
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 17, p. 1222, doi. 10.1049/el.2014.1572
- Tokuda, T.;
- Wakama, N.;
- Terao, K.;
- Masuda, K.;
- Mori, R.;
- Noda, T.;
- Sasagawa, K.;
- Nishiyama, Y.;
- Kakiuchi, K.;
- Ohta, J.
- Article
10
- Nature Photonics, 2014, v. 8, n. 1, p. 1, doi. 10.1038/nphoton.2013.359
- Article
11
- Sensors (14248220), 2010, v. 10, n. 2, p. 4761, doi. 10.3390/s100504761
- Lourenço, Jr., Ivo de;
- Possetti, Gustavo R. C.;
- Muller, Marcia;
- Fabris, José L.
- Article
12
- Komunikácie, 2020, v. 22, n. 3, p. 78, doi. 10.26552/com.C.2020.3.78-88
- Fursenko, Antanas;
- Kilikevicius, Arturas;
- Kilikeviciene, Kristina;
- Skeivalas, Jonas;
- Kasparaitis, Albinas;
- Matijosius, Jonas;
- Wieckowski, Dariusz
- Article
13
- Advanced Materials & Processes, 2012, v. 170, n. 11, p. 8
- Article
14
- Advanced Materials & Processes, 2008, v. 166, n. 5, p. 18
- Article
15
- Sensors & Materials, 2017, v. 29, n. 4, p. 347, doi. 10.18494/SAM.2017.1513
- Jui-Chang Lin;
- Cheng-Jen Lin
- Article
16
- Materials (1996-1944), 2019, v. 12, n. 7, p. 1029, doi. 10.3390/ma12071029
- Rothe, Stefan;
- Wendt, Ellen;
- Krzywinski, Sybille;
- Halász, Marianna;
- Bakonyi, Peter;
- Tamás, Peter;
- Bojtos, Attila
- Article
17
- Metrology, 2024, v. 4, n. 2, p. 240, doi. 10.3390/metrology4020015
- Batista, Elsa;
- Alves e Sousa, João;
- Saraiva, Fernanda;
- Lopes, André;
- Silverio, Vania;
- Martins, Rui F.;
- Martins, Luis
- Article
18
- Advances in Production Engineering & Management, 2017, v. 12, n. 1, p. 88, doi. 10.14743/apem2017.1.242
- Article