Works matching DE "MICRON computers"
1
- Insight: Non-Destructive Testing & Condition Monitoring, 2008, v. 50, n. 6, p. 298, doi. 10.1784/insi.2008.50.6.298
- Arunmuthu, K.;
- kumar, P. Arun;
- Saravanan, T.;
- Philip, John;
- Jayakumar, T.;
- Raj, Baldev
- Article
2
- Electronics Letters (Wiley-Blackwell), 2018, v. 54, n. 8, p. 486, doi. 10.1049/el.2017.4453
- Meng, F.;
- Li, K.;
- Thomson, D. J.;
- Wilson, P.;
- Reed, G. T.
- Article
3
- Van Tip Dergisi, 2023, v. 30, n. 3, p. 310, doi. 10.5505/vtd.2023.73658
- Kılıc, Deniz;
- Gunes, Celal Emre;
- Toprak, Ibrahım
- Article
4
- International Journal of Advanced Manufacturing Technology, 2014, v. 72, n. 1-4, p. 47, doi. 10.1007/s00170-014-5618-9
- Article
5
- International Journal of Advanced Manufacturing Technology, 2011, v. 56, n. 9-12, p. 1049, doi. 10.1007/s00170-011-3223-8
- Park, Jong;
- Kim, Ju;
- Lee, Eung;
- Lee, Min
- Article
6
- 2018
- Harada, Hitoshi;
- Kanaji, Shingo;
- Nishi, Masayasu;
- Otake, Yoshito;
- Hasegawa, Hiroshi;
- Yamamoto, Masashi;
- Matsuda, Yoshiko;
- Yamashita, Kimihiro;
- Matsuda, Takeru;
- Oshikiri, Taro;
- Sumi, Yasuo;
- Nakamura, Tetsu;
- Suzuki, Satoshi;
- Sato, Yoshinobu;
- Kakeji, Yoshihiro
- journal article
7
- Turkish Journal of Electrical Engineering & Computer Sciences, 2014, v. 22, n. 3, p. 573, doi. 10.3906/elk-1207-106
- ABDOLLAHI NOHOJI, Amir Hossein;
- FAROKHI, Fardad;
- ZAMANI, Majid
- Article
8
- Advances in Bulgarian Science, 2009, v. 2, p. 11
- Tsutsumanova, Gichka;
- Russev, Stoyan
- Article
9
- International Journal of Recent Research Aspects, 2016, p. 88
- Article
10
- SID Symposium Digest of Technical Papers, 2015, v. 46, n. 1, p. 211, doi. 10.1002/sdtp.10329
- Kumar, Sundaram N.;
- John, Robin;
- Lauer, Scott;
- Little, Whit;
- Daul, Bob
- Article
11
- SID Symposium Digest of Technical Papers, 2012, v. 43, n. 1, p. 1201, doi. 10.1002/j.2168-0159.2012.tb06012.x
- Liu, Wen-kuen Vincent;
- Chien, Ming-hong Brian;
- Chiang, Mike;
- Chung, K.C.
- Article
12
- PLoS Computational Biology, 2016, v. 12, n. 2, p. 1, doi. 10.1371/journal.pcbi.1004759
- Miner, Daniel;
- Triesch, Jochen
- Article
13
- Electronics Letters (Wiley-Blackwell), 2014, v. 50, n. 20, p. 1475, doi. 10.1049/el.2014.1013
- Yang, H. S.;
- Zhang, C.;
- Bakir, M. S.
- Article
14
- Indoor & Built Environment, 2016, v. 25, n. 2, p. 357, doi. 10.1177/1420326X14551069
- Li, Xiangdong;
- Inthavong, Kiao;
- Tu, Jiyuan
- Article
15
- Sensors (14248220), 2017, v. 17, n. 10, p. 2195, doi. 10.3390/s17102195
- Gonenc, Berk;
- Chae, Jeremy;
- Gehlbach, Peter;
- Taylor, Russell H.;
- Iordachita, Iulian
- Article
16
- PLoS ONE, 2014, v. 9, n. 9, p. 1, doi. 10.1371/journal.pone.0107335
- Dulin, David;
- Barland, Stephane;
- Hachair, Xavier;
- Pedaci, Francesco
- Article