Works matching DE "MICROELECTRONICS research"
1
- Innovation, 2013, v. 12, n. 1, p. 80
- Article
2
- Advanced Functional Materials, 2016, v. 26, n. 16, p. 2648, doi. 10.1002/adfm.201504775
- Zheng, Wei;
- Feng, Wei;
- Zhang, Xin;
- Chen, Xiaoshuang;
- Liu, Guangbo;
- Qiu, Yunfeng;
- Hasan, Tawfique;
- Tan, Pingheng;
- Hu, Ping An
- Article
3
- Journal of Materials Science: Materials in Electronics, 2009, v. 20, n. 7, p. 587, doi. 10.1007/s10854-008-9770-6
- Anjana, Prabhakaran Sreekumari;
- Jawahar, Isuhak Naseema;
- Sebastian, Mailadil Thomas
- Article
4
- Measurement Techniques, 2014, v. 57, n. 1, p. 41, doi. 10.1007/s11018-014-0404-5
- Smirnov, Yu.;
- Kozina, T.;
- Yurasova, E.;
- Sokolov, A.
- Article
5
- Ferroelectrics, 2002, v. 280, n. 1, p. 211, doi. 10.1080/00150190214807
- Bichurin, M. I.;
- Petrov, V. M.;
- Petrov, R. V.;
- Kapralov, G. N.;
- Kiliba, Yu. V.;
- Bukashev, F. I.;
- Smirnov, A. Yu.;
- Tatarenko, A. S.
- Article
6
- Journal of Nano- & Electronic Physics, 2015, v. 7, n. 2, p. 02001-1
- Benhaliliba, M.;
- Ocak, Y. S.;
- Mokhtari, H.;
- Kiliçoglu, T.
- Article
7
- Heat Transfer Engineering, 2014, v. 35, n. 2, p. 178, doi. 10.1080/01457632.2013.812491
- Mahmoud, MohamedM.;
- Karayiannis, TassosG.;
- Kenning, DavidB. R.
- Article
8
- Nature Chemistry, 2009, v. 1, n. 2, p. 106, doi. 10.1038/nchem.188
- Genereux, Joseph C.;
- Barton, Jacqueline K.
- Article
9
- Macromolecular Chemistry & Physics, 2016, v. 217, n. 3, p. 509, doi. 10.1002/macp.201500299
- Koski, Jason;
- Hagberg, Brett;
- Riggleman, Robert A.
- Article
10
- International Journal of Advanced Manufacturing Technology, 2006, v. 31, n. 7/8, p. 655, doi. 10.1007/s00170-005-0245-0
- Arefin, S.;
- Li, X. P.;
- Rahman, M.;
- Liu, K.
- Article
12
- Nature, 2007, v. 448, n. 7156, p. 876, doi. 10.1038/448876a
- Article
13
- Polymers (20734360), 2015, v. 7, n. 8, p. 1577, doi. 10.3390/polym7081471
- Feiyu Fang;
- Xin Chen;
- Zefeng Du;
- Ziming Zhu;
- Xindu Chen;
- Han Wang;
- Peixuan Wu
- Article
14
- Polymers (20734360), 2014, v. 6, n. 8, p. 2146, doi. 10.3390/polym6082146
- Dongliang Kuang;
- Rui Li;
- Jianzhong Pei
- Article
15
- Revista Cubana de Física, 2008, v. 25, n. 2B, p. 142
- Article
16
- Journal of Electronic Materials, 2015, v. 44, n. 7, p. 2211, doi. 10.1007/s11664-015-3667-y
- Takizawa, Yoshihiro;
- Chung, D.
- Article
17
- Journal of Electronic Materials, 2014, v. 43, n. 12, p. 4442, doi. 10.1007/s11664-014-3382-0
- Mertens, J.C.E.;
- Williams, J.J.;
- Chawla, Nikhilesh
- Article
18
- Journal of Electronic Materials, 2013, v. 42, n. 1, p. 168, doi. 10.1007/s11664-012-2335-8
- Lee, K.-O.;
- Morris, J.W.;
- Hua, Fay
- Article
19
- Journal of Materials Science: Materials in Electronics, 2015, v. 26, n. 8, p. 6194, doi. 10.1007/s10854-015-3202-1
- Zhang, Liang;
- Sun, Lei;
- Han, Ji-guang;
- Guo, Yong-huan
- Article
20
- Journal of Materials Science: Materials in Electronics, 2011, v. 22, n. 4, p. 400, doi. 10.1007/s10854-010-0150-7
- Moshrefi-Torbati, M.;
- Swingler, J.
- Article
21
- Journal of Electronic Testing, 2015, v. 31, n. 3, p. 255, doi. 10.1007/s10836-015-5528-2
- Castro Marquez, Carlos;
- Strum, Marius;
- Chau, Wang
- Article
22
- Journal of Electronic Testing, 2015, v. 31, n. 1, p. 107, doi. 10.1007/s10836-014-5495-z
- Vock, Stefan;
- Escalona, Omar;
- Turner, Colin
- Article
23
- Microwave & Optical Technology Letters, 2009, v. 51, n. 2, p. 406, doi. 10.1002/mop.24072
- Tang, Wanchun;
- Yu, Zhengyong;
- Nai, Yu;
- Chow, Y. Leonard
- Article
24
- Doklady Physics, 2007, v. 52, n. 2, p. 75, doi. 10.1134/S1028335807020024
- Afanas’ev, N.;
- Mukhaeva, L.;
- Tsarik, L.;
- Voronkov, M.
- Article
25
- Plasma Processes & Polymers, 2013, v. 10, n. 10, p. 850, doi. 10.1002/ppap.201300030
- Jang, Haegyu;
- Nam, Jaewook;
- Kim, Chang‐Koo;
- Chae, Heeyeop
- Article
26
- AAPPS Bulletin, 2015, v. 25, n. 1, p. 17
- SUZUKI, Y.;
- MIWA, S.;
- NOZAKI, T.;
- SHIOTA, Y.
- Article
27
- AAPPS Bulletin, 2015, v. 25, n. 1, p. 4
- KANAI, S.;
- MATSUKURA, F.;
- IKEDA, S.;
- SATO, H.;
- FUKAMI, S.;
- OHNO, H.
- Article
28
- Solid State Technology, 1999, v. 42, n. 2, p. 24
- Article
29
- Solid State Technology, 1998, v. 41, n. 1, p. 36
- Article
30
- Journal of Geography in Higher Education, 1984, v. 8, n. 2, p. 115, doi. 10.1080/03098268408708908
- Article
31
- Applied Physics A: Materials Science & Processing, 2008, v. 90, n. 4, p. 739, doi. 10.1007/s00339-007-4348-3
- Cuicui Wang;
- Ke Yu;
- Lijun Li;
- Qiong Li;
- Ziqiang Zhu
- Article
32
- International Journal of Production Research, 2012, v. 50, n. 12, p. 3274, doi. 10.1080/00207543.2011.574502
- Choi, Gyunghyun;
- Kim, Sung-Hee;
- Ha, Chunghun;
- Bae, SukJoo
- Article
33
- Journal of Electromagnetic Waves & Applications, 2009, v. 23, n. 2/3, p. 213, doi. 10.1163/156939309787604535
- Lin, D.-B.;
- Hung, K.-C.;
- Wu, C.-T.;
- Chang, C.-S.
- Article
34
- Metallurgical & Materials Transactions. Part B, 2010, v. 41, n. 4, p. 824, doi. 10.1007/s11663-010-9365-5
- Chin, Hui;
- Cheong, Kuan;
- Ismail, Ahmad
- Article
35
- PIERS Proceedings, 2013, p. 1267
- Silva, F. R. L.;
- Ribeiro, L. R.;
- Dias, L. P.;
- Santos, W. J.;
- Capovilla, C. E.;
- Araujo, H. X.
- Article
36
- Nature Nanotechnology, 2014, v. 9, n. 5, p. 333, doi. 10.1038/nnano.2014.87
- Article
37
- Nature Nanotechnology, 2014, v. 9, n. 5, p. 335, doi. 10.1038/nnano.2014.86
- Article
38
- Chemical Engineering, 2009, v. 116, n. 1, p. 13
- Article
40
- Research Technology Management, 2000, v. 43, n. 5, p. 2
- Article
41
- Archives of Thermodynamics, 2015, v. 36, n. 3, p. 139, doi. 10.1515/aoter-2015-0026
- Rusowicz, Artur;
- Leszczyński, Maciej;
- Grzebielec, Andrzej;
- Laskowski, Rafał
- Article
42
- Philosophical Magazine Letters, 2009, v. 89, n. 3, p. 155, doi. 10.1080/09500830802702072
- Liu, J.-x.;
- Zhao, X.-f.;
- Soh, A.-K.;
- Wang, B.-L.
- Article
43
- Numerical Heat Transfer: Part B -- Fundamentals, 2009, v. 55, n. 6, p. 435, doi. 10.1080/10407780902864771
- Ni, Chunjian;
- Murthy, Jayathi Y.
- Article
44
- Chalcogenide Letters, 2011, v. 8, n. 4, p. 263
- Hossain, Sharafat;
- Amin, Nowshad;
- Martin, M. A.;
- Aliyu, M. Mannir;
- Razykov, Takhir;
- Sopian, Kamaruzzaman
- Article
46
- Journal of Applied Crystallography, 2014, v. 47, n. 6, p. 1912, doi. 10.1107/S1600576714021050
- Wernecke, Jan;
- Krumrey, Michael;
- Hoell, Armin;
- Kline, R. Joseph;
- Hung-Kung Liu;
- Wen-Li Wu
- Article
47
- Journal of Applied Polymer Science, 2008, v. 109, n. 6, p. 3849, doi. 10.1002/app.28597
- Liao, Yin-Yin;
- Liu, Jui-Hsiang
- Article
48
- Environmental Engineering & Management Journal (EEMJ), 2012, v. 11, n. 3, p. 544
- Article
49
- Electronic Device Failure Analysis, 2015, v. 17, n. 2, p. 42
- Article
50
- R&D Management, 2004, v. 34, n. 1, p. 33, doi. 10.1111/j.1467-9310.2004.00320.x
- Van Helleputte, Johan;
- Reid, Alasdair
- Article