Works about NARROW gap semiconductors
1
- Reactions (2624-781X), 2025, v. 6, n. 2, p. 25, doi. 10.3390/reactions6020025
- Article
2
- International Journal of Nanoscience, 2007, v. 6, n. 3/4, p. 301, doi. 10.1142/S0219581X07004821
- RADANTSEV, V. F.;
- KRUZHAEV, V. V.
- Article
3
- Annalen der Physik, 2020, v. 532, n. 8, p. 1, doi. 10.1002/andp.201900586
- Starostin, Alexander A.;
- Shangin, Victor V.;
- Lonchakov, Alexander T.;
- Kotov, Artem N.;
- Bobin, Semyon B.
- Article
4
- Advanced Functional Materials, 2014, v. 23, n. 47, p. 5846, doi. 10.1002/adfm.201301077
- Jiang, Xue;
- Zhao, Jijun;
- Li, Yan‐Ling;
- Ahuja, Rajeev
- Article
5
- Communications in Mathematical Physics, 2010, v. 295, n. 1, p. 243, doi. 10.1007/s00220-009-0983-1
- Bräunlich, G.;
- Graf, G. M.;
- Ortelli, G.
- Article
6
- EAI Endorsed Transactions on Cloud Systems, 2018, v. 4, n. 13, p. 1, doi. 10.4108/eai.16-5-2018.156533
- Gollapudi, Sreelakshmi;
- Pathak, Lalit Kumar;
- Vrind, Tushar;
- Sharma, Diwakar;
- Mishra, Samir Kumar
- Article
7
- Metallophysics & Advanced Technologies / Metallofizika i Novejsie Tehnologii, 2018, v. 40, n. 4, p. 529, doi. 10.15407/mfint.40.04.0529
- Koman, B. P.;
- Balitskii, O. O.;
- Leonov, D. S.
- Article
8
- Computation, 2022, v. 10, n. 2, p. 19, doi. 10.3390/computation10020019
- Naseri, Mosayeb;
- Jalilian, Jaafar;
- Salahub, Dennis R.;
- Lourenço, Maicon Pierre;
- Rezaei, Ghasem
- Article
9
- Scientific Reports, 2014, p. 1, doi. 10.1038/srep06714
- Donghyeuk Choi;
- Yamujin Jang;
- JeeHee Lee;
- Gyoung Hwa Jeong;
- Dongmok Whang;
- Sung Woo Hwang;
- Kyung-Sang Cho;
- Sang-Wook Kim
- Article
10
- NPG Asia Materials, 2020, v. 12, n. 1, p. 1, doi. 10.1038/s41427-020-0228-5
- Yamada, Michihiro;
- Kuroda, Fumiaki;
- Tsukahara, Makoto;
- Yamada, Shinya;
- Fukushima, Tetsuya;
- Sawano, Kentarou;
- Oguchi, Tamio;
- Hamaya, Kohei
- Article
11
- Journal of Nano- & Electronic Physics, 2020, v. 12, n. 3, p. 1, doi. 10.21272/jnep.12(3).03012
- Gulyamov, G.;
- Erkaboev, U. I.;
- Rakhimov, R. G.;
- Mirzaev, J. I.
- Article
12
- European Physical Journal B: Condensed Matter, 2020, v. 93, n. 12, p. N.PAG, doi. 10.1140/epjb/e2020-10425-6
- Article
13
- Advanced Energy Materials, 2020, v. 10, n. 25, p. 1, doi. 10.1002/aenm.202001174
- Yang, Feichen;
- Kim, Myung Jun;
- Brown, Micah;
- Wiley, Benjamin J.
- Article
14
- Advanced Energy Materials, 2018, v. 8, n. 29, p. N.PAG, doi. 10.1002/aenm.201801807
- Brus, Viktor V.;
- Lee, Hang Ken;
- Proctor, Christopher M.;
- Ford, Michael;
- Liu, Xiaofeng;
- Burgers, Mark A.;
- Lee, Jaechol;
- Bazan, Guillermo C.;
- Nguyen, Thuc‐quyen
- Article
15
- Modern Physics Letters B, 2021, v. 35, n. 22, p. 1, doi. 10.1142/S0217984921503462
- Zhang, Wenchao;
- Guan, Feng;
- Zhao, Kuo;
- Jiang, Min;
- He, Xunjun;
- Wang, Yi
- Article
16
- Modern Physics Letters B, 2018, v. 32, n. 14, p. -1, doi. 10.1142/S0217984918501531
- Fan, Xiaoguang;
- Li, Jincheng;
- Jin, Yingjiu
- Article
17
- Modern Physics Letters B, 2017, v. 31, n. 31, p. -1, doi. 10.1142/S0217984917502943
- Sandeep;
- Dahiya, Sunita;
- Singh, Navneet
- Article
18
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2025, v. 39, n. 2, p. 1, doi. 10.1142/S021797922550016X
- Ngoc, Hoang Van;
- Ha, Chu Viet
- Article
19
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2023, v. 37, n. 13, p. 1, doi. 10.1142/S0217979223501230
- Article
20
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2020, v. 34, n. 07, p. N.PAG, doi. 10.1142/S0217979220500526
- Erkaboev, U. I.;
- Gulyamov, G.;
- Mirzaev, J. I.;
- Rakhimov, R. G.
- Article
21
- International Journal of Modern Physics B: Condensed Matter Physics; Statistical Physics; Applied Physics, 2018, v. 32, n. 15, p. N.PAG, doi. 10.1142/S0217979218501886
- Anusha, N. P.;
- Sharan, Alok
- Article
22
- Welding International, 2016, v. 30, n. 10, p. 745, doi. 10.1080/09507116.2016.1142195
- Yamazaki, Yosuke;
- Abe, Yohei;
- Hioki, Yukio;
- Nakatani, Mitsuyoshi;
- Kitagawa, Akikazu;
- Nakata, Kazuhiro
- Article
23
- Welding International, 2014, v. 28, n. 7, p. 547, doi. 10.1080/09507116.2013.840045
- Article
24
- Welding International, 2012, v. 26, n. 11, p. 867, doi. 10.1080/09507116.2011.653171
- Article
25
- Semiconductors, 2001, v. 35, n. 11, p. 1285, doi. 10.1134/1.1418073
- Article
26
- Semiconductors, 2001, v. 35, n. 11, p. 1270, doi. 10.1134/1.1418070
- Kosyachenko, L. A.;
- Markov, A. V.;
- Ostapov, S. É.;
- Rarenko, I. M.
- Article
27
- Semiconductors, 1997, v. 31, n. 3, p. 261
- Neıfel’d, É. A.;
- Demchuk, K. M.;
- Kharus, G. I.;
- Bubnova, A. É.;
- Domanskaya, L. I.;
- Shtrapenin, G. D.;
- Paranchich, S. Yu.
- Article
28
- Semiconductors, 1997, v. 31, n. 1, p. 29, doi. 10.1134/1.1187047
- Gasan-zade, S. G.;
- Sal’kov, E. A.;
- Shepel’skiı, G. A.
- Article
29
- Critical Reviews in Environmental Science & Technology, 2018, v. 48, n. 10-12, p. 806, doi. 10.1080/10643389.2018.1487227
- Shekofteh-Gohari, Maryam;
- Habibi-Yangjeh, Aziz;
- Abitorabi, Masoud;
- Rouhi, Afsar
- Article
30
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 389, doi. 10.1007/s11664-024-11510-1
- Haouam, Marwa;
- Hamidani, Ali;
- Rebah, Nor;
- Zanat, Kamel
- Article
31
- Journal of Electronic Materials, 2024, v. 53, n. 7, p. 3438, doi. 10.1007/s11664-024-11134-5
- Tian, Jing;
- Ma, Weiliang;
- Record, Marie-Christine;
- Boulet, Pascal
- Article
32
- Journal of Electronic Materials, 2021, v. 50, n. 12, p. 7071, doi. 10.1007/s11664-021-09210-1
- Khalifa, Ali. M.;
- Saleem, Ali. H.;
- Refaat, Hajer. Z.;
- Ahmed, Naser M.
- Article
33
- Journal of Electronic Materials, 2021, v. 50, n. 10, p. 5857, doi. 10.1007/s11664-021-09115-z
- Jain, Vivek Kumar;
- Lakshmi, N.;
- Jain, Rakesh;
- Jain, Archana
- Article
34
- Journal of Electronic Materials, 2021, v. 50, n. 8, p. 4705, doi. 10.1007/s11664-021-08986-6
- Chanda, Sayantika;
- Debbarma, Manish;
- Ghosh, Debankita;
- Debnath, Bimal;
- Chattopadhyaya, Surya
- Article
35
- Chemistry - A European Journal, 2022, v. 28, n. 9, p. 1, doi. 10.1002/chem.202104319
- Lee, Shannon J.;
- Viswanathan, Gayatri;
- Carnahan, Scott L.;
- Harmer, Colin P.;
- Akopov, Georgiy;
- Rossini, Aaron J.;
- Miller, Gordon J.;
- Kovnir, Kirill
- Article
36
- Chemistry - A European Journal, 2021, v. 27, n. 26, p. 7383, doi. 10.1002/chem.202005312
- Lee, Shannon J.;
- Won, Juyeon;
- Wang, Lin‐Lin;
- Jing, Dapeng;
- Harmer, Colin P.;
- Mark, Justin;
- Akopov, Georgiy;
- Kovnir, Kirill
- Article
37
- Angewandte Chemie, 2022, v. 134, n. 9, p. 1, doi. 10.1002/ange.202115020
- Jin, Enquan;
- Geng, Keyu;
- Fu, Shuai;
- Addicoat, Matthew A.;
- Zheng, Wenhao;
- Xie, Shuailei;
- Hu, Jun‐Shan;
- Hou, Xudong;
- Wu, Xiao;
- Jiang, Qiuhong;
- Xu, Qing‐Hua;
- Wang, Hai I.;
- Jiang, Donglin
- Article
38
- Angewandte Chemie, 2020, v. 132, n. 1, p. 473, doi. 10.1002/ange.201911428
- Yang, Sheng;
- Chen, Guangbo;
- Ricciardulli, Antonio Gaetano;
- Zhang, Panpan;
- Zhang, Zhen;
- Shi, Huanhuan;
- Ma, Ji;
- Zhang, Jian;
- Blom, Paul W. M.;
- Feng, Xinliang
- Article
39
- International Journal of Advanced Manufacturing Technology, 2014, v. 74, n. 9-12, p. 1355, doi. 10.1007/s00170-014-6079-x
- Li, Wenhang;
- Gao, Kai;
- Wu, Jing;
- Hu, Ting;
- Wang, Jiayou
- Article
40
- International Journal of Advanced Manufacturing Technology, 2014, v. 74, n. 1-4, p. 297, doi. 10.1007/s00170-014-5984-3
- Cui, H.;
- Jiang, Z.;
- Tang, X.;
- Lu, F.
- Article
41
- International Journal of Advanced Manufacturing Technology, 2014, v. 72, n. 9-12, p. 1705, doi. 10.1007/s00170-014-5799-2
- Xu, W.;
- Lin, S.;
- Fan, C.;
- Zhuo, X.;
- Yang, C.
- Article
42
- International Journal of Advanced Manufacturing Technology, 2013, v. 69, n. 5-8, p. 1105, doi. 10.1007/s00170-013-5095-6
- Meng, Wei;
- Li, Zhuguo;
- Huang, Jian;
- Wu, Yixiong;
- Cao, Rui
- Article
43
- International Journal of Advanced Manufacturing Technology, 2013, v. 68, n. 1-4, p. 293, doi. 10.1007/s00170-013-4729-z
- Ramakrishnan, M.;
- Padmanaban, K.;
- Muthupandi, V.
- Article
44
- Materials Science, 2013, v. 49, n. 2, p. 211, doi. 10.1007/s11003-013-9601-7
- Kotur, B.;
- Babizhetskyy, V.;
- Bauer, E.;
- Kneidinger, F.;
- Danner, A.;
- Leber, L.;
- Michor, H.
- Article
45
- Journal of Engineering Physics & Thermophysics, 2013, v. 86, n. 1, p. 242, doi. 10.1007/s10891-013-0825-z
- Lepikh, Ya.;
- Ivanchenko, I.;
- Budiyanskaya, L.
- Article
46
- Electronics Letters (Wiley-Blackwell), 2022, v. 58, n. 3, p. 130, doi. 10.1049/ell2.12378
- Wen, Hao‐xiang;
- Luo, Huan;
- Yang, Sen‐quan
- Article
47
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1189, doi. 10.1049/el.2018.5811
- Xiaohong Lin;
- Xianmao Li;
- Xin Man;
- Wei Tian
- Article
48
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 20, p. 1147, doi. 10.1049/el.2018.6893
- Article
49
- Journal of Functional Polymers, 2020, v. 33, n. 3, p. 262, doi. 10.14133/j.cnki.1008-9357.20190424002
- Article
50
- Turkish Journal of Physics, 2019, v. 43, n. 5, p. 531
- Article