Works matching DE "NATIONAL Instruments Corp."

Results: 204

CLASSROOM AIDS.

Published in:: Science Activities, 2007, v. 43, n. 4, p. 42
Publication type:: Article

Hardware-in-the-Loop Simulations: A Historical Overview of Engineering Challenges.

Published in:

Electronics (2079-9292), 2022, v. 11, n. 15, p. 2462, doi. 10.3390/electronics11152462

By:

Mihalič, Franc;
Truntič, Mitja;
Hren, Alenka

Publication type:

Article

Accuracy Improvement in Resolver Offset Detection Based on Angle Tracking Observer with Coordinate Transformation.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 14, p. 1643, doi. 10.3390/electronics10141643

By:

Kim, Mun-Hong;
Kim, Do-Yun

Publication type:

Article

Digital Compensation of a Resistive Voltage Divider for Power Measurement.

Published in:

Electronics (2079-9292), 2021, v. 10, n. 6, p. 696, doi. 10.3390/electronics10060696

By:

Dadić, Martin;
Mostarac, Petar;
Malarić, Roman;
Konjevod, Jure;
Kim, Cheonshik

Publication type:

Article

National Instruments announces enhanced sound and vibration software.

Published in:: 2009
Publication type:: Product Review

National Instruments announces USB device and sensor suite for sound and vibration applications.

Published in:: Noise & Vibration Worldwide, 2009, v. 40, n. 7, p. 9
Publication type:: Article

More sound and vibration offerings for machine diagnostic applications.

Published in:: 2009
Publication type:: Product Review

New wireless data acquisition modules for sound and vibration applications.

Published in:: 2008
Publication type:: Product Review

NI's sound and vibration measurement.

Published in:: 2008
Publication type:: Product Review

Nl enhances Sound and Vibration Measurement Suite 5.0.

Published in:: 2007
Publication type:: Product Review

Oxide Nanostructured Coating for Power Lines with Anti-Icing Effect.

Published in:

Coatings (2079-6412), 2022, v. 12, n. 9, p. N.PAG, doi. 10.3390/coatings12091346

By:

Blinov, Andrey Vladimirovcih;
Kostyukov, Dmitry Aleksandrovich;
Yasnaya, Maria Anatolevna;
Zvada, Pavel Aleksandrovich;
Arefeva, Lyudmila Pavlovna;
Varavka, Valery Nikolaevich;
Zvezdilin, Roman Aleksandrovich;
Kravtsov, Alexander Aleksandrovich;
Maglakelidze, David Guramievich;
Golik, Alexey Borisovich;
Gvozdenko, Alexey Alekseevich;
Lazareva, Natalia Viatcheslavovna;
Kushch, Elena Nikolaevna;
Goncharov, Vadim Nikolaevich;
Kolodkin, Maxim Andreevich;
Shariati, Mohammad Ali;
Nagdalian, Andrey Ashotovich

Publication type:

Article

Artificial vision applied to manufacturing process.

Published in:

Visión Electrónica, 2021, v. 15, n. 1, p. 107, doi. 10.14483/22484728.17432

By:

Leonardo Hurtado-Cortés, Luini;
Alejandro Forero-Casallas, John;
Elberto Ruiz-Rosas, Víctor

Publication type:

Article

Poor Management Policies and Practices by U.S. Politicians Destroyed a Superpower.

Published in:

Journal of Management Policy & Practice, 2023, v. 24, n. 1, p. 71, doi. 10.33423/jmpp.v24i1.6030

By:

Baker, Biff

Publication type:

Article

Investigating focal macular electroretinogram function for fundus‐related perimetry application.

Published in:

2024

By:

Suzuki, Naoto

Publication type:

Abstract

Development of superimposing electroretinogram for identifying the retinal layer causing a decline in visual sensitivity at arbitrary points on the retina.

Published in:

2022

By:

Suzuki, Naoto

Publication type:

Abstract

Windows‐based software for recording clinical electroretinograms.

Published in:: Acta Ophthalmologica (1755375X), 2011, v. 89, p. 0, doi. 10.1111/j.1755-3768.2011.4323.x
Publication type:: Article

Instrumentation platforms facilitate testing.

Published in:

2018

By:

Cormier, Ken

Publication type:

Product Review

Threats abound, from the RF battlefield to the web firewall.

Published in:

2018

By:

Nelson, Rick

Publication type:

Proceeding

LabVIEW 2018 release headlines software-centric NIWeek.

Published in:

2018

By:

Nelson, Rick

Publication type:

Product Review

Scalability, cost, flexibility drive innovation from DC to mmWave.

Published in:

2018

By:

Nelson, Rick

Publication type:

Product Review

On-premises and cloud tools boost design through manufacturing.

Published in:

2018

By:

Nelson, Rick

Publication type:

Product Review

Balancing performance, flexibility, usability.

Published in:

2017

By:

Nelson, Rick

Publication type:

Product Review

NI and Innovari help grid operators improve utilization.

Published in:: EE: Evaluation Engineering, 2017, v. 56, n. 11, p. 4
Publication type:: Article

Speeding instrument setup, control, and communication.

Published in:

2017

By:

Nelson, Rick

Publication type:

Product Review

INDUSTRY UPDATE.

Published in:: EE: Evaluation Engineering, 2017, v. 56, n. 6, p. 6
Publication type:: Article

5G development efforts accelerate.

Published in:

EE: Evaluation Engineering, 2017, v. 56, n. 5, p. 14

By:

Nelson, Rick

Publication type:

Article

20-year PXI development has seen continued growth.

Published in:

EE: Evaluation Engineering, 2017, v. 56, n. 5, p. 6

By:

Earls, Alan

Publication type:

Article

Boosting measurement capability from pocket to benchtop.

Published in:

2017

By:

Nelson, Rick

Publication type:

Product Review

Pivotal year sees standardization proceed.

Published in:

EE: Evaluation Engineering, 2017, v. 56, n. 4, p. 6

By:

Nelson, Rick

Publication type:

Article

Instrument and chip vendors boost high-frequency test.

Published in:

2017

By:

Nelson, Rick

Publication type:

Proceeding

Extending the midrange definition.

Published in:

EE: Evaluation Engineering, 2016, v. 55, n. 12, p. 10

By:

Lecklider, Tom

Publication type:

Article

Driving your instruments' out-of-the-box experience.

Published in:

EE: Evaluation Engineering, 2016, v. 55, n. 11, p. 6

By:

Nelson, Rick

Publication type:

Article

NI turns 40, celebrates 30 years of Lab VIEW.

Published in:

2016

By:

Nelson, Rick

Publication type:

Proceeding

Big data analytics becomes strategic test tool.

Published in:

2016

By:

Nelson, Rick

Publication type:

Product Review

IMS sees chips and instruments targeting mmWave applications.

Published in:: 2016
Publication type:: Proceeding

INDUSTRY UPDATE.

Published in:: EE: Evaluation Engineering, 2016, v. 55, n. 7, p. 4
Publication type:: Article

NIDays Boston addresses big data, industrial Internet.

Published in:

2016

By:

Nelson, Rick

Publication type:

Proceeding

Internet of Things dominates SEMICON West.

Published in:

2015

By:

Nelson, Rick

Publication type:

Proceeding

Flexible tools address changing loT test needs.

Published in:

2015

By:

Nelson, Rick

Publication type:

Product Review

Immersed at NIWeek 2015.

Published in:

2015

By:

Lecklider, Tom

Publication type:

Proceeding

PXI moves up the food chain.

Published in:

EE: Evaluation Engineering, 2015, v. 54, n. 10, p. 8

By:

Lecklider, Tom

Publication type:

Article

Safeguarding low-level signals.

Published in:

EE: Evaluation Engineering, 2015, v. 54, n. 3, p. 14

By:

Lecklider, Tom

Publication type:

Article

Big data, big decisions.

Published in:

EE: Evaluation Engineering, 2015, v. 54, n. 4, p. 4

By:

Nelson, Rick

Publication type:

Article

Software augments instruments for 5G research.

Published in:

EE: Evaluation Engineering, 2015, v. 54, n. 3, p. 26

By:

Nelson, Rick

Publication type:

Article

Modular systems automate IC test.

Published in:

EE: Evaluation Engineering, 2014, v. 53, n. 10, p. 18

By:

Nelson, Rick

Publication type:

Article

Leveraging military and commercial test technology.

Published in:

EE: Evaluation Engineering, 2014, v. 53, n. 9, p. 36

By:

Nelson, Rick

Publication type:

Article

Mobile apps help you buy and use test equipment.

Published in:

EE: Evaluation Engineering, 2014, v. 53, n. 9, p. 34

By:

Nelson, Rick

Publication type:

Article

Instruments tackle IC test chores.

Published in:

2014

By:

Nelson, Rick

Publication type:

Product Review

LTE-A Poses Carrier Aggregation, MIMO Challenges.

Published in:

EE: Evaluation Engineering, 2014, v. 53, n. 5, p. 14

By:

Nelson, Rick

Publication type:

Article

EE INDUSTRY UPDATE.

Published in:: EE: Evaluation Engineering, 2014, v. 53, n. 5, p. 6
Publication type:: Article