Works about NETWORKS on a chip
1
- IET Computers & Digital Techniques (Wiley-Blackwell), 2022, v. 16, n. 1, p. 45, doi. 10.1049/cdt2.12039
- Vakili, Behnam;
- Gholipour, Morteza
- Article
2
- IET Computers & Digital Techniques (Wiley-Blackwell), 2022, v. 16, n. 2/3, p. 45, doi. 10.1049/cdt2.12039
- Vakili, Behnam;
- Gholipour, Morteza
- Article
3
- Ecotoxicology, 2022, v. 31, n. 8, p. 1266, doi. 10.1007/s10646-022-02586-8
- Lin, Yu-Juan;
- Feng, Yu-Xi;
- Zhang, Qing;
- Yu, Xiao-Zhang
- Article
4
- Electronics (2079-9292), 2024, v. 13, n. 9, p. 1785, doi. 10.3390/electronics13091785
- Wei, Zhijie;
- Yu, Shenglin;
- Wei, Pengcheng
- Article
5
- Electronics (2079-9292), 2022, v. 11, n. 24, p. 4157, doi. 10.3390/electronics11244157
- Wang, Jiangkun;
- Ikechukwu, Ogbodo Mark;
- Dang, Khanh N.;
- Abdallah, Abderazek Ben
- Article
6
- Electronics (2079-9292), 2021, v. 10, n. 1, p. 91, doi. 10.3390/electronics10010091
- Park, Chester Sungchung;
- Park, Sungkyung
- Article
7
- Electronics (2079-9292), 2020, v. 9, n. 10, p. 1667, doi. 10.3390/electronics9101667
- Tsai, Wen-Chung;
- Chen, Sao-Jie;
- Hu, Yu-Hen;
- Chiang, Mao-Lun
- Article
8
- Electronics (2079-9292), 2020, v. 9, n. 7, p. 1076, doi. 10.3390/electronics9071076
- Nain, Zulqar;
- Ali, Rashid;
- Anjum, Sheraz;
- Afzal, Muhammad Khalil;
- Kim, Sung Won
- Article
9
- Electronics (2079-9292), 2020, v. 9, n. 1, p. 6, doi. 10.3390/electronics9010006
- Fang, Juan;
- Yu, Tingwen;
- Wei, Zelin
- Article
10
- Electronics (2079-9292), 2019, v. 8, n. 12, p. 1507, doi. 10.3390/electronics8121507
- Du, Gaoming;
- Tian, Chao;
- Li, Zhenmin;
- Zhang, Duoli;
- Zhang, Chuan;
- Wang, Xiaolei;
- Yin, Yongsheng
- Article
11
- i-Manager's Journal on Electronics Engineering, 2014, v. 5, n. 1, p. 27, doi. 10.26634/jele.5.1.3320
- ANUSHA, JEEVA;
- THRIMURTHULU, V.
- Article
12
- Nature Communications, 2024, v. 15, n. 1, p. 1, doi. 10.1038/s41467-024-50677-3
- Cheng, Junwei;
- Huang, Chaoran;
- Zhang, Jialong;
- Wu, Bo;
- Zhang, Wenkai;
- Liu, Xinyu;
- Zhang, Jiahui;
- Tang, Yiyi;
- Zhou, Hailong;
- Zhang, Qiming;
- Gu, Min;
- Dong, Jianji;
- Zhang, Xinliang
- Article
13
- Natural Product Communications, 2024, v. 19, n. 4, p. 1, doi. 10.1177/1934578X241246694
- Ru, Xue;
- Zhang, Yi;
- Chen, Xiaolei;
- Sun, Xingqian;
- Lv, Honglin;
- Fan, Tao
- Article
14
- Modern Physics Letters B, 2021, v. 35, n. 27, p. 1, doi. 10.1142/S0217984921400121
- Jiang, Zhanpeng;
- Yang, Zhe;
- Zhang, Penghui;
- Dong, Changchun
- Article
15
- Modern Physics Letters B, 2017, v. 31, n. 19-21, p. -1, doi. 10.1142/S0217984917400619
- Zhu, Chen;
- Zhao, Huatao;
- Chen, Tinghuan;
- Zhu, Tianbo
- Article
16
- Dyna (0012-7353), 2014, v. 81, n. 185, p. 28, doi. 10.15446/dyna.v81n185.34867
- Bolaños-Martínez, Freddy;
- Edison Aedo, José;
- Rivera-Vélez, Fredy
- Article
17
- Frontiers in Cellular Neuroscience, 2024, p. 1, doi. 10.3389/fncel.2024.1388409
- Weiss, Eva-Maria;
- Guhathakurta, Debarpan;
- Petrušková, Aneta;
- Hundrup, Verena;
- Zenker, Martin;
- Fejtová, Anna
- Article
18
- EURASIP Journal on Wireless Communications & Networking, 2015, v. 2015, n. 1, p. 1, doi. 10.1186/s13638-015-0443-x
- Sghaier, Mouna;
- Abdelkefi, Fatma;
- Siala, Mohamed
- Article
19
- Complexity, 2022, p. 1, doi. 10.1155/2022/4936167
- Zeinoddini-Meymand, Hamed;
- Kamel, Salah;
- Khan, Baseem
- Article
20
- Journal of Tiangong University, 2024, v. 43, n. 3, p. 50, doi. 10.3969/j.issn.1671-024x.2024.03.007
- Article
21
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 24, p. 1368, doi. 10.1049/el.2018.5389
- Li, C.-L.;
- Kim, Y.-W.;
- Lee, Y. S.;
- Han, T. H.
- Article
22
- Majlesi Journal of Telecommunication Devices, 2018, v. 7, n. 4, p. 179
- Zogh, Farnaz;
- Zarandi, Azadeh Alsadat Emrani;
- Naeini, Vahid Sattari
- Article
23
- Application Research of Computers / Jisuanji Yingyong Yanjiu, 2021, v. 38, n. 8, p. 2241, doi. 10.19734/j.issn.1001-3695.2020.04.0349
- 邓亚彬;
- 王志伟;
- 赵晨晖;
- 李 琳;
- 贺 珊;
- 李秋红;
- 帅建伟;
- 郭东辉
- Article
24
- Application Research of Computers / Jisuanji Yingyong Yanjiu, 2020, v. 37, n. 9, p. 2726, doi. 10.19734/j.issn.1001-3695.2019.04.0138
- Article
25
- Application Research of Computers / Jisuanji Yingyong Yanjiu, 2019, v. 36, n. 1, p. 223, doi. 10.19734/j.issn.1001-3695.2017.08.0888
- Article
26
- Al-Rafadain Engineering Journal, 2013, v. 21, n. 1, p. 91
- Jabbar, A. I. A.;
- AL Malah, Noor Th.
- Article
27
- Symmetry (20738994), 2023, v. 15, n. 3, p. 593, doi. 10.3390/sym15030593
- Weng, Xiaodong;
- Liu, Yi;
- Xu, Changqing;
- Lin, Xiaoling;
- Zhan, Linjun;
- Wang, Shunyao;
- Chen, Dongdong;
- Yang, Yintang
- Article
28
- Majlesi Journal of Electrical Engineering, 2021, v. 15, n. 2, p. 73, doi. 10.52547/mjee.15.2.73
- Asadinia, Sanaz;
- Mehrabi, Mahdi;
- Yaghoubi, Elham
- Article
29
- International Journal of Distributed Sensor Networks, 2019, v. 15, n. 11, p. N.PAG, doi. 10.1177/1550147719888109
- Bakhsh, Sheikh Tahir;
- Alghamdi, Saleh;
- Alsemmeari, Rayan A;
- Hassan, Syed Raheel
- Article
30
- Electronics & Electrical Engineering, 2014, v. 20, n. 3, p. 83, doi. 10.5755/j01.eee.20.3.6682
- Weiwei Fu;
- Tianzhou Chen;
- Li Liu
- Article
31
- Electronics & Electrical Engineering, 2012, v. 18, n. 8, p. 85, doi. 10.5755/j01.eee.18.8.2633
- Article
32
- Automatika: Journal for Control, Measurement, Electronics, Computing & Communications, 2023, v. 64, n. 4, p. 1280, doi. 10.1080/00051144.2023.2261088
- Dinesh Kumar, T. R.;
- Karthikeyan, A.
- Article
33
- Automatika: Journal for Control, Measurement, Electronics, Computing & Communications, 2023, v. 64, n. 4, p. 689, doi. 10.1080/00051144.2023.2213927
- T.R., Dinesh Kumar;
- A., Karthikeyan
- Article
34
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 143, doi. 10.1007/s10836-017-5653-1
- Article
36
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 227, doi. 10.1007/s10836-017-5655-z
- Bhowmik, Biswajit;
- Deka, Jatindra;
- Biswas, Santosh
- Article
37
- Journal of Electronic Testing, 2017, v. 33, n. 2, p. 209, doi. 10.1007/s10836-017-5646-0
- Aghaei, Babak;
- Khademzadeh, Ahmad;
- Reshadi, Midia;
- Badie, Kambiz
- Article
38
- Journal of Electronic Testing, 2013, v. 29, n. 4, p. 485, doi. 10.1007/s10836-013-5398-4
- Neishaburi, M. H.;
- Zilic, Zeljko
- Article
39
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 431, doi. 10.1007/s10836-013-5389-5
- Latif, Khalid;
- Rahmani, Amir-Mohammad;
- Nigussie, Ethiopia;
- Seceleanu, Tiberiu;
- Radetzki, Martin;
- Tenhunen, Hannu
- Article
40
- Journal of Electronic Testing, 2013, v. 29, n. 3, p. 415, doi. 10.1007/s10836-013-5377-9
- Fukushima, Yusuke;
- Fukushi, Masaru;
- Yairi, Ikuko
- Article
41
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 831, doi. 10.1007/s10836-012-5329-9
- Dalirsani, Atefe;
- Holst, Stefan;
- Elm, Melanie;
- Wunderlich, Hans-Joachim
- Article
42
- VLSI Design, 2017, p. 1, doi. 10.1155/2017/9427678
- Charif, Amir;
- Coelho, Alexandre;
- Zergainoh, Nacer-Eddine;
- Nicolaidis, Michael
- Article
43
- VLSI Design, 2014, p. 1, doi. 10.1155/2014/531653
- Trong-Yen Lee;
- Chi-Han Huang
- Article
44
- VLSI Design, 2012, p. 1, doi. 10.1155/2012/987209
- Cannella, Emanuele;
- Derin, Onur;
- Meloni, Paolo;
- Tuveri, Giuseppe;
- Stefanov, Todor
- Article
45
- VLSI Design, 2012, p. 1, doi. 10.1155/2012/450302
- Saponara, Sergio;
- Fanucci, Luca
- Article
46
- International Journal of Parallel Programming, 2021, v. 49, n. 5, p. 745, doi. 10.1007/s10766-021-00700-7
- Article
47
- International Journal of Parallel Programming, 2018, v. 46, n. 6, p. 1247, doi. 10.1007/s10766-018-0566-x
- Thompson, Christopher;
- Gould, Miles;
- Topham, Nigel
- Article
48
- International Journal of Parallel Programming, 2018, v. 46, n. 4, p. 722, doi. 10.1007/s10766-017-0521-2
- Liu, Wenjie;
- Ma, Sheng;
- Huang, Libo;
- Wang, Zhiying
- Article
49
- International Journal of Parallel Programming, 2013, v. 41, n. 2, p. 261, doi. 10.1007/s10766-012-0226-5
- Rovers, Kenneth;
- Kuper, Jan
- Article
50
- Computers (2073-431X), 2018, v. 7, n. 3, p. 38, doi. 10.3390/computers7030038
- Rettkowski, Jens;
- Göhringer, Diana
- Article