Works matching DE "MICROVIAS (Electronics)"
1
- Transactions of the Institute of Metal Finishing, 2018, v. 96, n. 2, p. 86, doi. 10.1080/00202967.2018.1426174
- Ji, Linxian;
- Nie, Hexian;
- Su, Shidong;
- Chen, Yuanming;
- He, Wei;
- Ai, Kehua
- Article
2
- Transactions of the Institute of Metal Finishing, 2016, v. 94, n. 1, p. 49, doi. 10.1080/00202967.2015.1124638
- Ji, L. X.;
- Wang, C.;
- Wang, S. X.;
- He, W.;
- Xiao, D. J.
- Article
3
- Transactions of the Institute of Metal Finishing, 2015, v. 93, n. 4, p. 190, doi. 10.1179/0020296715Z.000000000251
- Article
4
- Electronic Device Failure Analysis, 2017, v. 19, n. 2, p. 4, doi. 10.31399/asm.edfa.2017-2.p004
- Article
5
- Journal of Microelectronic & Electronic Packaging, 2020, v. 17, n. 3, p. 79, doi. 10.4071/imaps.1212898
- Cauwe, Maarten;
- Vandevelde, Bart;
- Nawghane, Chinmay;
- Van De Slyeke, Marnix;
- Bosman, Erwin;
- Verhegge, Joachim;
- Coulon, Alexia;
- Heltzel, Stan
- Article
6
- Journal of Mathematical Chemistry, 2014, v. 52, n. 5, p. 1414, doi. 10.1007/s10910-014-0320-6
- Pohjoranta, Antti;
- Tenno, Robert
- Article
7
- Journal of Low Temperature Physics, 2018, v. 193, n. 3/4, p. 578, doi. 10.1007/s10909-018-1930-3
- de la Broïse, Xavier;
- Le Coguie, Alain;
- Sauvageot, Jean-Luc;
- Pigot, Claude;
- Coppolani, Xavier;
- Moreau, Vincent;
- d’Hollosy, Samuel;
- Knarosovski, Timur;
- Engel, Andreas
- Article