Works matching DE "OPTICAL aberrations"

Results: 919

A computer study to simulate a magnetic objective lens and analyze the effect of the distance between pole pieces on its focal properties.

Published in:

Russian Physics Journal, 2025, v. 68, n. 4, p. 651, doi. 10.1007/s11182-025-03478-0

By:

Hussein, Mohammed Abdullah

Publication type:

Article

Computational Adaptive Optics for HAR Hybrid Trench Array Topography Measurement by Utilizing Coherence Scanning Interferometry.

Published in:

Sensors (14248220), 2025, v. 25, n. 13, p. 4085, doi. 10.3390/s25134085

By:

Qiao, Wenyou;
Gao, Zhishan;
Yuan, Qun;
Chen, Lu;
Guo, Zhenyan;
Huo, Xiao;
Wang, Qian

Publication type:

Article

The long-term effects of interface irrigation on visual outcomes and corneal aberrations in Small Incision Lenticule Extraction (SMILE).

Published in:

Indian Journal of Ophthalmology, 2025, v. 73, n. 7, p. 1005, doi. 10.4103/IJO.IJO_1856_24

By:

Ahmet, Sibel;
Kocamaz, Murat;
Sarı, Cem;
Kırgız, Ahmet;
Yıldırım, Yusuf;
Taşkapılı, Muhittin

Publication type:

Article

PIABC: Point Spread Function Interpolative Aberration Correction.

Published in:

Sensors (14248220), 2025, v. 25, n. 12, p. 3773, doi. 10.3390/s25123773

By:

Cho, Chanhyeong;
Kim, Chanyoung;
Sull, Sanghoon

Publication type:

Article

Automatic and Quantitative Measurement of Spectrometer Aberrations.

Published in:

Microscopy & Microanalysis, 2023, v. 29, n. 5, p. 1671, doi. 10.1093/micmic/ozad084

By:

Guo, Yueming;
Lupini, Andrew R

Publication type:

Article

Ronchigram Simulation and Aberration Correction Training using Ronchigram.com.

Published in:

2023

By:

Millsaps, William;
Sung, Suk Hyun;
Schnitzer, Noah;
Kourkoutis, Lena F;
Hovden, Robert

Publication type:

Abstract

High-Resolution Composition Wave Characterization in Cu-Ti Alloys using Aberration Corrected STEM.

Published in:

2023

By:

Sawant, Ronit;
Yang, Shize;
Carpenter, R W

Publication type:

Abstract

Sub-Å STEM Resolution From 30-300kV.

Published in:

2019

By:

Bischoff, Maarten;
Niestadt, Marcel;
Altin, Veli;
Henstra, Alexander;
Tiemeijer, Peter;
Freitag, Bert;
Maunders, Christian;
Hartel, Peter;
Van Cappellen, Eric

Publication type:

Abstract

S9000X - Next Generation of Ultra-High Resolution SEM for Enhanced Analysis and Xe Plasma FIB for Ultra-Fast and Gentle Sputtering.

Published in:

2019

By:

Havelka, Miloslav;
Jiruse, Jaroslav;
Hrncif, Tomas;
Jan Polster;
Vana, Rostislav;
Zachej, Samuel

Publication type:

Abstract

Spherical Aberration Correction for SEMs with Electrostatic-type Compact Cs-corrector.

Published in:

Microscopy & Microanalysis, 2019, p. 152, doi. 10.1017/S1431927618001253

By:

Kawasaki, Tadahiro;
Yoshida, Ryuji;
Kato, Takeharu;
Nomaguchi, Tsunenori;
Motomura, Shunichi;
Nishinaka, Kenichi;
Agemura, Toshihide;
Tomita, Masahiro;
Ikuta, Takashi

Publication type:

Article

Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun.

Published in:

Microscopy & Microanalysis, 2019, p. 128, doi. 10.1017/S1431927618001137

By:

Hashiguchi, Hiroki;
Sagawa, Ryusuke;
Okunishi, Eiji;
Endo, Noriaki;
Kondo, Yukihito

Publication type:

Article

Cs-Corrected Scanning Transmission Electron Microscopy Investigation of Dislocation Core Configurations at a SrTiO3/MgO Heterogeneous Interface.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 3, p. 706, doi. 10.1017/S1431927613000408

By:

Zhu, Yuanyuan;
Song, Chengyu;
Minor, Andrew M.;
Wang, Haiyan

Publication type:

Article

A (S)TEM Gas Cell Holder with Localized Laser Heating for In Situ Experiments.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 2, p. 470, doi. 10.1017/S1431927612014419

By:

Mehraeen, Shareghe;
McKeown, Joseph T.;
Deshmukh, Pushkarraj V.;
Evans, James E.;
Abellan, Patricia;
Xu, Pinghong;
Reed, Bryan W.;
Taheri, Mitra L.;
Fischione, Paul E.;
Browning, Nigel D.

Publication type:

Article

Atomic-Scale Measurement of Structure and Chemistry of a Single-Unit-Cell Layer of LaAlO3 Embedded in SrTiO3.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 2, p. 310, doi. 10.1017/S1431927612014407

By:

Jia, Chun-Lin;
Barthel, Juri;
Gunkel, Felix;
Dittmann, Regina;
Hoffmann-Eifert, Susanne;
Houben, Lothar;
Lentzen, Markus;
Thust, Andreas

Publication type:

Article

Facility Implementation and Comparative Performance Evaluation of Probe-Corrected TEM/STEM with Schottky and Cold Field Emission Illumination.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 2, p. 487, doi. 10.1017/S1431927612014298

By:

Xin, Yan;
Kynoch, John;
Han, Ke;
Liang, Zhiyong;
Lee, Peter J.;
Larbalestier, David C.;
Su, Yi-Feng;
Nagahata, Kohei;
Aoki, Toshihiro;
Longo, Paolo

Publication type:

Article

The Influence of the Sample Thickness on the Lateral and Axial Resolution of Aberration-Corrected Scanning Transmission Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 93, doi. 10.1017/S143192761201392X

By:

Ramachandra, Ranjan;
Demers, Hendrix;
de Jonge, Niels

Publication type:

Article

Low-Dosage Maximum-A-Posteriori Focusing and Stigmation.

Published in:

Microscopy & Microanalysis, 2013, v. 19, n. 1, p. 38, doi. 10.1017/S1431927612013852

By:

Binding, Jonas;
Mikula, Shawn;
Denk, Winfried

Publication type:

Article

Insights into the Structure of MoS2/WS2 Nanomaterial Catalysts as Revealed by Aberration Corrected STEM.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. S5, p. 65, doi. 10.1017/S1431927612012986

By:

Deepak, Francis Leonard;
Esparza, Rodrigo;
Castro-Guerrero, Carlos Fernando;
Mejía-Rosales, Sergio;
Lopez-Lozano, Xochitl;
Jose-Yacaman, Miguel

Publication type:

Article

Introduction: Opportunities, Artifacts, and Interpretation of Aberration-Corrected Electron Microscopy Data.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 651, doi. 10.1017/S1431927612001493

By:

Batson, Phil;
Smith, Dave

Publication type:

Article

Ad Hoc Auto-Tuning of Aberrations Using High-Resolution STEM Images by Autocorrelation Function.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 705, doi. 10.1017/S1431927612001304

By:

Sawada, Hidetaka;
Watanabe, Masashi;
Chiyo, Izuru

Publication type:

Article

The First Years of the Aberration-Corrected Electron Microscopy Century.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 652, doi. 10.1017/S1431927612001250

By:

Batson, Philip E.

Publication type:

Article

Tuning Fifth-Order Aberrations in a Quadrupole-Octupole Corrector.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 699, doi. 10.1017/S1431927612001237

By:

Lupini, Andrew R.;
Pennycook, Stephen J.

Publication type:

Article

On-Column 2p Bound State with Topological Charge ±1 Excited by an Atomic-Size Vortex Beam in an Aberration-Corrected Scanning Transmission Electron Microscope.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 711, doi. 10.1017/S1431927612000499

By:

Xin, Huolin L.;
Zheng, Haimei

Publication type:

Article

Data Processing for Atomic Resolution Electron Energy Loss Spectroscopy.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 667, doi. 10.1017/S1431927612000244

By:

Cueva, Paul;
Hovden, Robert;
Mundy, Julia A.;
Xin, Huolin L.;
Muller, David A.

Publication type:

Article

Determining On-Axis Crystal Thickness with Quantitative Position-Averaged Incoherent Bright-Field Signal in an Aberration-Corrected STEM.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 4, p. 720, doi. 10.1017/S1431927612000189

By:

Xin, Huolin L.;
Zhu, Ye;
Muller, David A.

Publication type:

Article

Development of an Ad-Hoc Aberration Auto-tuning Procedure on an Oriented Crystalline Specimen in Aberration-Corrected Scanning Transmission Electron Microscopy: the SIAM Method.

Published in:

2012

By:

Watanabe, M.;
Sawada, H.

Publication type:

Abstract

The new aberration-corrected, cold-field emission JEOL JEM-ARM200CF STEM/TEM at the University of Illinois at Chicago.

Published in:

2012

By:

Klie, R.F.;
Gulec, A.;
Liu, J.;
Phillips, P.;
Tao, R.;
Low, K.;
Nicholls, A.

Publication type:

Abstract

Reduce the electron damage in atomic resolved SEM observation using aberration corrected electron microscope.

Published in:

2012

By:

Konno, M.;
Sato, T.;
Inada, H.;
Nakamura, K.;
Zhu, Y.

Publication type:

Abstract

Microstructural And Optical Property Study Of Bipyramid Au/Pd Core Shells By Aberration Corrected and Monochromized STEM.

Published in:

2012

By:

Li, K.;
Wang, Q.;
Zhang, X.

Publication type:

Abstract

Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications.

Published in:

2012

By:

Nan, F.;
Hosseini Vajargah, S.;
Rossouw, D.;
Woo, S.Y.;
Bugnet, M.;
Chan, M.C.;
Gauquelin, N.;
Stambula, S.;
Zhu, G.;
Botton, G.

Publication type:

Abstract

Planar defects in patterned GaAs by aberration corrected STEM.

Published in:

2012

By:

dos Reis, R.;
Liliental-Weber, Z.;
Ophus, C.;
Jimenez, J.;
Snure, M.;
Gerard, B.

Publication type:

Abstract

Atomistic Structure Analysis Of 3C-SiC/Si(001) Interface And Stacking Faults By Aberration-Corrected Transmission Electron Microscopy.

Published in:

2012

By:

Yamasaki, J.;
Tanaka, N.;
Inamoto, S.;
Nomura, Y.;
Okazaki-Maeda, K.

Publication type:

Abstract

Co-Clustering Via Nanochannel-Membrane Modulated Ion Implantation into Si3N4 Observed By Plan-View Aberration-Corrected STEM And EELS.

Published in:

2012

By:

Guan, W.;
Bhatta, U.;
Ross, I.M.;
Ghatak, J.;
Moebus, G.;
Peng, N.

Publication type:

Abstract

Sample surface atomic resolution secondary electron imaging with an aberration corrected STEM.

Published in:

2012

By:

Inada, H.;
Nakamura, K.;
Tamura, K.;
Suzuki, Y.;
Sato, T.;
Konno, M.;
Su, D.;
Wall, J.;
Zhu, Y.;
Ciston, J.

Publication type:

Abstract

To Cc or Not to Cc: That is the Question!

Published in:

2012

By:

Zaluzec, N.J.;
Miller, D.J.;
Wen, J.;
Cook, R.E.

Publication type:

Abstract

Aberration Corrected Zernike Phase Contrast TEM.

Published in:

2012

By:

Iijima, H.;
Motoki, S.;
Hosokawa, F.;
Ohkura, Y.

Publication type:

Abstract

Optimized Deconvolution for Maximum Axial Resolution in Three-Dimensional Aberration-Corrected Scanning Transmission Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2012, v. 18, n. 1, p. 218, doi. 10.1017/S1431927611012347

By:

Ramachandra, Ranjan;
de Jonge, Niels

Publication type:

Article

The Three-Dimensional Point Spread Function of Aberration-Corrected Scanning Transmission Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 5, p. 817, doi. 10.1017/S1431927611011913

By:

Lupini, Andrew R.;
de Jonge, Niels

Publication type:

Article

Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 5, p. 752, doi. 10.1017/S1431927611000493

By:

Ek, Martin;
Borgström, Magnus T.;
Karlsson, Lisa S.;
Hetherington, Crispin J.D.;
Wallenberg, L. Reine

Publication type:

Article

Deep Tissue Fluorescent Imaging in Scattering Specimens Using Confocal Microscopy.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. 4, p. 614, doi. 10.1017/S1431927611000535

By:

Clendenon, Sherry G.;
Young, Pamela A.;
Ferkowicz, Michael;
Phillips, Carrie;
Dunn, Kenneth W.

Publication type:

Article

A Beginners Guide to: Aberration Corrected Electron Microscopy.

Published in:

2011

By:

Bell, D

Publication type:

Abstract

Revealing Atomic-Scale Surface Segregation, Intermixing and Internal Ordering in Fuel Cell Nanocatalysts by Aberration-Corrected Spectroscopic Imaging.

Published in:

2011

By:

Xin, H;
Wang, D;
Abruña, H;
Muller, D

Publication type:

Abstract

Understanding the In-Situ Reaction of Cerium Oxide Nanoparticles Using Aberration Corrected Exit Wave Restoration and EELS.

Published in:

2011

By:

Haigh, S;
Young, N;
Sawada, H;
Takayanagi, K;
Kirkland, A

Publication type:

Abstract

Auto-Tuning of Aberrations Using High-Resolution STEM Images by Auto-Correlation Function.

Published in:

2011

By:

Sawada, H;
Watanabe, M;
Okunishi, E;
Kondo, Y

Publication type:

Abstract

Chicago Aberration Correction Work.

Published in:

2011

By:

Beck, V

Publication type:

Abstract

Reduction of Channeling Effects in Aberration-Corrected STEM by Orientating the Sample Along Low Atomic Linear Density Zone Axes.

Published in:

2011

By:

Hernández-Maldonado, D;
Herrera, M;
Guerrero-Lebrero, M;
Pizarro, J;
Galindo, P;
Molina, S

Publication type:

Abstract

New opportunities for In situ Science Based on the TEAM Platform.

Published in:

2011

By:

Miller, D;
Dahmen, U;
Stach, E

Publication type:

Abstract

In-Week Intensive Workshops.

Published in:

Microscopy & Microanalysis, 2011, v. 17, n. S1, p. 36, doi. 10.1017/S1431927611000717

By:

Marko, Mike

Publication type:

Article

Introduction: The Otto Scherzer Special Issue on Aberration-Corrected Electron Microscopy.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 5, p. 365, doi. 10.1017/S1431927610093700

By:

Smith, David J.;
Dahmen, Uli

Publication type:

Article

Sub-Ångstrom Low-Voltage Performance of a Monochromated, Aberration-Corrected Transmission Electron Microscope.

Published in:

Microscopy & Microanalysis, 2010, v. 16, n. 5, p. 386, doi. 10.1017/S1431927610093670

By:

Bell, David C.;
Russo, Christopher J.;
Benner, Gerd

Publication type:

Article