Works matching DE "NANOELECTROMECHANICAL systems"
1
- Computer-Aided Design & Applications, 2012, v. 9, n. 5, p. 631, doi. 10.3722/cadaps.2012.631-640
- Fang-Jung Shiou;
- Kuang-Chao Fan;
- Kai-Ming Pan;
- Zhi-Yuan Ke
- Article
2
- Technology Audit & Production Reserves, 2025, v. 3, n. 1(83), p. 58, doi. 10.15587/2706-5448.2025.322592
- Baydyk, Tetyana;
- Mammadova, Masuma;
- Herrera, Graciela Velasco;
- Kussul, Ernst
- Article
3
- Biological Trace Element Research, 2025, v. 203, n. 6, p. 2960, doi. 10.1007/s12011-024-04389-w
- Zhang, Yan;
- Tian, Ziwei;
- Cheng, Xuqiu;
- Fang, Bohao;
- Liu, Qiang;
- Li, Junzhe;
- Wang, Yuan;
- Wang, Hongli;
- Guo, Xianwei;
- Chen, Guimei;
- Li, Huaibiao;
- Sun, Liang;
- Hu, Bing;
- Zhang, Dongmei;
- Liang, Chunmei;
- Sheng, Jie;
- Tao, Fangbiao;
- Wang, Jun;
- Yang, Linsheng
- Article
4
- Advanced Materials Interfaces, 2025, v. 12, n. 11, p. 1, doi. 10.1002/admi.202400971
- Song, Hyoin;
- Kim, Wonjoong;
- Park, Chanwoong;
- Sung, Hansang;
- Park, Jaein;
- Lee, Seungyeon;
- Lee, Heon
- Article
5
- Integrated Ferroelectrics, 2025, v. 241, n. 1-3, p. 147, doi. 10.1080/10584587.2025.2482420
- Shah, Khurshed A.;
- Parvaiz, M. Shunaid
- Article
6
- Microsystems & Nanoengineering, 2025, v. 11, n. 1, p. 1, doi. 10.1038/s41378-025-00960-0
- Fu, Mengqi;
- Shi, Zhan;
- Bošnjak, Bojan;
- Blick, Robert H.;
- Scheer, Elke;
- Yang, Fan
- Article
7
- Microsystems & Nanoengineering, 2025, v. 11, n. 1, p. 1, doi. 10.1038/s41378-025-00969-5
- Ding, Jie;
- He, Chang;
- Ma, Hongliang;
- Zhang, Wendong;
- Fan, Xuge
- Article
8
- Scientific Reports, 2025, v. 15, n. 1, p. 1, doi. 10.1038/s41598-025-96149-6
- Kamal, Islam R.;
- El-atty, Saied M. Abd;
- El-Zoghdy, S. F.;
- Soliman, Randa F.
- Article
9
- Entropy, 2025, v. 27, n. 5, p. 501, doi. 10.3390/e27050501
- Emenheiser, Jeffrey;
- Salova, Anastasiya;
- Snyder, Jordan;
- Crutchfield, James P.;
- D'Souza, Raissa M.
- Article
10
- Journal of Nanoparticle Research, 2025, v. 27, n. 5, p. 1, doi. 10.1007/s11051-025-06312-3
- Janthajam, Nisakon;
- Kopwitthaya, Atcha;
- Tseng, Shih-Feng;
- Boonraung, Sakoolkan;
- Hsu, Shu-Han
- Article
11
- Revista Cubana de Física, 2024, v. 41, n. 2, p. 113
- OLIVEIRA, A. A.;
- CARRIOR, J. A. G.
- Article
12
- CEE: Chemical Engineering Education, 2024, v. 58, n. 2, p. 101, doi. 10.18260/2-1-370.660-132213
- HOWARD, MICHAEL P.;
- ALEXANDER, SYMONE L. M.
- Article
13
- R&D Management, 2013, v. 43, n. 2, p. 162, doi. 10.1111/radm.12008
- Burger, Norbert;
- Staake, Thorsten;
- Fleisch, Elgar;
- Hierold, Christofer
- Article
14
- Journal of Electronic Materials, 2025, v. 54, n. 1, p. 758, doi. 10.1007/s11664-024-11557-0
- Kumar, P. Kiran;
- Balaji, B.;
- Vardhan, Ch. Sree;
- Gowthami, Y.;
- Agarwal, Vipul;
- Shashidhar, M.;
- Sagar, Kallepelli;
- Jena, Biswajit;
- Pedapudi, Michael Cholines;
- Manikanta, Kurivella
- Article
15
- Journal of Electronic Materials, 2024, v. 53, n. 6, p. 2965, doi. 10.1007/s11664-024-10967-4
- Kumar, Sanjay;
- Dubey, Mayank;
- Nawaria, Megha;
- Gautam, Mohit Kumar;
- Das, Mangal;
- Bhardwaj, Ritesh;
- Rani, Shalu;
- Mukherjee, Shaibal
- Article
16
- Surface Engineering, 2012, v. 28, n. 3, p. 171, doi. 10.1179/1743294411Y.0000000042
- Lin, T-Y;
- Tsai, C-H;
- Yau, W-H;
- Chou, C-P
- Article
17
- Surface Engineering, 2012, v. 28, n. 2, p. 134, doi. 10.1179/1743294411Y.0000000072
- Kuppusami, P;
- Elangovan, T;
- Murugesan, S;
- Thirumurugesan, R;
- Khan, S;
- George, R P;
- Ramaseshan, R;
- Divakar, R;
- Mohandas, E;
- Mangalaraj, D
- Article
18
- Macromolecular Symposia, 2013, v. 327, n. 1, p. 10, doi. 10.1002/masy.201350501
- Article
19
- Chemistry - A European Journal, 2023, v. 29, n. 52, p. 1, doi. 10.1002/chem.202301473
- Sutradhar, Dipankar;
- Sarmah, Amrit;
- Hobza, Pavel;
- Chandra, Asit K.
- Article
20
- Angewandte Chemie, 2016, v. 128, n. 4, p. 1367, doi. 10.1002/ange.201508845
- Watson, Matthew A.;
- Cockroft, Scott L.
- Article
21
- Angewandte Chemie, 2014, v. 126, n. 7, p. 1880, doi. 10.1002/ange.201307581
- Wang, Xianfu;
- Liu, Bin;
- Liu, Rong;
- Wang, Qiufan;
- Hou, Xiaojuan;
- Chen, Di;
- Wang, Rongming;
- Shen, Guozhen
- Article
22
- Angewandte Chemie, 2014, v. 126, n. 3, p. 723, doi. 10.1002/ange.201305648
- Fischer, Dieter;
- Meyer, Larissa V.;
- Jansen, Martin;
- Müller ‐ Buschbaum, Klaus
- Article
23
- Angewandte Chemie, 2013, v. 125, n. 50, p. 13588, doi. 10.1002/ange.201306765
- Wickramasinghe, Lanka D.;
- Perera, Meeghage Madusanka;
- Li, Li;
- Mao, Guangzhao;
- Zhou, Zhixian;
- Verani, Cláudio N.
- Article
24
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 18, p. 17440, doi. 10.1007/s10854-019-02094-2
- Wang, Tianxiong;
- Meng, Xianquan
- Article
25
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 14, p. 13567, doi. 10.1007/s10854-019-01724-z
- Mohammad, Tauheed;
- Sekhar, P. S. Chandra;
- Dwivedi, Charu;
- Dutta, Viresh
- Article
26
- Journal of Materials Science: Materials in Electronics, 2019, v. 30, n. 12, p. 11239, doi. 10.1007/s10854-019-01470-2
- Das, M.;
- Sarmah, S.;
- Sarkar, D.
- Article
27
- Journal of Materials Science: Materials in Electronics, 2018, v. 29, n. 8, p. 6470, doi. 10.1007/s10854-018-8628-9
- Ashrafabadi, Somaye;
- Eshghi, Hosein
- Article
28
- Journal of Materials Science: Materials in Electronics, 2017, v. 28, n. 2, p. 1393, doi. 10.1007/s10854-016-5673-0
- Zhu, Lei;
- Cho, Kwang-Youn;
- Oh, Won-Chun
- Article
29
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 7, p. 5166, doi. 10.1007/s10854-015-3046-8
- Article
30
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 3, p. 1172, doi. 10.1007/s10854-014-1705-9
- Rambabu, A.;
- Bashaiah, S.;
- James Raju, K.
- Article
31
- Journal of Materials Science: Materials in Electronics, 2013, v. 24, n. 9, p. 3594, doi. 10.1007/s10854-013-1290-3
- Hsu, Hsiang-Chen;
- Chu, Li-Ming;
- Chang, Wei-Yao;
- Chen, Yi-Feng;
- Chien, Jih-Hsin;
- Fu, Shen-Li;
- Ju, Shin-Pon;
- Feng, Wen-Jui
- Article
32
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 8, p. 771, doi. 10.1007/s10854-008-9800-4
- Panda, S. K.;
- Singh, N.;
- Pal, S.;
- Jacob, C.
- Article
33
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, p. 120, doi. 10.1007/s10854-007-9463-6
- Ki Seo Kim;
- Je Hwang Ryu;
- Chang Seok Lee;
- Jin Jang;
- Kyu Chang Park
- Article
34
- Journal of Materials Science: Materials in Electronics, 2008, v. 19, p. 239, doi. 10.1007/s10854-008-9654-9
- Frantskevich, A. V.;
- Saad, A. M.;
- Mazanik, A. V.;
- Frantskevich, N. V.;
- Fedotov, A. K.;
- Kulinkauskas, V. S.;
- Patryn, A. A.
- Article
35
- PAMM: Proceedings in Applied Mathematics & Mechanics, 2014, v. 14, n. 1, p. 529, doi. 10.1002/pamm.201410252
- Klusemann, Benjamin;
- Xiao, Tao;
- Bargmann, Swantje
- Article
36
- Continuum Mechanics & Thermodynamics, 2021, v. 33, n. 2, p. 343, doi. 10.1007/s00161-020-00906-z
- Article
37
- Applied Microbiology & Biotechnology, 2011, v. 90, n. 1, p. 1, doi. 10.1007/s00253-011-3140-7
- Malcos, Jennelle L.;
- Hancock, William O.
- Article
38
- Strength of Materials, 2014, v. 46, n. 1, p. 121, doi. 10.1007/s11223-014-9523-0
- Article
39
- Measurement Techniques, 2018, v. 61, n. 8, p. 802, doi. 10.1007/s11018-018-1505-3
- Article
40
- Measurement Techniques, 2018, v. 61, n. 7, p. 660, doi. 10.1007/s11018-018-1481-7
- Belozubov, E. M.;
- Vasil'ev, V. A.;
- Chernov, P. S.
- Article
41
- Measurement Techniques, 2017, v. 60, n. 2, p. 166, doi. 10.1007/s11018-017-1168-5
- Bardin, V.;
- Vasil'ev, V.;
- Chernov, P.
- Article
42
- Measurement Techniques, 2013, v. 56, n. 9, p. 1016, doi. 10.1007/s11018-013-0322-y
- Bashevskaya, O.;
- Bushuev, S.;
- Poduraev, Yu.;
- Koval'skii, M.;
- Kainer, G.;
- Romash, E.
- Article
43
- Measurement Techniques, 2013, v. 56, n. 2, p. 158, doi. 10.1007/s11018-013-0174-5
- Zolotnikova, G.;
- Solovyev, V.;
- Gogolinskiy, K.;
- Useinov, A.
- Article
44
- Measurement Techniques, 2013, v. 55, n. 12, p. 1350, doi. 10.1007/s11018-013-0133-1
- Article
45
- Measurement Techniques, 2012, v. 55, n. 7, p. 800, doi. 10.1007/s11018-012-0042-8
- Article
46
- Measurement Techniques, 2011, v. 54, n. 2, p. 109, doi. 10.1007/s11018-011-9692-1
- Karpov, O.;
- Balakhanov, D.;
- Lesnikov, E.;
- Dankin, D.
- Article
47
- Measurement Techniques, 2011, v. 54, n. 1, p. 21, doi. 10.1007/s11018-011-9679-y
- Belozubov, E.;
- Vasiliev, V.;
- Zapevalin, A.;
- Chernov, P.
- Article
48
- Automation & Remote Control, 2015, v. 76, n. 12, p. 2216, doi. 10.1134/S0005117915120103
- Kasatkin, S.;
- Murav'ev, A.;
- Amelichev, V.;
- Kostyuk, D.
- Article
49
- Acta Polytechnica CTU Proceedings, 2024, v. 50, p. 74, doi. 10.14311/APP.2024.50.0074
- PAKZAD, SINA ZARE;
- MUZAMMIL, MUHAMMAD;
- SHIRIN, MEHDI BOSTAN;
- ALI, BASIT;
- COBAN, SEMIH BERK;
- NACARKUCUK, EGE;
- KERIMZADE, UMUT;
- ALACA, BURHANETTIN ERDEM
- Article
50
- Acta Polytechnica CTU Proceedings, 2020, v. 27, p. 126, doi. 10.14311/APP.2020.27.0126
- ČTVRTLÍK, RADIM;
- VÁCLAVEK, LUKÁŠ;
- TOMÁŠTÍK, JAN
- Article