Works matching DE "MULTICHIP modules (Microelectronics)"
1
- International Journal of Nanoscience, 2013, v. 12, n. 5, p. 1, doi. 10.1142/S0219581X13500373
- MATULKA, D. V.;
- GRYGORCHAK, I. I.;
- LUKIYANETS, B. A.
- Article
2
- Journal of Materials Science Letters, 2003, v. 22, n. 8, p. 569, doi. 10.1023/A:1023309225186
- Duck-Hwan Kim;
- Chul An;
- Young-Shin Lee;
- Kyu-Seok Bang;
- Jun-Chul Kim;
- Hyeung-Kyu Lee;
- Sang-Kyu Lim
- Article
3
- Ferroelectrics, 2007, v. 353, n. 1, p. 97, doi. 10.1080/00150190701368042
- Banys, J.;
- Kinka, M.;
- Volkel, G.;
- Bohlman, W.;
- Umamaheswari, V.;
- Hartmann, M.;
- Poppl, A.
- Article
4
- Chemistry Letters, 2004, v. 33, n. 3, p. 266, doi. 10.1246/cl.2004.266
- Sinha, A. K.;
- Seelan, S.;
- Akita, T.;
- Tsubota, S.;
- Haruta, M.
- Article
5
- Quality & Reliability Engineering International, 2004, v. 20, n. 7, p. 709, doi. 10.1002/qre.594
- Lindgren, Mats;
- Belov, Ilja;
- Leisner, Peter
- Article
6
- Quality & Reliability Engineering International, 1996, v. 12, n. 4, p. 297, doi. 10.1002/(SICI)1099-1638(199607)12:4<297::AID-QRE21>3.0.CO;2-C
- Ciappa, Mauro;
- Malberti, Paolo
- Article
7
- Quality & Reliability Engineering International, 1992, v. 8, n. 6, p. 568
- Article
8
- Quality & Reliability Engineering International, 1991, v. 7, n. 1, p. 50
- Article
9
- Technical Physics Letters, 2018, v. 44, n. 10, p. 919, doi. 10.1134/S1063785018100176
- Belyaev, M. A.;
- Putrolaynen, V. V.;
- Romanenko, V. A.
- Article
10
- International Journal of Nano Dimension, 2016, v. 7, n. 4, p. 295, doi. 10.7508/ijnd.2016.04.005
- Torabinejad, Ali;
- Nasirizadeh, Navid;
- Yazdanshenas, Mohammad Esmail;
- Tayebi, Habib Allah
- Article
11
- Environmental Progress & Sustainable Energy, 2018, v. 37, n. 2, p. 746, doi. 10.1002/ep.12771
- Saad, Eman M.;
- Hassan, Hassan M. A.;
- Soltan, Mohamed S.;
- Butler, Ian S.;
- Mostafa, Sahar I.
- Article
12
- EE: Evaluation Engineering, 2005, v. 44, n. 9, p. 12
- Article
14
- Electronics & Electrical Engineering, 2014, v. 20, n. 5, p. 112, doi. 10.5755/j01.eee.20.5.7110
- Article
15
- Computer-Aided Design & Applications, 2012, v. 9, n. 6, p. 837, doi. 10.3722/cadaps.2012.837-846
- Shook, Brett W.;
- Zihao Gong;
- Yongfeng Feng;
- Francis, A. Matthew;
- Mantooth, H. Alan
- Article
16
- 2013
- Morrison, Richard H.;
- Racz, Livia M.;
- Carter, David J.
- Case Study
17
- Journal of Materials Science: Materials in Electronics, 2014, v. 25, n. 2, p. 609, doi. 10.1007/s10854-013-1634-z
- Vargas, Lidia;
- Terrazas, Juan;
- Cabrera, Eduardo;
- Valdez, Benjamin;
- Nedev, Nicola
- Article
18
- Microwave & Optical Technology Letters, 2009, v. 51, n. 6, p. 1584, doi. 10.1002/mop.24354
- Xiaoyun Ding;
- Fei Geng;
- Le Luo
- Article
19
- Microwave & Optical Technology Letters, 2008, v. 50, n. 7, p. 1770, doi. 10.1002/mop.23530
- El Zoghbi, M.;
- Baillargeat, D.;
- Bila, S.;
- Verdeyme, S.;
- Villemazet, J. F.
- Article
20
- Microwave & Optical Technology Letters, 2007, v. 49, n. 12, p. 3124, doi. 10.1002/mop.22888
- Poesen, G.;
- Stiens, J.;
- Vounckx, R.;
- Bossche, M. Vanden
- Article
21
- Microwave & Optical Technology Letters, 2007, v. 49, n. 9, p. 2303, doi. 10.1002/mop.22719
- Sung Tae Choi;
- Hamaguchi, Kiyoshi;
- Ogawa, Hiroyo;
- Tokuda, Kiyohito;
- Yong Hoon Kim
- Article
22
- Microwave & Optical Technology Letters, 2006, v. 48, n. 8, p. 1675, doi. 10.1002/mop.21707
- Min-Hang Weng;
- Hung-Wei Wu;
- Yan-Kuin Su;
- Ru-Yuan Yang;
- Cheng-Yuan Hung
- Article
23
- Microwave & Optical Technology Letters, 2005, v. 46, n. 5, p. 487, doi. 10.1002/mop.21025
- Article
24
- Microwave & Optical Technology Letters, 2005, v. 45, n. 6, p. 557, doi. 10.1002/mop.20878
- Ki-Don Kim;
- Jongbae Park;
- Jae-Gon Lee;
- Jeong-Hae Lee;
- Joungho Kim
- Article
25
- Microwave & Optical Technology Letters, 2005, v. 44, n. 6, p. 581, doi. 10.1002/mop.20702
- Soliman, E. A.;
- Brebels, S.;
- Beyne, E.;
- Vandenbosch, G. A. E.
- Article
26
- VLSI Design, 2014, p. 1, doi. 10.1155/2014/280701
- Yagain, Deepa;
- Vijaya Krishna, A.
- Article
27
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 4, p. -1, doi. 10.1142/S0218126617500542
- Article
28
- PLoS ONE, 2016, v. 11, n. 3, p. 1, doi. 10.1371/journal.pone.0151753
- Geng, Hai-Hua;
- Li, Rui;
- Su, Ya-Min;
- Xiao, Jie;
- Pan, Min;
- Cai, Xing-Xing;
- Ji, Xiao-Ping
- Article
29
- Journal of Telecommunications & Information Technology, 2011, v. 2011, n. 3, p. 81, doi. 10.26636/jtit.2011.3.1161
- Łuczak, Adam;
- Stępniewska, Marta;
- Siast, Jakub;
- Domański, Marek;
- Stankiewicz, Olgierd;
- Kurc, Maciej;
- Konieczny, Jacek
- Article
30
- Solid State Technology, 2001, v. 44, n. 7, p. 48
- Article
31
- IET Microwaves, Antennas & Propagation (Wiley-Blackwell), 2018, v. 12, n. 7, p. 1064, doi. 10.1049/iet-map.2016.1065
- Article
32
- Small Structures, 2025, v. 6, n. 5, p. 1, doi. 10.1002/sstr.202400512
- Lee, Youngseob;
- Kim, Kiwan;
- Kim, Yunseo;
- Kong, Daeyoung;
- Park, Jeonghwan;
- Son, Daehyuk;
- Kang, Sungchan;
- Hong, Seogwoo;
- Lee, Hyoungsoon
- Article
33
- Applied Physics A: Materials Science & Processing, 2013, v. 113, n. 1, p. 5, doi. 10.1007/s00339-013-7909-7
- Kim, H.;
- Duocastella, M.;
- Charipar, K. M.;
- Auyeung, R. C. Y.;
- Piqué, A.
- Article
34
- Journal of Microelectronic & Electronic Packaging, 2018, v. 15, n. 1, p. 9, doi. 10.4071/imaps.526636
- Marinis, Thomas F.;
- Soucy, Joseph W.
- Article
35
- Journal of Microelectronic & Electronic Packaging, 2012, v. 9, n. 3, p. 113, doi. 10.4071/imaps.334
- Burkhardt, T.;
- Hornaff, M.;
- Acker, A.;
- Peschel, T.;
- Beckert, E.;
- Suphan, K.-H.;
- Mensel, K.;
- Jirak, S.;
- Eberhardt, R.;
- Tünnermann, A.
- Article
36
- Journal of Electromagnetic Waves & Applications, 2005, v. 19, n. 12, p. 1595, doi. 10.1163/156939305775537393
- C. J. Lin;
- C.-C. Chiu;
- S.-G. Hsu;
- H. C. Liu
- Article
38
- PLoS Genetics, 2016, v. 12, n. 8, p. 1, doi. 10.1371/journal.pgen.1006277
- Vijayraghavan, Sriram;
- Tsai, Feng-Ling;
- Schwacha, Anthony
- Article
39
- Catalysis Letters, 2014, v. 144, n. 9, p. 1584, doi. 10.1007/s10562-014-1307-4
- Guo, Fang;
- Guo, Shaoqing;
- Wei, Xian-Xian;
- Wang, Xiaoxiao;
- Xiang, Hongwei;
- Qiu, Zegang;
- Zhao, Liangfu
- Article
40
- Catalysis Letters, 2014, v. 144, n. 7, p. 1296, doi. 10.1007/s10562-014-1205-9
- Gao, Ningning;
- Xie, Sujuan;
- Liu, Shenglin;
- An, Jie;
- Zhu, Xiangxue;
- Hu, Linyan;
- Wei, Huijuan;
- Li, Xiujie;
- Xu, Longya
- Article
41
- Catalysis Letters, 2007, v. 119, n. 1/2, p. 179, doi. 10.1007/s10562-007-9219-1
- Jong-Ki Jeon;
- Heejin Lee;
- Jin-Heong Yim;
- Yong Seung Kim;
- Seong Jun Lee;
- Young-Kwon Park;
- Jeong Kuk Shon;
- Ji Man Kim
- Article
42
- International Journal on Electrical Engineering & Informatics, 2017, v. 9, n. 1, p. 139, doi. 10.15676/ijeei.2017.9.1.9
- Tran Hoang Quang Minh;
- Nguyen Huu Khanh Nhan;
- Nguyen Doan Quoc Anh
- Article
43
- ITU Journal Series D: Engineering, 2010, v. 9, n. 1, p. 45
- Aksoy, Levent;
- Günes, Ece Olcay
- Article
44
- Bioscience, Biotechnology & Biochemistry, 2015, v. 79, n. 3, p. 432, doi. 10.1080/09168451.2014.982503
- Hiromi Ogino;
- Sonoko Ishino;
- Takuji Oyama;
- Daisuke Kohda;
- Yoshizumi Ishino
- Article
45
- Electronics Systems & Software, 2005, v. 3, n. 4, p. 40
- Article
46
- Microwave & Optical Technology Letters, 2010, v. 52, n. 7, p. 1606, doi. 10.1002/mop.25252
- Jia-Chi Samuel Chieh;
- Anh-Vu Pham
- Article
47
- Theoretical & Experimental Chemistry, 2014, v. 50, n. 5, p. 323, doi. 10.1007/s11237-014-9383-5
- Struzhko, V.;
- Yaremov, P.;
- Senchylo, E.;
- Solomakha, V.;
- Ilyin, V.
- Article
48
- Active & Passive Electronic Components, 2011, p. 1, doi. 10.1155/2011/823654
- Masaru Ishizuka;
- Tomoyuki Hatakeyama;
- Yuichi Funawatashi;
- Katsuhiro Koizumi
- Article
49
- Instruments & Experimental Techniques, 2010, v. 53, n. 6, p. 812, doi. 10.1134/S0020441210060084
- Dobrotvorskii, A.;
- Karpukhin, V.;
- Shafigullin, R.
- Article
50
- Instruments & Experimental Techniques, 2006, v. 49, n. 3, p. 361, doi. 10.1134/S0020441206030092
- Article