Works matching DE "MIXED signal circuits"
1
- Electronics Systems & Software, 2005, v. 3, n. 4, p. 46
- Article
2
- International Journal on Software Tools for Technology Transfer, 2013, v. 15, n. 3, p. 247, doi. 10.1007/s10009-012-0247-9
- Maler, Oded;
- Ničković, Dejan
- Article
3
- Progress in Electromagnetics Research Letters, 2012, v. 34, p. 169
- J. Li, J.;
- Mao, J. F.;
- Ren, S. W.;
- Zhu, H. R.
- Article
4
- Australian Journal of Electrical & Electronic Engineering, 2022, v. 19, n. 3, p. 300, doi. 10.1080/1448837X.2022.2049052
- Article
5
- EE: Evaluation Engineering, 2004, v. 43, n. 11, p. 74
- Article
6
- EE: Evaluation Engineering, 2004, v. 43, n. 7, p. 18
- Article
7
- Engineering Letters, 2007, v. 15, n. 2, p. 317
- Man, K. L.;
- Schellekens, M. P.
- Article
8
- Innovation, 2011, v. 10, n. 1, p. 79
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9
- Journal of Electronic Testing, 2018, v. 34, n. 3, p. 263, doi. 10.1007/s10836-018-5720-2
- Malloug, Hani;
- Barragan, Manuel J.;
- Mir, Salvador
- Article
10
- Journal of Electronic Testing, 2014, v. 30, n. 4, p. 457, doi. 10.1007/s10836-014-5462-8
- Vock, Stefan;
- Escalona, Omar;
- Turner, Colin;
- Owens, Frank
- Article
11
- Journal of Electronic Testing, 2013, v. 29, n. 5, p. 715, doi. 10.1007/s10836-013-5407-7
- Article
12
- Journal of Electronic Testing, 2012, v. 28, n. 6, p. 857, doi. 10.1007/s10836-012-5339-7
- Hannu, Jari;
- Häkkinen, Juha;
- Voutilainen, Juha-Veikko;
- Jantunen, Heli;
- Moilanen, Markku
- Article
13
- Journal of Electronic Testing, 2012, v. 28, n. 3, p. 365, doi. 10.1007/s10836-011-5276-x
- Vock, Stefan;
- Escalona, Omar;
- Turner, Colin;
- Owens, Frank
- Article
14
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 305, doi. 10.1007/s10836-010-5192-5
- Barragán, Manuel J.;
- Vázquez, Diego;
- Rueda, Adoración
- Article
16
- Journal of Electronic Testing, 2011, v. 27, n. 3, p. 321, doi. 10.1007/s10836-011-5227-6
- Joonsung Park;
- Hongjoong Shin;
- Jacob A. Abraham
- Article
17
- Journal of Electronic Testing, 2011, v. 27, n. 2, p. 163, doi. 10.1007/s10836-011-5196-9
- Article
19
- Journal of Electronic Testing, 2010, v. 26, n. 4, p. 405, doi. 10.1007/s10836-010-5161-z
- Srinivasan, Ganesh;
- Chatterjee, Abhijit;
- Cherubal, Sasikumar;
- Variyam, Pramod
- Article
20
- Scientific Reports, 2022, v. 12, n. 1, p. 1, doi. 10.1038/s41598-022-13180-7
- Article
21
- IUP Journal of Electrical & Electronics Engineering, 2013, v. 6, n. 4, p. 56
- Poornapushpakala, S.;
- Gomathy, C.
- Article
22
- Journal of Electrical & Computer Engineering, 2018, p. 1, doi. 10.1155/2018/1502749
- Chen, Chengying;
- Chen, Liming;
- Yang, Jun
- Article
23
- International Journal of Electrical Engineering Education, 2012, v. 49, n. 1, p. 42, doi. 10.7227/IJEEE.49.1.4
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24
- EE: Evaluation Engineering, 2016, v. 55, n. 6, p. 18
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26
- Journal of Electronic Materials, 2022, v. 51, n. 3, p. 1029, doi. 10.1007/s11664-021-09337-1
- Dixit, Ankit;
- Kori, Pavan Kumar;
- Rajan, Chithraja;
- Samajdar, Dip Prakash
- Article
27
- IETE Technical Review, 2022, v. 39, n. 6, p. 1395, doi. 10.1080/02564602.2021.2004934
- Singh, Vivek Kumar;
- Sarkar, Trupa;
- Pradhan, Sambhu Nath
- Article
28
- IETE Technical Review, 2011, v. 28, n. 3, p. 232, doi. 10.4103/0256-4602.81235
- Coetzee, Jacob C.;
- Cordwell, James D.;
- Underwood, Elizabeth;
- Waite, Shauna L.
- Article
29
- Scientific Reports, 2023, v. 13, n. 1, p. 1, doi. 10.1038/s41598-023-35845-7
- Ghanatian, Hamdam;
- Benetti, Luana;
- Anacleto, Pedro;
- Böhnert, Tim;
- Farkhani, Hooman;
- Ferreira, Ricardo;
- Moradi, Farshad
- Article
30
- Journal of Engineering Science & Technology Review, 2016, v. 9, n. 6, p. 131
- Pouros, S. P.;
- Vassios, V. D.;
- Papakostas, D. K.
- Article
31
- Journal of Engineering Science & Technology Review, 2014, v. 7, n. 2, p. 119
- Nirmal, D.;
- Kumar, P. Vijaya;
- Shruti, K.;
- Jebalin, Binola K.;
- Mohankumar, N.
- Article
32
- Frontiers in Neuroscience, 2021, v. 15, p. 1, doi. 10.3389/fnins.2021.728086
- Bagheriye, Leila;
- Kwisthout, Johan
- Article
33
- Frontiers in Neuroscience, 2021, v. 15, p. 1, doi. 10.3389/fnins.2021.741116
- Gautam, Ashish;
- Kohno, Takashi
- Article
34
- Electronics & Electrical Engineering, 2021, v. 27, n. 2, p. 22, doi. 10.5755/j02.eie.28751
- Pandiev, Ivailo M.;
- Aleksandrova, Mariya P.
- Article
35
- Electronics & Electrical Engineering, 2019, v. 25, n. 3, p. 25, doi. 10.5755/j01.eie.25.3.23672
- Temich, Sebastian;
- Golonek, Tomasz;
- Grzechca, Damian
- Article
36
- Optical & Quantum Electronics, 2014, v. 46, n. 10, p. 1353, doi. 10.1007/s11082-014-9884-4
- Shastri, Bhavin;
- Nahmias, Mitchell;
- Tait, Alexander;
- Prucnal, Paul
- Article
37
- Technologies (2227-7080), 2022, v. 10, n. 2, p. N.PAG, doi. 10.3390/technologies10020039
- de Benito, Carola;
- Camps, Oscar;
- Al Chawa, Mohamad Moner;
- Stavrinides, Stavros G.;
- Picos, Rodrigo
- Article
38
- Journal of Low Power Electronics & Applications, 2023, v. 13, n. 1, p. 4, doi. 10.3390/jlpea13010004
- Ramirez-Angulo, Jaime;
- Diaz-Armendariz, Alejandra;
- Molinar-Solis, Jesus E.;
- Diaz-Sanchez, Alejandro;
- Huerta-Chua, Jesus
- Article
39
- International Journal on Electrical Engineering & Informatics, 2011, v. 3, n. 2, p. 248
- Dendouga, Abdelghani;
- Bouguechal, Nour-Eddine;
- Kouda, Souhil;
- Barra, Samir
- Article
40
- Journal of Electromagnetic Waves & Applications, 2009, v. 23, n. 2/3, p. 213, doi. 10.1163/156939309787604535
- Lin, D.-B.;
- Hung, K.-C.;
- Wu, C.-T.;
- Chang, C.-S.
- Article
41
- Journal of Circuits, Systems & Computers, 2023, v. 32, n. 15, p. 1, doi. 10.1142/S0218126623300052
- Duggal, Komal;
- Pandey, Rishikesh;
- Niranjan, Vandana
- Article
42
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 8, p. -1, doi. 10.1142/S0218126617400059
- Brenkuš, Juraj;
- Stopjaková, Viera;
- Čerňanová, Viera;
- Arbet, Daniel;
- Nagy, Lukáš;
- Sedlák, Vladimír
- Article
43
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 3, p. -1, doi. 10.1142/S0218126617500475
- Zhao, Yiqiang;
- Wang, Jingshuai;
- Sheng, Yun
- Article
44
- Journal of Circuits, Systems & Computers, 2017, v. 26, n. 1, p. 1, doi. 10.1142/S0218126617500189
- Mirzaie, Nahid;
- Shamsi, Hossein;
- Byun, Gyung-Su
- Article
45
- Journal of Circuits, Systems & Computers, 2011, v. 20, n. 6, p. 1067, doi. 10.1142/S0218126611007761
- Article
46
- Journal of Integrated Circuits & Systems, 2022, v. 17, n. 1, p. 1
- Fayomi, Christian Jésus B.;
- Colombo, Dalton Martini
- Article
47
- Journal of Integrated Circuits & Systems, 2022, v. 17, n. 1, p. 1, doi. 10.29292/jics.v17i1.592
- Casañas, Cesar W. V.;
- Thainann;
- de Castro, H. P.;
- de Souza, Gabriel A. F.;
- Moreno, Robson L.;
- Colombo, Dalton M.
- Article
48
- Journal of Integrated Circuits & Systems, 2021, v. 16, n. 3, p. 1
- Kastensmidt, Fernanda Lima;
- Cuenca Asensi, Sergio
- Article
49
- Journal of Integrated Circuits & Systems, 2019, v. 14, n. 3, p. 1, doi. 10.29292/jics.v14i3.74
- Fortes, Anderson;
- da Silva Jr, Luiz A.;
- Domanski, Robson A.;
- Girardi, Alessandro
- Article
50
- Ingeniería y Competitividad, 2015, v. 17, n. 1, p. 153
- Amaya, Andrés F.;
- Gómez, Héctor I.;
- Espinosa, Guillermo
- Article