Works matching DE "MICROPROCESSOR testing"

Results: 8

Automation of Test Program Synthesis for Processor Post-silicon Validation.

Published in:

Journal of Electronic Testing, 2018, v. 34, n. 1, p. 83, doi. 10.1007/s10836-018-5709-x

By:

Suryasarman, Vasudevan Madampu;
Biswas, Santosh;
Sahu, Aryabartta

Publication type:

Article

A Functional Approach for Testing the Reorder Buffer Memory.

Published in:

Journal of Electronic Testing, 2014, v. 30, n. 4, p. 469, doi. 10.1007/s10836-014-5461-9

By:

Di Carlo, S.;
Gaudesi, M.;
Sanchez, E.;
Sonza Reorda, M.

Publication type:

Article

Editorial.

Published in:

2013

By:

Agrawal, Vishwani

Publication type:

Editorial

Software-Based Testing for System Peripherals.

Published in:

Journal of Electronic Testing, 2012, v. 28, n. 2, p. 189, doi. 10.1007/s10836-012-5287-2

By:

Grosso, M.;
Perez Holguin, W.;
Sanchez, E.;
Sonza Reorda, M.;
Tonda, A.;
Velasco Medina, J.

Publication type:

Article

Foreword.

Published in:

Journal of Circuits, Systems & Computers, 2017, v. 26, n. 8, p. -1, doi. 10.1142/S0218126617020017

By:

Steininger, Andreas;
Pawlak, Adam;
Stopjakova, Viera

Publication type:

Article

Test and Diagnosis of Automotive Embedded Processors via High-Speed Standard Interfaces.

Published in:

Journal of Circuits, Systems & Computers, 2017, v. 26, n. 8, p. -1, doi. 10.1142/S0218126617400060

By:

Gleichner, Christian;
Vierhaus, Heinrich T.

Publication type:

Article

Microprocessor Testing: Functional Meets Structural Test.

Published in:

Journal of Circuits, Systems & Computers, 2017, v. 26, n. 8, p. -1, doi. 10.1142/S0218126617400072

By:

Touati, A.;
Bosio, A.;
Girard, P.;
Virazel, A.;
Bernardi, P.;
Sonza Reorda, M.

Publication type:

Article

Novel ultrasonic distance measuring system based on correlation method.

Published in:

Archives of Electrical Engineering, 2014, v. 63, n. 3, p. 385, doi. 10.2478/aee-2014-0028

By:

Gądek, K.;
Jaraczewski, M.

Publication type:

Article