Works about OPTICAL diffraction
1
- Journal of Sulfur Chemistry, 2008, v. 29, n. 3/4, p. 243, doi. 10.1080/17415990802044185
- Nakayama, Juzo;
- Hiraiwa, Suguru;
- Fujihara, Takashi
- Article
2
- Journal of Sulfur Chemistry, 2005, v. 26, n. 2, p. 111, doi. 10.1080/17415990500056788
- Mloston, Grzegorz;
- Depczynski, Robert;
- Woznicka, Marta;
- Laur, Peter;
- Englert, Ulli;
- Hu, Chunhua;
- Heimgartner, Heinz
- Article
3
- PLoS Biology, 2006, v. 4, n. 7, p. e192, doi. 10.1371/journal.pbio.0040192
- Lu, Jun;
- Machius, Mischa;
- Dulubova, Irina;
- Han Dai;
- Südhof, Thomas C.;
- Tomchick, Diana R.;
- Rizo, Josep
- Article
4
- Natural Product Research, 2004, v. 18, n. 3, p. 205, doi. 10.1080/14786410410001708990
- Tsuda, Yoshisuke;
- Atta-ur-Rahman;
- Akhtar, Muhammad Nadeem;
- Sener, Bilge;
- Parvez, Masood;
- Sashida, Yutaka;
- Mimaki, Yoshihiro;
- Mizuno, Mizuo
- Article
5
- Polymer Engineering & Science, 2006, v. 46, n. 3, p. 314, doi. 10.1002/pen.20458
- Lertwimolnun, W.;
- Vergnes, B.
- Article
6
- Polymer Engineering & Science, 2003, v. 43, n. 11, p. 1798, doi. 10.1002/pen.10152
- Wang, Weizhi;
- Wu, Qianghua;
- Qu, Baojun
- Article
7
- Polymer Engineering & Science, 1999, v. 39, n. 3, p. 406, doi. 10.1002/pen.11429
- Blanche, P.-A.;
- Lemaire, Ph. C.
- Article
8
- Surface Engineering, 2010, v. 26, n. 6, p. 469, doi. 10.1179/026708410X12506870724352
- Yin, B.;
- Zhou, H. D.;
- Yi, D. L.;
- Chen, J. M.;
- Yan, F. Y.
- Article
9
- Surface Engineering, 2010, v. 26, n. 6, p. 428, doi. 10.1179/026708409X12490360425963
- Kaur, M.;
- Singh, H.;
- Prakash, S.
- Article
10
- Surface Engineering, 2010, v. 26, n. 6, p. 491, doi. 10.1179/026708410X12593178265823
- Verdian, M. M.;
- Salehi, M.;
- Raeissi, K.
- Article
11
- Surface Engineering, 2009, v. 25, n. 8, p. 628, doi. 10.1179/174329409X397778
- Mahzoon, F.;
- Bahrololoom, M. E.;
- Javadpour, S.
- Article
12
- Surface Engineering, 2009, v. 25, n. 8, p. 621, doi. 10.1179/026708408X343573
- Article
13
- Surface Engineering, 2009, v. 25, n. 2, p. 131, doi. 10.1179/026708409X364975
- Wang, H.;
- Chen, C. Z.;
- Wang, D. G.
- Article
14
- Surface Engineering, 2006, v. 22, n. 3, p. 173, doi. 10.1179/174329406X108799
- Liu, Z. J.;
- Chen, H.;
- Liu, C.;
- Cheng, J. B.;
- Su, Y. H.;
- Liu, D.
- Article
15
- Surface Engineering, 2006, v. 22, n. 3, p. 177, doi. 10.1179/174329406X108816
- Dong, Q.;
- Chen, C. Z.;
- Wang, D. G.;
- Ji, Q. M.
- Article
16
- Surface Engineering, 2006, v. 22, n. 3, p. 212, doi. 10.1179/174329406X108843
- Constantino, M. E.;
- Campillo, B.;
- Staia, M. H.;
- Serna, S.;
- Juárez-Islas, J.;
- Sudarshan, T. S.
- Article
17
- Surface Engineering, 2005, v. 21, n. 4, p. 269, doi. 10.1179/174329405X55302
- Zhecheva, A.;
- Malinov, S.;
- Sha, W.
- Article
18
- Surface Engineering, 2003, v. 19, n. 4, p. 285, doi. 10.1179/026708403322499218
- Ratajski, J.;
- Tacikowski, J.;
- Somers, M.A.J.
- Article
19
- Surface Engineering, 2003, v. 19, n. 4, p. 292, doi. 10.1179/026708403322499227
- Staia, M.H.;
- D'Alessandria, M.;
- Cruz, M.R.;
- Castro, A.
- Article
20
- Macromolecular Chemistry & Physics, 2019, v. 220, n. 13, p. N.PAG, doi. 10.1002/macp.201970025
- Storm, Sebastian;
- Alamri, Sabri;
- Soldera, Marcos;
- Kunze, Tim;
- Lasagni, Andrés Fabián
- Article
21
- Macromolecular Chemistry & Physics, 2017, v. 218, n. 6, p. n/a, doi. 10.1002/macp.201600400
- Pirani, Federica;
- Sharma, Nityanand;
- Moreno‐Cencerrado, Alberto;
- Fossati, Stefan;
- Petri, Christian;
- Descrovi, Emiliano;
- Toca‐Herrera, José L.;
- Jonas, Ulrich;
- Dostalek, Jakub
- Article
22
- Chemistry - A European Journal, 2025, v. 31, n. 19, p. 1, doi. 10.1002/chem.202500271
- Koller, Thaddäus J.;
- Witthaut, Kristian;
- Wolf, Florian;
- Singer, Johannes N.;
- Blahusch, Jakob;
- Li, Changyong;
- Valsamidou, Vasiliki;
- Johrendt, Dirk;
- Schnick, Wolfgang
- Article
23
- Chemistry - A European Journal, 2023, v. 29, n. 69, p. 1, doi. 10.1002/chem.202302725
- Pigulski, Bartłomiej;
- Misiak, Klaudia;
- Męcik, Patrycja;
- Szafert, Sławomir
- Article
24
- Journal of Materials Science: Materials in Electronics, 2021, v. 32, n. 6, p. 6883, doi. 10.1007/s10854-021-05393-9
- Vincze, Tomas;
- Micjan, Michal;
- Pavuk, Milan;
- Novak, Patrik;
- Weis, Martin
- Article
25
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 5880, doi. 10.1007/s10854-016-6261-z
- Orak, I.;
- Kocyigit, A.;
- Aydoğan, Ş.;
- Çaldıran, Z.;
- Turut, A.
- Article
26
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 5887, doi. 10.1007/s10854-016-6262-y
- Li, Zhi-Jie;
- Shi, Gui-Mei;
- Zhao, Qian
- Article
27
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 5997, doi. 10.1007/s10854-016-6275-6
- John, Fergy;
- John, Annamma;
- Thomas, Jijimon;
- Solomon, Sam
- Article
28
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 5971, doi. 10.1007/s10854-016-6271-x
- Habibi, Mohammad;
- Shojaee, Elahe
- Article
29
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 8, p. 5979, doi. 10.1007/s10854-016-6273-8
- Article
30
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 11, p. 8568, doi. 10.1007/s10854-015-3530-1
- Krishnan, Rajagopalan;
- Thirumalai, Jagannathan;
- Mahalingam, Venkatakrishnan;
- Mantha, Srinivas
- Article
31
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 5, p. 2120, doi. 10.1007/s10854-014-1848-8
- Chen, Yih-Chien;
- Su, Chien-Fang;
- Weng, Min-Zhe;
- You, Hong-Mine;
- Chang, Kuang-Chiung
- Article
32
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 5, p. 2086, doi. 10.1007/s10854-014-1844-z
- Behera, C.;
- Choudhary, R.;
- Das, Piyush
- Article
33
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 4, p. 1620, doi. 10.1007/s10854-014-1774-9
- Barzegar Bafrooei, H.;
- Taheri Nassaj, E.;
- Ebadzadeh, T.;
- Hu, C.
- Article
34
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 3, p. 896, doi. 10.1007/s10854-012-0846-y
- Turkoz, M.;
- Nezir, S.;
- Terzioglu, C.;
- Varilci, A.;
- Yildirim, G.
- Article
35
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 3, p. 1045, doi. 10.1007/s10854-012-0875-6
- Deepthi, K.;
- Pandiyarajan, T.;
- Karthikeyan, B.
- Article
36
- Journal of Materials Science: Materials in Electronics, 2012, v. 23, n. 3, p. 712, doi. 10.1007/s10854-011-0477-8
- Abbasov, Mikail;
- Carlisle, Gene
- Article
37
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 8, p. 1060, doi. 10.1007/s10854-010-0259-8
- Pascuta, Petru;
- Culea, Eugen
- Article
38
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 7, p. 854, doi. 10.1007/s10854-010-0225-5
- Ashok Kumar, A.;
- Janardhanam, V.;
- Rajagopal Reddy, V.
- Article
39
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 9, p. 897, doi. 10.1007/s10854-009-0013-2
- Ping Fan;
- Guang-Xing Liang;
- Zhuang-Hao Zheng;
- Xing-Min Cai;
- Dong-Ping Zhang
- Article
40
- Journal of Materials Science: Materials in Electronics, 2010, v. 21, n. 8, p. 804, doi. 10.1007/s10854-009-9996-y
- Reddy, M. Bhaskar;
- Janardhanam, V.;
- Kumar, A. Ashok;
- Reddy, V. Rajagopal;
- Reddy, P. Narasimha;
- Chel-Jong Choi;
- Ranju Jung;
- Sung Hur
- Article
41
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 782, doi. 10.1007/s10854-008-9802-2
- Pavlović, M.;
- Jovalekić, Č.;
- Nikolić, A. S.;
- Manojlović, D.;
- Šojić, N.
- Article
42
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 704, doi. 10.1007/s10854-008-9788-9
- Hyun Ho Shin;
- Yang Hee Joung;
- Seong Jun Kang
- Article
43
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 776, doi. 10.1007/s10854-008-9801-3
- Hankare, P. P.;
- Chate, P. A.;
- Sathe, D. J.;
- Patil, A. A.
- Article
44
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 745, doi. 10.1007/s10854-008-9797-8
- Shukla, Archana;
- Choudhary, R. N. P.;
- Thakur, A. K.
- Article
45
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 380, doi. 10.1007/s10854-008-9631-3
- Jihua Zhang;
- Saravanamuttu, Kalaichelvi
- Article
46
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 395, doi. 10.1007/s10854-008-9639-8
- Article
47
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 416, doi. 10.1007/s10854-008-9659-4
- Baryshev, A. V.;
- Khanikaev, A. B.;
- Fujikawa, R.;
- Uchida, H.;
- Inoue, M.
- Article
48
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 216, doi. 10.1007/s10854-007-9544-6
- John, Beena Mary;
- Joseph, Rani;
- Sreekumar, K. Sudha;
- Kartha, C.
- Article
49
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 207, doi. 10.1007/s10854-007-9539-3
- Ho, C. H.;
- Wang, S. T.;
- Huang, Y. S.;
- Tiong, K. K.
- Article
50
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 198, doi. 10.1007/s10854-007-9537-5
- Kotakonda, Pavani;
- Naydenova, Izabela;
- Howard, Robert;
- Martin, Suzanne;
- Toal, Vincent
- Article