Works matching DE "ON-chip transformers"
1
- International Journal of Circuit Theory & Applications, 2023, v. 51, n. 12, p. 5555, doi. 10.1002/cta.3735
- Zou, Wei;
- Li, Lei;
- Cheng, Zhengwang;
- Zhang, Li;
- Wang, Mei;
- Ma, Xinguo;
- Zou, Xuecheng
- Article
2
- Journal of Electromagnetic Waves & Applications, 2017, v. 31, n. 5, p. 514, doi. 10.1080/09205071.2017.1291366
- Zhou, Qian;
- Han, Yan;
- Zhang, Shifeng;
- Han, Xiaoxia;
- Cheung, Ray C. C.;
- Feng, Guangtao
- Article
3
- Circuits, Systems & Signal Processing, 2014, v. 33, n. 8, p. 2401, doi. 10.1007/s00034-014-9765-x
- Li, Kun;
- Teng, Jianfu;
- Liu, Qing;
- Xuan, Xiuwei;
- Lu, Jin;
- Jiang, Daolian;
- Huang, Yuanxin
- Article
4
- Communications Physics, 2021, v. 4, n. 1, p. 1, doi. 10.1038/s42005-021-00573-9
- Vinod, Abhinav Kumar;
- Huang, Shu-Wei;
- Yang, Jinghui;
- Yu, Mingbin;
- Kwong, Dim-Lee;
- Wong, Chee Wei
- Article
5
- Microsystems & Nanoengineering, 2022, v. 8, n. 1, p. 1, doi. 10.1038/s41378-021-00335-1
- Luo, Yumeng;
- An, Xiaoshuai;
- Chen, Liang;
- Li, Kwai Hei
- Article
6
- Micro & Nano Letters (Wiley-Blackwell), 2016, v. 11, n. 5, p. 236, doi. 10.1049/mnl.2015.0239
- Vasilakis, Nikolaos;
- Moschou, Despina;
- Prodromakis, Themistoklis
- Article
7
- Journal of Circuits, Systems & Computers, 2023, v. 32, n. 9, p. 1, doi. 10.1142/S0218126623501499
- Derkaoui, Mokhtaria;
- Benhadda, Yamina;
- Chaabene, Ghacen;
- Spiteri, Pierre
- Article
8
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 10, p. -1, doi. 10.1142/S0218126617501468
- Alapati, Suresh;
- Patri, Sreehari Rao;
- Prasad, K. S. R. Krishna
- Article
9
- Journal of Circuits, Systems & Computers, 2016, v. 25, n. 9, p. -1, doi. 10.1142/S0218126616501152
- Wang, Shuai;
- Jin, Tao;
- Zheng, Chuanlei;
- Duan, Guangshan
- Article
10
- Journal of Circuits, Systems & Computers, 2016, v. 25, n. 3, p. -1, doi. 10.1142/S0218126616400144
- Azaïs, Florence;
- David-Grignot, Stéphane;
- Latorre, Laurent;
- Lefevre, François
- Article
11
- Journal of Circuits, Systems & Computers, 2016, v. 25, n. 3, p. -1, doi. 10.1142/S0218126616400181
- Duganapalli, Kishore;
- Palit, Ajoy K.;
- Anheier, Walter
- Article
12
- Journal of Circuits, Systems & Computers, 2014, v. 23, n. 9, p. -1, doi. 10.1142/S0218126614501205
- SOUDANI, ADEL;
- ALDAMMAS, AHMED;
- AL-DHELAAN, ABDULLAH
- Article
13
- PLoS ONE, 2016, v. 11, n. 8, p. 1, doi. 10.1371/journal.pone.0161024
- Frank, Philipp;
- Schreiter, Joerg;
- Haefner, Sebastian;
- Paschew, Georgi;
- Voigt, Andreas;
- Richter, Andreas
- Article
14
- Nanoscale Research Letters, 2013, v. 8, n. 2, p. 1, doi. 10.1186/1556-276X-8-71
- Gianneta, Violetta;
- Olziersky, Antonis;
- Nassiopoulou, Androula G.
- Article
15
- Angewandte Chemie International Edition, 2017, v. 56, n. 14, p. 3920, doi. 10.1002/anie.201700679
- Sun, Sai;
- Zhang, Fan;
- Yang, Chongqing;
- Zhuang, Xiaodong;
- Dong, Renhao;
- Feng, Xinliang;
- Schellhammer, Karl Sebastian;
- Ortmann, Frank;
- Cuniberti, Gianaurelio;
- Karakus, Melike;
- Mics, Zoltán;
- Cánovas, Enrique;
- Bonn, Mischa;
- Löffler, Markus
- Article
16
- Journal of Electronic Testing, 2018, v. 34, n. 6, p. 763, doi. 10.1007/s10836-018-5755-4
- Article
17
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 337, doi. 10.1007/s10836-018-5724-y
- Kansara, Parth;
- Reddy, Sharanabasavaraja Bheema;
- Abdallah, Louay;
- Huang, Ke
- Article
18
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 263, doi. 10.1007/s10836-018-5720-2
- Malloug, Hani;
- Barragan, Manuel J.;
- Mir, Salvador
- Article
19
- Journal of Electronic Testing, 2016, v. 32, n. 5, p. 649, doi. 10.1007/s10836-016-5613-1
- Hou, Bing;
- Liu, Tong;
- Liu, Jun;
- Chen, Junli;
- Yu, Faxin;
- Wang, Wenbo
- Article
20
- Journal of Electronic Testing, 2016, v. 32, n. 4, p. 423, doi. 10.1007/s10836-016-5604-2
- Li, Yan;
- Bielby, Steven;
- Chowdhury, Azhar;
- Roberts, Gordon
- Article
21
- IET Microwaves, Antennas & Propagation (Wiley-Blackwell), 2018, v. 12, n. 7, p. 1205, doi. 10.1049/iet-map.2017.0298
- Koziel, Slawomir;
- Kurgan, Piotr
- Article
22
- International Journal of Electronics & Telecommunications, 2016, v. 62, n. 3, p. 279, doi. 10.1515/eletel-2016-0038
- Article
23
- Electronic Science & Technology, 2025, v. 38, n. 2, p. 84, doi. 10.16180/j.cnki.issn1007-7820.2025.02.011
- Article
24
- Turkish Journal of Electrical Engineering & Computer Sciences, 2017, v. 25, n. 2, p. 1472, doi. 10.3906/elk-1510-174
- Ching-Che CHUNG;
- Jhih-Wei LI
- Article
25
- Engineering, Technology & Applied Science Research, 2019, v. 9, n. 6, p. 5006, doi. 10.48084/etasr.3205
- Gomha, Siddig;
- Langat, Kibet
- Article
26
- Nature Physics, 2014, v. 10, n. 5, p. 336, doi. 10.1038/nphys2941
- Article
27
- Advanced Electronic Materials, 2018, v. 4, n. 3, p. 1, doi. 10.1002/aelm.201700381
- Yuping He;
- Léonard, François;
- Medlin, Douglas L.;
- Baldasaro, Nicholas;
- Temple, Dorota S.;
- Barletta, Philip;
- Spataru, Catalin D.
- Article
28
- International Journal of Distributed Sensor Networks, 2016, p. 1, doi. 10.1155/2016/4246596
- Article
29
- Journal of Low Temperature Physics, 2016, v. 184, n. 1/2, p. 180, doi. 10.1007/s10909-015-1375-x
- Hailey-Dunsheath, S.;
- Shirokoff, E.;
- Barry, P.;
- Bradford, C.;
- Chapman, S.;
- Che, G.;
- Glenn, J.;
- Hollister, M.;
- Kovács, A.;
- LeDuc, H.;
- Mauskopf, P.;
- McKenney, C.;
- O'Brient, R.;
- Padin, S.;
- Reck, T.;
- Shiu, C.;
- Tucker, C.;
- Wheeler, J.;
- Williamson, R.;
- Zmuidzinas, J.
- Article
30
- Journal of Low Temperature Physics, 2016, v. 184, n. 1/2, p. 74, doi. 10.1007/s10909-016-1508-x
- Westbrook, B.;
- Cukierman, A.;
- Lee, A.;
- Suzuki, A.;
- Raum, C.;
- Holzapfel, W.
- Article
31
- Journal of Low Temperature Physics, 2016, v. 184, n. 1/2, p. 412, doi. 10.1007/s10909-016-1579-8
- Endo, A.;
- Yates, S.;
- Bueno, J.;
- Thoen, D.;
- Murugesan, V.;
- Baryshev, A.;
- Klapwijk, T.;
- Werf, P.;
- Baselmans, J.
- Article
32
- Journal of Low Temperature Physics, 2016, v. 184, n. 1/2, p. 344, doi. 10.1007/s10909-015-1337-3
- Kempf, S.;
- Ferring, A.;
- Fleischmann, A.;
- Wegner, M.;
- Enss, C.
- Article
33
- Journal of Low Temperature Physics, 2014, v. 176, n. 5/6, p. 841, doi. 10.1007/s10909-013-1068-2
- Hailey-Dunsheath, S.;
- Barry, P.;
- Bradford, C.;
- Chattopadhyay, G.;
- Day, P.;
- Doyle, S.;
- Hollister, M.;
- Kovacs, A.;
- LeDuc, H.;
- Llombart, N.;
- Mauskopf, P.;
- McKenney, C.;
- Monroe, R.;
- Nguyen, H.;
- O'Brient, R.;
- Padin, S.;
- Reck, T.;
- Shirokoff, E.;
- Swenson, L.;
- Tucker, C.
- Article
34
- International Journal of Molecular Sciences, 2013, v. 14, n. 9, p. 18535, doi. 10.3390/ijms140918535
- Giouroudi, Ioanna;
- Keplinger, Franz
- Article
35
- Przegląd Elektrotechniczny, 2017, v. 93, n. 1, p. 253, doi. 10.15199/48.2017.01.62
- NAMOUNE, Abdelhadi;
- HAMID, Azzedine;
- TALEB, Rachid
- Article
36
- Sensors (14248220), 2019, v. 19, n. 16, p. 3535, doi. 10.3390/s19163535
- Bajwa, Rayan;
- Yapici, Murat Kaya
- Article
37
- Sensors (14248220), 2018, v. 18, n. 11, p. 4061, doi. 10.3390/s18114061
- Frankis, Henry C.;
- Su, Daniel;
- Bonneville, Dawson B.;
- Bradley, Jonathan D. B.
- Article
38
- Sensors (14248220), 2016, v. 16, n. 8, p. 1234, doi. 10.3390/s16081234
- Rui-Tao Liu;
- Lu-Qi Tao;
- Bo Liu;
- Xiang-Guang Tian;
- Mohammad, Mohammad Ali;
- Yi Yang;
- Tian-Ling Ren
- Article
39
- Applied Computational Electromagnetics Society Journal, 2016, v. 31, n. 8, p. 997
- Xiangning Fan;
- Xiaoyang Shi;
- Li Tang
- Article
40
- Journal of Electrical & Computer Engineering, 2015, v. 2015, p. 1, doi. 10.1155/2015/902591
- Chen, Xiaowen;
- Lu, Zhonghai;
- Jantsch, Axel;
- Chen, Shuming;
- Guo, Yang;
- Chen, Shenggang;
- Chen, Hu
- Article
41
- European Physical Journal D (EPJ D), 2016, v. 70, n. 1, p. 1, doi. 10.1140/epjd/e2015-60244-y
- Article
42
- Micromachines, 2025, v. 16, n. 4, p. 443, doi. 10.3390/mi16040443
- Qian, Jiang;
- Wu, Peng;
- Quan, Haiyang;
- Wang, Wei;
- Wang, Yong;
- Sun, Shanshan;
- Xia, Jingchao
- Article
43
- Micromachines, 2024, v. 15, n. 4, p. 546, doi. 10.3390/mi15040546
- Luo, Jialin;
- Fan, Yihui;
- Wan, Jing;
- Sun, Xuming;
- Liang, Xiaoxin
- Article